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公开(公告)号：US20220190585A1
公开(公告)日：2022-06-16
申请号：US17454228
申请日：2021-11-09
Applicant: STMicroelectronics S.r.l.
Inventor： Nicola Errico , Antonio Giordano , Orazio Pennisi , Leonardo Pedone , Luca Finazzi
Abstract: A circuit includes comparator circuitry to sense a current through a load and compare the intensity of the current with a comparison threshold which can be set to a first, lower threshold value and a second, higher threshold value. Logic circuitry receives from the comparator circuitry a comparison signal having a first value or a second value based on whether the intensity is lower or higher than the comparison threshold. The logic circuitry is configured to assert a first overcurrent event signal or a second overcurrent event signal based on the comparison signal having the first value or the second value and the comparison threshold set to the first or second threshold value.
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公开(公告)号：US11979143B2
公开(公告)日：2024-05-07
申请号：US17870173
申请日：2022-07-21
Applicant: STMicroelectronics S.r.l.
Inventor： Nicola Errico , Valerio Bendotti , Luca Finazzi , Gaudenzia Bagnati
CPC classification number: H03K17/162 , H02M3/158 , H03K2217/0063 , H03K2217/0072 , H03K2217/0081
Abstract: A circuit includes a high-side transistor pair and a low-side transistor pair having a common intermediate node. The high-side transistor pair includes a first transistor having a control node and a current flowpath therethrough configured to provide a current flow line between a supply voltage node and the intermediate node, and a second transistor having a current flowpath therethrough coupled to the control node of the first transistor. The low-side transistor pair includes a third transistor having a control node and a current flowpath therethrough configured to provide a current flow line between the intermediate node and the reference voltage node, and a fourth transistor having a current flowpath therethrough coupled to the control node of the third transistor. Testing circuitry is configured to be coupled to at least one of the second transistor and the fourth transistor to apply thereto a test-mode signal.
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公开(公告)号：US11557891B2
公开(公告)日：2023-01-17
申请号：US17454228
申请日：2021-11-09
Applicant: STMicroelectronics S.r.l.
Inventor： Nicola Errico , Antonio Giordano , Orazio Pennisi , Leonardo Pedone , Luca Finazzi
Abstract: A circuit includes comparator circuitry to sense a current through a load and compare the intensity of the current with a comparison threshold which can be set to a first, lower threshold value and a second, higher threshold value. Logic circuitry receives from the comparator circuitry a comparison signal having a first value or a second value based on whether the intensity is lower or higher than the comparison threshold. The logic circuitry is configured to assert a first overcurrent event signal or a second overcurrent event signal based on the comparison signal having the first value or the second value and the comparison threshold set to the first or second threshold value.
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