METHOD AND X-RAY APPARATUS FOR INTERFEROMETRIC 2D X-RAY IMAGING

    公开(公告)号:US20170258423A1

    公开(公告)日:2017-09-14

    申请号:US15456811

    申请日:2017-03-13

    CPC classification number: A61B6/4291 A61B6/4035 A61B6/484

    Abstract: A method and an x-ray apparatus for interferometric 2D x-ray imaging, use a Talbot-Lau interferometer having at least one phase grating and an analysis grating for producing 2D images of an object to be examined using a phase stepping method. A stepwise readout of a detector is carried out continuously at a multiplicity of the phase positions of an interference pattern. Time sequences of readout interval data records which overlap in time are extracted from the readout data records, and at least one result image data record is calculated from an absorption image and/or a phase-contrast image and/or a dark-field image from each readout interval data record.

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