Memory and method for operating the memory

    公开(公告)号:US10740179B2

    公开(公告)日:2020-08-11

    申请号:US16182928

    申请日:2018-11-07

    申请人: SK hynix Inc.

    发明人: Sungeun Lee

    摘要: An error correction method and a chip kill detection method of a memory including a plurality of chips may be provided. The method may include a first data error detection step of detecting whether an error exists in data outputted from the plurality of chips. The method may include a random error correction step of correcting an error occurred in data when it is detected in the first data error detection step that an error exists. The method may include a chip kill detection step of determining, when an error occurs even after the random error correction step, that a chip kill error has occurred, and detecting a chip where the chip kill error has occurred, by correcting the error through assuming one chip among the plurality of chips as a chip where the chip kill error has occurred.

    Semiconductor systems
    2.
    发明授权

    公开(公告)号:US10261860B2

    公开(公告)日:2019-04-16

    申请号:US15611151

    申请日:2017-06-01

    申请人: SK hynix Inc.

    摘要: A semiconductor system includes a host and a media controller. The host may generate first host parities from first host data based on an error check matrix. The media controller may include a first input/output (I/O) circuit and a second I/O circuit. The media controller may generate first media data and first media parities based on the first host data and the first host parities. The first I/O circuit may generate, based on the error check matrix, first internal data by correcting errors in the first host data using the first host parities. The second I/O circuit may generate the first media data and the first media parities from the first internal data.