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公开(公告)号:US20220068331A1
公开(公告)日:2022-03-03
申请号:US17230403
申请日:2021-04-14
Applicant: Samsung Electronics Co., Ltd.
Inventor: Mingyu LEE , Jaewoo PARK , Younghoon SON , Youngdon CHOI , Hyungmin JIN , Junghwan CHOI
Abstract: A method of operating a memory device including receiving a multilevel signal having M levels transmitted by an external controller through a clock receiving pin, where M is a natural number greater than 2, and decoding the multilevel signal to restore at least one of Data Bus Inversion (DBI) data, Data Mask (DM) data, Cyclic Redundancy Check (CRC) data, or Error Correction Code (ECC) data may be provided. The multilevel signal is a clock signal transmitted by the external controller, and is a signal swinging based on an intermediate reference signal that is an intermediate value between a minimum level and a maximum level among the M levels.
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公开(公告)号:US20220121582A1
公开(公告)日:2022-04-21
申请号:US17326513
申请日:2021-05-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyungmin JIN , Jindo BYUN , Younghoon SON , Youngdon CHOI , Junghwan CHOI
Abstract: A memory system including: a memory controller to transmit a command, an address, or data to a first channel based on a data input/output signal having one of N (N is a natural number of three or more) different voltage levels during a first time interval, the memory controller transmitting the command, the address, or the data not transmitted during the first time interval to the first channel based on the data input/output signal having one of two different voltage levels during a second time interval; and a memory device to sample the data input/output signal received via the first channel during the first time interval in a pulse amplitude modulation (PAM)-N mode, the memory device sampling the data input/output signal received via the first channel during the second time interval in a non return to zero (NRZ) mode.
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公开(公告)号:US20220414032A1
公开(公告)日:2022-12-29
申请号:US17903240
申请日:2022-09-06
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyungmin JIN , Jindo BYUN , Younghoon SON , Youngdon CHOI , Junghwan CHOI
Abstract: A memory system including: a memory controller to transmit a command, an address, or data to a first channel based on a data input/output signal having one of N (N is a natural number of three or more) different voltage levels during a first time interval, the memory controller transmitting the command, the address, or the data not transmitted during the first time interval to the first channel based on the data input/output signal having one of two different voltage levels during a second time interval; and a memory device to sample the data input/output signal received via the first channel during the first time interval in a pulse amplitude modulation (PAM)-N mode, the memory device sampling the data input/output signal received via the first channel during the second time interval in a non return to zero (NRZ) mode.
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公开(公告)号:US20220190936A1
公开(公告)日:2022-06-16
申请号:US17366329
申请日:2021-07-02
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyungmin JIN , Younghoon SON , Hyunyoon CHO , Youngdon CHOI , Junghwan CHOI
Abstract: A translation device, a test system, and a memory system are provided. The translation device includes plural first input/output (I/O) circuits that respectively transmit and receive first signals through plural pins based on a pulse amplitude modulation (PAM)-M mode, a second I/O circuit that transmits and receives a second signal through one or more pins based on a PAM-N mode, and a translation circuit that translates the first signals into the second signal and translates the second signal into the first signals. M and N are different integers of 2 or more.
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公开(公告)号:US20240370386A1
公开(公告)日:2024-11-07
申请号:US18772354
申请日:2024-07-15
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyungmin JIN , Jindo BYUN , Younghoon SON , Youngdon CHOI , Junghwan CHOI
Abstract: A memory system including: a memory controller to transmit a command, an address, or data to a first channel based on a data input/output signal having one of N (N is a natural number of three or more) different voltage levels during a first time interval, the memory controller transmitting the command, the address, or the data not transmitted during the first time interval to the first channel based on the data input/output signal having one of two different voltage levels during a second time interval; and a memory device to sample the data input/output signal received via the first channel during the first time interval in a pulse amplitude modulation (PAM)-N mode, the memory device sampling the data input/output signal received via the first channel during the second time interval in a non return to zero (NRZ) mode.
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公开(公告)号:US20230409496A1
公开(公告)日:2023-12-21
申请号:US18242034
申请日:2023-09-05
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyungmin JIN , Jindo Byun , Younghoon Son , Youngdon Choi , Junghwan Choi
CPC classification number: G06F13/1668 , H04L25/4917
Abstract: A memory system including: a memory controller to transmit a command, an address, or data to a first channel based on a data input/output signal having one of N (N is a natural number of three or more) different voltage levels during a first time interval, the memory controller transmitting the command, the address, or the data not transmitted during the first time interval to the first channel based on the data input/output signal having one of two different voltage levels during a second time interval; and a memory device to sample the data input/output signal received via the first channel during the first time interval in a pulse amplitude modulation (PAM)-N mode, the memory device sampling the data input/output signal received via the first channel during the second time interval in a non return to zero (NRZ) mode.
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7.
公开(公告)号:US20230171007A1
公开(公告)日:2023-06-01
申请号:US18096657
申请日:2023-01-13
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyungmin JIN , Younghoon SON , Hyunyoon CHO , Youngdon CHOI , Junghwan CHOI
CPC classification number: H04B17/19 , H04B17/18 , H04B17/0085 , H04L7/0016
Abstract: A translation device, a test system, and a memory system are provided. The translation device includes plural first input/output (I/O) circuits that respectively transmit and receive first signals through plural pins based on a pulse amplitude modulation (PAM)-M mode, a second I/O circuit that transmits and receives a second signal through one or more pins based on a PAM-N mode, and a translation circuit that translates the first signals into the second signal and translates the second signal into the first signals. M and N are different integers of 2 or more.
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