Abstract:
An exemplary method for fabricating a damascene interconnect structure includes the following. First, providing a substrate. Second, depositing a multilayer dielectric film on the substrate. Third, forming a patterned photoresist on the multilayer dielectric film. Fourth, etching the multilayer dielectric film to form a plurality of trenches, a portion of each of the trenches having an enlarged width at each of sidewalls thereof. Fifth, filling the trenches with conductive metal to form conductive lines such that air is trapped in extremities of the enlarged width portions of the trenches.
Abstract:
A method of forming at least one quantum dot is disclosed. A substrate having a single crystal structure is provided. An insulating layer is formed on the substrate. At least one opening is defined in the insulating layer, thereby exposing at least one corresponding portion of the substrate. At least one quantum dot having a crystal structure is grown, each quantum dot being epitaxially grown on a corresponding exposed portion of the substrate. The insulating layer is removed, thereby obtaining the at least one quantum dot on the substrate.