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公开(公告)号：US10522430B2
公开(公告)日：2019-12-31
申请号：US15498924
申请日：2017-04-27
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Zhan Zhan , Hwa Sung Rhee , Myung Jo Chun
Abstract: A semiconductor device includes first and second pads separated from each other, first and second test elements connected to the first and second pads and connected to each other in parallel between the first and second pads, a first diode connected to the first test element in series, and a second diode connected to the second test element in series.
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公开(公告)号：US10600702B2
公开(公告)日：2020-03-24
申请号：US16148424
申请日：2018-10-01
Applicant: Samsung Electronics Co., Ltd.
Inventor： Zhan Zhan , Ju Hyun Kim , Sung Gun Kang , Hwa Sung Rhee
IPC: H01L23/528 , H01L21/66 , H01L27/092 , G01R31/28 , H01L29/08
Abstract: A test element group includes a test element including a plurality of test transistors connected in series between a first node and a second node, the second node being connected to a ground node; a first transistor connected between the first node and a power supply node; and a second transistor configured to generate an output current, proportional to a voltage at the first node, and connected to the first node and the power supply node.
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公开(公告)号：US20190304856A1
公开(公告)日：2019-10-03
申请号：US16148424
申请日：2018-10-01
Applicant: Samsung Electronics Co., Ltd.
Inventor： Zhan Zhan , Ju Hyun Kim , Sung Gun Kang , Hwa Sung Rhee
IPC: H01L21/66 , H01L27/092 , H01L23/528 , H01L29/08 , G01R31/28
Abstract: A test element group includes a test element including a plurality of test transistors connected in series between a first node and a second node, the second node being connected to a ground node; a first transistor connected between the first node and a power supply node; and a second transistor configured to generate an output current, proportional to a voltage at the first node, and connected to the first node and the power supply node.
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