公开(公告)号：US11537833B2

公开(公告)日：2022-12-27

申请号：US17492839

申请日：2021-10-04

Applicant: STMicroelectronics (Rousset) SAS

Inventor： Julien Mercier

IPC: G06K19/07

Abstract: A first element and a second element of a same device communicate with each other. The first element sends the second element a first piece of information representative of energy supplied by an electromagnetic field supplying power the device. The second element adapts its operating frequency as a function of the first piece of information.

公开(公告)号：US09379066B2

公开(公告)日：2016-06-28

申请号：US14686908

申请日：2015-04-15

Applicant: STMicroelectronics (Rousset) SAS

Inventor： Fabrice Marinet ,  Julien Mercier ,  Jimmy Fort ,  Alexandre Sarafianos

IPC: H01L29/76 ,  H01L23/00 ,  H01L27/06 ,  H01L27/092 ,  H01L29/732

CPC classification number: H01L23/576 ,  G09C1/00 ,  H01L23/57 ,  H01L27/0635 ,  H01L27/0658 ,  H01L27/092 ,  H01L29/7322 ,  H01L2924/0002 ,  H04L9/004 ,  H04L2209/12 ,  H01L2924/00

Abstract: A device for detecting a laser attack made on an integrated circuit chip comprises a bipolar transistor of a first type formed in a semiconductor substrate, that bipolar transistor comprising a parasitic bipolar transistor of a second type. A buried region, forming the base of the parasitic bipolar transistor, operates as a detector of the variations in current flowing caused by impingement of laser light on the substrate.

公开(公告)号：US20150048459A1

公开(公告)日：2015-02-19

申请号：US14531025

申请日：2014-11-03

Applicant: STMicroelectronics (Rousset) SAS

Inventor： Fabrice Marinet ,  Jimmy Fort ,  Alexandre Sarafianos ,  Julien Mercier

IPC: H01L23/00 ,  H01L29/732 ,  H01L27/092 ,  H01L27/06

CPC classification number: H01L23/576 ,  G09C1/00 ,  H01L23/57 ,  H01L27/0635 ,  H01L27/0658 ,  H01L27/092 ,  H01L29/7322 ,  H01L2924/0002 ,  H04L9/004 ,  H04L2209/12 ,  H01L2924/00

Abstract: A device for detecting a laser attack made on an integrated circuit chip comprises a bipolar transistor of a first type formed in a semiconductor substrate, that bipolar transistor comprising a parasitic bipolar transistor of a second type. A buried region, forming the base of the parasitic bipolar transistor, operates as a detector of the variations in current flowing caused by impingement of laser light on the substrate.

Abstract translation: 用于检测在集成电路芯片上进行的激光攻击的装置包括形成在半导体衬底中的第一类型的双极晶体管，该双极晶体管包括第二类型的寄生双极晶体管。 形成寄生双极晶体管的基极的掩埋区域作为由激光照射在衬底上引起的电流变化的检测器。

公开(公告)号：US20130200371A1

公开(公告)日：2013-08-08

申请号：US13751549

申请日：2013-01-28

Applicant: STMicroelectronics (Rousset) SAS

Inventor： Fabrice Marinet ,  Jimmy Fort ,  Alexandre Sarafianos ,  Julien Mercier

IPC: H01L23/00

CPC classification number: H01L23/576 ,  G09C1/00 ,  H01L23/57 ,  H01L27/0635 ,  H01L27/0658 ,  H01L27/092 ,  H01L29/7322 ,  H01L2924/0002 ,  H04L9/004 ,  H04L2209/12 ,  H01L2924/00

Abstract: A device for detecting a laser attack in an integrated circuit chip formed in the upper P-type portion of a semiconductor substrate incorporating an NPN bipolar transistor having an N-type buried layer, including a detector of the variations of the current flowing between the base of said NPN bipolar transistor and the substrate.

Abstract translation: 一种用于检测形成在具有N型掩埋层的NPN双极晶体管的半导体衬底的上部P型部分中形成的集成电路芯片中的激光攻击的装置，包括：检测器， 的NPN双极晶体管和衬底。

公开(公告)号：US11151435B2

公开(公告)日：2021-10-19

申请号：US17028493

申请日：2020-09-22

Applicant: STMicroelectronics (Rousset) SAS

Inventor： Julien Mercier

IPC: G06K19/07

Abstract: A first element and a second element of a same device communicate with each other. The first element sends the second element a first piece of information representative of energy supplied by an electromagnetic field supplying power the device. The second element adapts its operating frequency as a function of the first piece of information.

公开(公告)号：US20160133582A1

公开(公告)日：2016-05-12

申请号：US14686908

申请日：2015-04-15

Applicant: STMicroelectronics (Rousset) SAS

Inventor： Fabrice Marinet ,  Julien Mercier ,  Jimmy Fort ,  Alexandre Sarafianos

IPC: H01L23/00 ,  H01L27/092 ,  H01L29/732 ,  H01L27/06

CPC classification number: H01L23/576 ,  G09C1/00 ,  H01L23/57 ,  H01L27/0635 ,  H01L27/0658 ,  H01L27/092 ,  H01L29/7322 ,  H01L2924/0002 ,  H04L9/004 ,  H04L2209/12 ,  H01L2924/00

Abstract: A device for detecting a laser attack made on an integrated circuit chip comprises a bipolar transistor of a first type formed in a semiconductor substrate, that bipolar transistor comprising a parasitic bipolar transistor of a second type. A buried region, forming the base of the parasitic bipolar transistor, operates as a detector of the variations in current flowing caused by impingement of laser light on the substrate.

公开(公告)号：US09070697B2

公开(公告)日：2015-06-30

申请号：US14531025

申请日：2014-11-03

Applicant: STMicroelectronics (Rousset) SAS

Inventor： Fabrice Marinet ,  Jimmy Fort ,  Alexandre Sarafianos ,  Julien Mercier

IPC: H01L29/00 ,  H01L23/00 ,  H01L29/732 ,  H01L27/092 ,  H01L27/06

CPC classification number: H01L23/576 ,  G09C1/00 ,  H01L23/57 ,  H01L27/0635 ,  H01L27/0658 ,  H01L27/092 ,  H01L29/7322 ,  H01L2924/0002 ,  H04L9/004 ,  H04L2209/12 ,  H01L2924/00

Abstract: A device for detecting a laser attack made on an integrated circuit chip comprises a bipolar transistor of a first type formed in a semiconductor substrate, that bipolar transistor comprising a parasitic bipolar transistor of a second type. A buried region, forming the base of the parasitic bipolar transistor, operates as a detector of the variations in current flowing caused by impingement of laser light on the substrate.

Abstract translation: 用于检测在集成电路芯片上形成的激光攻击的装置包括形成在半导体衬底中的第一类型的双极晶体管，该双极晶体管包括第二类型的寄生双极晶体管。 形成寄生双极晶体管的基极的掩埋区域作为由激光照射在衬底上引起的电流变化的检测器。

公开(公告)号：US08907452B2

公开(公告)日：2014-12-09

申请号：US13751549

申请日：2013-01-28

Applicant: STMicroelectronics (Rousset) SAS

Inventor： Fabrice Marinet ,  Jimmy Fort ,  Alexandre Sarafianos ,  Julien Mercier

IPC: H01L27/082

CPC classification number: H01L23/576 ,  G09C1/00 ,  H01L23/57 ,  H01L27/0635 ,  H01L27/0658 ,  H01L27/092 ,  H01L29/7322 ,  H01L2924/0002 ,  H04L9/004 ,  H04L2209/12 ,  H01L2924/00

Abstract: A device for detecting a laser attack in an integrated circuit chip formed in the upper P-type portion of a semiconductor substrate incorporating an NPN bipolar transistor having an N-type buried layer, including a detector of the variations of the current flowing between the base of said NPN bipolar transistor and the substrate.

Abstract translation: 一种用于检测形成在具有N型掩埋层的NPN双极晶体管的半导体衬底的上部P型部分中形成的集成电路芯片中的激光攻击的装置，包括：检测器， 的NPN双极晶体管和衬底。