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公开(公告)号:US10930537B2
公开(公告)日:2021-02-23
申请号:US16774758
申请日:2020-01-28
Applicant: SINFONIA TECHNOLOGY CO., LTD.
Inventor: Toshihiro Kawai , Yasushi Taniyama , Munekazu Komiya , Takashi Shigeta
IPC: H01L21/677 , H01L21/67 , H01L21/673
Abstract: Provided are a door opening/closing system which prevents the entry of atmospheric air into a front-opening unified pod (FOUP) and an equipment front end module (EFEM) when the FOUP and the EFEM are placed in communication with each other, and a load port equipped with the door opening/closing system. The door opening/closing system is provided with: a base which constitutes a part of a wall isolating a conveyance space from an external space, an opening portion provided in the base; a door which is capable of opening and closing the opening portion; a first seal member which seals a gap between the base and a container; a second seal member which seals a gap between the base and the door, a sealed space which is constituted by the base, the first seal member, the second seal member, a lid member, and the door when the container is in a state of contact with the opening portion with the first seal member therebetween, a first gas injection unit which injects gas into the sealed space; and a second gas discharge unit 88 which evacuates the sealed space.
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公开(公告)号:US10672632B2
公开(公告)日:2020-06-02
申请号:US15554135
申请日:2016-02-05
Applicant: SINFONIA TECHNOLOGY CO., LTD.
Inventor: Toshihiro Kawai , Takashi Shigeta , Munekazu Komiya , Yasushi Taniyama
IPC: H01L21/67 , B01D53/40 , B01D53/42 , C12M1/12 , F24F13/28 , F24F6/00 , F24F7/06 , H01L21/687 , B01D53/04 , F24F7/00 , B65G49/07 , H01L21/677
Abstract: To provide a transfer chamber capable of replacing a chemical filter without affecting an internal atmosphere, and shortening or eliminating stop time of a transfer process of a wafer (W) associated with replacement of the chemical filter. The transfer chamber transfers the wafer (W) to or from a processing device (6) by using a transfer robot (2) provided thereinside, and includes a circulation path (CL1) formed inside of a transfer chamber (1) to circulate gas, a chemical filter unit (7) provided in the midstream of the circulation path (CL1), and a connecting and disconnecting means (8) which switches connection and disconnection of the chemical filter unit (7) to and from the circulation path (CL1).
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公开(公告)号:US10658217B2
公开(公告)日:2020-05-19
申请号:US15554152
申请日:2016-02-05
Applicant: SINFONIA TECHNOLOGY CO., LTD.
Inventor: Toshihiro Kawai , Takashi Shigeta , Munekazu Komiya , Yasushi Taniyama
IPC: H01L21/677 , H01L21/67 , H01L21/673 , H01L21/02
Abstract: The transfer chamber transfers a wafer (W) as a transferred object to or from a processing device (6) by using a transfer robot (2) provided thereinside, and includes a circulation path (CL) formed inside of a transfer chamber (1) to circulate gas, a chemical filter unit (7) as a chemical filter provided in the midstream of the circulation path (CL), a humidity detector (HG2) as a humidity detection means which detects internal humidity, a gas supply means (NS) which supplies gas to the inside of the transfer chamber (1), and a moisture supply means (HS) which supplies moisture content to the inside of the transfer chamber (1). The moisture supply means (HS) is made to operate in accordance with a humidity detection value by the humidity detection means.
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公开(公告)号:US11823923B2
公开(公告)日:2023-11-21
申请号:US17860202
申请日:2022-07-08
Applicant: SINFONIA TECHNOLOGY CO., LTD.
Inventor: Toshihiro Kawai , Takashi Shigeta , Munekazu Komiya , Yasushi Taniyama
IPC: H01L21/67 , F24F13/28 , F24F7/06 , B01D53/04 , B65G49/07 , H01L21/677 , F24F3/167 , F24F7/08 , H01L21/673 , F24F7/003 , B01D53/40 , B01D53/42 , C12M1/12 , F24F6/00 , H01L21/687
CPC classification number: H01L21/67196 , B01D53/04 , B01D53/40 , B01D53/42 , B65G49/07 , C12M37/00 , F24F3/167 , F24F6/00 , F24F7/003 , F24F7/06 , F24F7/065 , F24F7/08 , F24F13/28 , H01L21/67017 , H01L21/67389 , H01L21/67393 , H01L21/67766 , H01L21/68707 , B01D2258/02
Abstract: To provide a transfer chamber capable of replacing a chemical filter without affecting an internal atmosphere, and shortening or eliminating stop time of a transfer process of a wafer (W) associated with replacement of the chemical filter.
The transfer chamber transfers the wafer (W) to or from a processing device (6) by using a transfer robot (2) provided thereinside, and includes a circulation path (CL1) formed inside of a transfer chamber (1) to circulate gas, a chemical filter unit (7) provided in the midstream of the circulation path (CL1), and a connecting and disconnecting means (8) which switches connection and disconnection of the chemical filter unit (7) to and from the circulation path (CL1).-
公开(公告)号:US11610797B2
公开(公告)日:2023-03-21
申请号:US17297509
申请日:2019-11-25
Applicant: Sinfonia Technology Co., Ltd.
Inventor: Yasushi Taniyama , Toshihiro Kawai
IPC: H01L21/677 , B65G1/04 , F24F13/06 , H01L21/687 , B25J11/00
Abstract: A wafer stocker is capable of further improving an environment around wafers. The wafer stocker includes a housing, a loading device provided on a front surface of the housing, a wafer cassette shelf arranged in the housing, a wafer transfer robot configured to move the wafers from a transfer container mounted on the loading device to a wafer cassette in the wafer cassette shelf, a wafer cassette delivery device configured to move the wafer cassette in the wafer cassette shelf to a stage having a different height, and a fan filter unit configured to generate a laminar flow in a wafer transfer space and in a wafer cassette transfer space.
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公开(公告)号:US20220336245A1
公开(公告)日:2022-10-20
申请号:US17761816
申请日:2020-09-23
Applicant: Sinfonia Technology Co., Ltd.
Inventor: Toshihiro Kawai , Hiroaki Nakamura , Gengoro Ogura , Kosuke Sugiura , Yasushi Taniyama
IPC: H01L21/677 , B65G47/248
Abstract: There is provided a technique capable of efficiently transporting a plurality of objects between a storage container configured to store the plurality of objects and a processing apparatus configured to collectively process the plurality of objects. A transport system 1 for transporting a plurality of objects between a storage container 9 configured to store the plurality of objects and a processing apparatus 2 configured to collectively process the plurality of objects held on a tray 8, includes: a mounting part 31 on which the storage container 9 is mounted; a stage 41 on which the plurality of objects are mounted; a tray support part 51 configured to support the tray 8; a first transport device 44 configured to transport the plurality of objects between the storage container 9 mounted on the mounting part 31 and the stage 41; and a second transport device 53 configured to transport the plurality of objects between the stage 41 and the tray 8 supported by the tray support part 51.
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公开(公告)号:US10923372B2
公开(公告)日:2021-02-16
申请号:US15757560
申请日:2016-08-19
Applicant: SINFONIA TECHNOLOGY CO., LTD.
Inventor: Toshihiro Kawai , Yasushi Taniyama , Munekazu Komiya , Takashi Shigeta
IPC: F16K31/122 , H01L21/673 , F16K15/14 , H01L21/677 , F16K15/02
Abstract: There is provided a gas injection device configured to prevent entry of atmospheric air when charging gas into a FOUP. In order to realize such a gas injection device, the gas injection device is structured so as to include: a gas supply port 72 through which inert gas is supplied; a nozzle main body 71 including a gas passage 77 communicating with the gas supply port 72; an opening/closing mechanism 92 configured to close the gas supply port 72; and an opener 96 configured to cause the opening/closing mechanism 92 to open the gas supply port 72 closed by the opening/closing mechanism 92.
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公开(公告)号:US20190145641A1
公开(公告)日:2019-05-16
申请号:US16244490
申请日:2019-01-10
Applicant: SINFONIA TECHNOLOGY CO., LTD.
Inventor: Yasushi Taniyama , Mitsutoshi Ochiai , Mitsuo Natsume , Atsushi Suzuki
IPC: F24F9/00 , H01L21/677 , H01L21/67
Abstract: There is provided a method for manufacturing semiconductor. The method includes providing a semiconductor manufacturing apparatus and providing an EFEM. The EFEM includes a shield gas curtain apparatus 6 that forms a gas curtain capable of shielding an opening 23 when an internal space 5S of a purge container 5, in which the humidity is reduced to a predetermined value by means of a bottom purge apparatus 25 provided in a load port 2, is brought into communication with an internal space 3S of a wafer transport chamber 3, the gas curtain being formed of a shield curtain gas blown immediately downward from a location near the opening 23 of the load port 2 and being closer to the wafer transport chamber 3 than the opening 23 at a higher height than an upper edge of the opening 23.
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公开(公告)号:US20150024671A1
公开(公告)日:2015-01-22
申请号:US14269360
申请日:2014-05-05
Applicant: SINFONIA TECHNOLOGY CO., LTD.
Inventor: Yasushi Taniyama , Mitsutoshi Ochiai , Mitsuo Natsume , Atsushi Suzuki
IPC: F24F9/00
CPC classification number: F24F9/00 , F24F3/161 , H01L21/67017 , H01L21/67772
Abstract: There is provided an EFEM that includes a shield gas curtain apparatus 6 that forms a gas curtain capable of shielding an opening 23 when an internal space 5S of a purge container 5, in which the humidity is reduced to a predetermined value by means of a bottom purge apparatus 25 provided in a load port 2, is brought into communication with an internal space 3S of a wafer transport chamber 3, the gas curtain being formed of a shield curtain gas blown immediately downward from a location near the opening 23 of the load port 2 and being closer to the wafer transport chamber 3 than the opening 23 at a higher height than an upper edge of the opening 23. The EFEM thus configured can prevent and suppress a rapid increase in the humidity in the purge container, in which the humidity in the interior space is reduced by performing the bottom purging, occurring immediately after a lid of the purge container is opened, so that quality degradation due to the moisture adhered on a wafer can be avoided.
Abstract translation: 提供了一种EFEM,其包括屏蔽气幕装置6,其形成能够屏蔽开口23的气幕,当清洗容器5的内部空间5S通过底部将湿度降低到预定值时 设置在负载端口2中的净化装置25与晶片运送室3的内部空间3S连通,气幕由从负载端口的开口23附近的位置立即向下吹出的屏蔽帘式气体形成 并且比开口23更高的高度比开口23更靠近晶片输送室3.如此构造的EFEM可以防止和抑制净化容器中的湿度的快速增加,其中湿度 通过执行底部清洗,在清洗容器的盖子打开之后立即发生的内部空间被减少,使得由于水分附着在晶片上而导致的质量劣化可以是avoi ded。
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公开(公告)号:US20230207367A1
公开(公告)日:2023-06-29
申请号:US18115044
申请日:2023-02-28
Applicant: Sinfonia Technology Co., Ltd.
Inventor: Yasushi Taniyama , Toshihiro Kawai
IPC: H01L21/677 , B65G1/04 , F24F13/06 , H01L21/687
CPC classification number: H01L21/67778 , B65G1/0485 , F24F13/06 , H01L21/67766 , H01L21/67769 , H01L21/68707 , B25J11/0095
Abstract: A wafer stocker capable of further improving an environment around wafers is provided. The wafer stocker includes a housing, a loading device provided on a front surface of the housing, a wafer cassette shelf arranged in the housing, a wafer transfer robot configured to move the wafers from a transfer container mounted on the loading device to a wafer cassette in the wafer cassette shelf, a wafer cassette delivery device configured to move the wafer cassette in the wafer cassette shelf to a stage having a different height, and a fan filter unit configured to generate a laminar flow in a wafer transfer space and in a wafer cassette transfer space.
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