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公开(公告)号:US12248037B2
公开(公告)日:2025-03-11
申请号:US17596213
申请日:2020-11-17
Applicant: SHOWA DENKO K.K.
Inventor: Daizo Endo , Tatsunori Shino , Akira Sakawaki , Sho Tonegawa , Yasumasa Watanabe
IPC: G01R33/06
Abstract: A magnetic sensor includes: a non-magnetic substrate; and a sensitive element 31 having a longitudinal direction and a short direction, provided with uniaxial magnetic anisotropy in a direction crossing the longitudinal direction, and sensing a magnetic field by a magnetic impedance effect, wherein the sensitive element 31 includes plural soft magnetic material layers 105a to 105d and plural non-magnetic material layers 106a to 106c configured with a non-magnetic material and laminated between the plural soft magnetic material layers 105a to 105d, and the soft magnetic material layers 105a to 105d facing each other with each of the non-magnetic material layers 106a to 106c interposed therebetween are antiferromagnetically coupled.
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公开(公告)号:US11733319B2
公开(公告)日:2023-08-22
申请号:US17694824
申请日:2022-03-15
Applicant: SHOWA DENKO K.K.
Inventor: Sho Tonegawa , Akira Sakawaki , Rimpei Kindaichi
CPC classification number: G01R33/0052 , G01R33/05
Abstract: Sensitivity of a magnetic sensor using the magnetic impedance effect is improved. A magnetic sensor includes: a non-magnetic substrate; a sensitive element provided on the substrate, including a soft magnetic material, having a longitudinal direction and a short direction, provided with uniaxial magnetic anisotropy in a direction intersecting the longitudinal direction, and sensing a magnetic field by a magnetic impedance effect; and a protrusion part including a soft magnetic material and protruding from an end portion in the longitudinal direction of the sensitive element.
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公开(公告)号:US12117507B2
公开(公告)日:2024-10-15
申请号:US17784889
申请日:2020-11-17
Applicant: SHOWA DENKO K.K.
Inventor: Daizo Endo , Tatsunori Shino , Akira Sakawaki , Sho Tonegawa , Yasumasa Watanabe
IPC: G01R33/06
CPC classification number: G01R33/063
Abstract: A magnetic sensor includes: plural sensitive elements 31 each including a soft magnetic material layer 105 having a longitudinal direction and a transverse direction and a conductor layer having higher conductivity than the soft magnetic material layer 105 and extending through the soft magnetic material layer 105 in a longitudinal direction, the sensitive element 31 having uniaxial magnetic anisotropy in a direction intersecting the longitudinal direction and being configured to sense a magnetic field by a magnetic impedance effect; and a connecting portion 32 continuous with the conductor layer of the sensitive element and configured to connect transversely adjacent sensitive elements 31 in series.
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公开(公告)号:US12032043B2
公开(公告)日:2024-07-09
申请号:US17499513
申请日:2021-10-12
Applicant: SHOWA DENKO K.K.
Inventor: Sho Tonegawa , Akira Sakawaki , Yasumasa Watanabe , Daizo Endo , Tomoyuki Noguchi , Yuta Miyamoto
CPC classification number: G01R33/063 , H10N50/01 , H10N50/80
Abstract: In a magnetic sensor using a magnetic impedance effect, sensitivity is improved as compared to the case where a width of a sensitive element in the short direction is equal from one end to the other end in the longitudinal direction. The magnetic sensor includes: a non-magnetic substrate; and a sensitive element that is provided on the substrate, composed of a soft magnetic material, having a longitudinal direction and a short direction, provided with uniaxial magnetic anisotropy in a direction crossing the longitudinal direction, having a width at a center portion in the longitudinal direction that is smaller compared to a width at each of both end portions in the longitudinal direction, and sensing a magnetic field by a magnetic impedance effect.
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公开(公告)号:US10008232B2
公开(公告)日:2018-06-26
申请号:US15529614
申请日:2016-06-28
Applicant: SHOWA DENKO K.K.
Inventor: Sho Tonegawa , Masatoshi Ichikawa , Kenzo Hanawa
CPC classification number: G11B9/04 , C01B32/156 , G11B5/65 , G11B5/7315 , G11B5/851 , G11B9/14 , G11B9/149
Abstract: According to the present invention, there is provided a recording medium comprising a substrate, a platinum layer formed on the substrate and having a (111) plane preferentially oriented, and a fullerene single crystal thin film formed on the platinum layer, and configured to be a recording layer, wherein an average value of average surface roughness Ra's with respect to four or more visual fields measured by using an atomic force microscope in a surface of the fullerene thin film is 0.5 nm or less.
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