-
公开(公告)号:US10740179B2
公开(公告)日:2020-08-11
申请号:US16182928
申请日:2018-11-07
申请人: SK hynix Inc.
发明人: Sungeun Lee
摘要: An error correction method and a chip kill detection method of a memory including a plurality of chips may be provided. The method may include a first data error detection step of detecting whether an error exists in data outputted from the plurality of chips. The method may include a random error correction step of correcting an error occurred in data when it is detected in the first data error detection step that an error exists. The method may include a chip kill detection step of determining, when an error occurs even after the random error correction step, that a chip kill error has occurred, and detecting a chip where the chip kill error has occurred, by correcting the error through assuming one chip among the plurality of chips as a chip where the chip kill error has occurred.
-
公开(公告)号:US10261860B2
公开(公告)日:2019-04-16
申请号:US15611151
申请日:2017-06-01
申请人: SK hynix Inc.
发明人: Sungeun Lee , Jung Hyun Kwon , Yong Ju Kim , Jae Sun Lee , Jingzhe Xu
摘要: A semiconductor system includes a host and a media controller. The host may generate first host parities from first host data based on an error check matrix. The media controller may include a first input/output (I/O) circuit and a second I/O circuit. The media controller may generate first media data and first media parities based on the first host data and the first host parities. The first I/O circuit may generate, based on the error check matrix, first internal data by correcting errors in the first host data using the first host parities. The second I/O circuit may generate the first media data and the first media parities from the first internal data.
-
公开(公告)号:US10108250B2
公开(公告)日:2018-10-23
申请号:US15230734
申请日:2016-08-08
申请人: SK hynix Inc.
发明人: Yong Ju Kim , Jung Hyun Kwon , Donggun Kim , Sungeun Lee , Jae Sun Lee , Sang Gu Jo , Jingzhe Xu , Do Sun Hong
IPC分类号: G06F1/32 , G06F12/02 , G06F12/1009 , G06F12/121 , G11C11/4074 , G11C11/4091 , G11C11/406
摘要: In an embodiment of the present disclosure, a memory module may be provided. In an embodiment of the present disclosure, a system may be provided. In an embodiment of the present disclosure, an operation of a system and memory module may be provided. The memory module may include a plurality of ranks in which a defragmentation operation of a memory is performed based on entrance of a low-power operation mode, and a vacant region of the memory is powered off based on entrance of a self-refresh mode after the defragmentation operation is ended. The memory module may include a page table of which data are updated based on an ending of the defragmentation operation of the memory.
-
公开(公告)号:US10114561B2
公开(公告)日:2018-10-30
申请号:US15493289
申请日:2017-04-21
申请人: SK hynix Inc.
发明人: Do-Sun Hong , Jung Hyun Kwon , Donggun Kim , Yong Ju Kim , Sungeun Lee , Jae Sun Lee , Sang Gu Jo , Jingzhe Xu
摘要: A memory controller may be provided. The memory controller may include a wear-leveler may be configured to determine whether execution of a swapping operation is required based on reception of a write command for a stack region.
-
公开(公告)号:US10083103B1
公开(公告)日:2018-09-25
申请号:US15823190
申请日:2017-11-27
申请人: SK hynix Inc.
发明人: Jung Hyun Kwon , Sungeun Lee , Sang Gu Jo
摘要: A circuit for calculating power consumption of a phase change memory (PCM) device may be provided. The circuit may include a plurality of pipelines and an arithmetic logic circuit. The plurality of pipelines may be configured to correspond to a plurality of write periods exhibiting different power consumption values during a write operation of the PCM device executed by a write command. The plurality of pipelines may shift or transmit data in synchronization with a clock signal. The arithmetic logic circuit may be configured to perform an adding operation of all of deviations of the power consumption values at a point of time that data transmission between at least two of the plurality of pipelines occurs, to thus generate a total power consumption value.
-
-
-
-