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公开(公告)号:US20230126686A1
公开(公告)日:2023-04-27
申请号:US17871449
申请日:2022-07-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Inhyo Hwang , Younglyong Kim , Hyunsoo Chung
IPC: H01L23/498 , H01L23/00 , H01L25/00 , H01L25/065
Abstract: A semiconductor package includes a package substrate and a plurality of sub-packages provided on the package substrate. Each of the plurality of sub-packages includes a semiconductor chip, an interposer provided adjacent to the semiconductor chip, the interposer including a plurality of first through-silicon vias, an encapsulator provided between the semiconductor chip and the interposer, and a redistribution layer provided on the interposer, the encapsulator and the semiconductor chip. The semiconductor chip includes a semiconductor substrate having a first surface and a second surface opposite the first surface and a plurality of chip pads provided on the first surface. The redistribution layer includes a plurality of redistribution pads and a horizontal wiring provided between the plurality of redistribution pads and the plurality of first through-silicon vias. The redistribution layer is provided on the second surface of the semiconductor substrate, and extends on the encapsulator and the interposer.
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公开(公告)号:US12159858B2
公开(公告)日:2024-12-03
申请号:US17568361
申请日:2022-01-04
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyunsoo Chung , Young Lyong Kim , Inhyo Hwang
IPC: H01L25/065 , H01L23/00 , H01L23/31 , H01L23/498 , H01L25/00
Abstract: A semiconductor package includes a first semiconductor chip on a substrate, a buried solder ball on the substrate and spaced apart from the first semiconductor chip, a first molding layer on the substrate and encapsulating and exposing the first semiconductor chip and the buried solder ball, a second semiconductor chip on the first molding layer and vertically overlapping the buried solder ball and a portion of the first semiconductor chip, and a second molding layer on the first molding layer and covering the second semiconductor chip. The second semiconductor chip is supported on the first semiconductor chip through a dummy solder ball between the first and second semiconductor chips. The second semiconductor chip is connected to the buried solder ball through a signal solder ball between the buried solder ball and the second semiconductor chip.
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公开(公告)号:US20240032311A1
公开(公告)日:2024-01-25
申请号:US18180188
申请日:2023-03-08
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hyunsoo Chung , Young Lyong Kim , Inhyo Hwang
Abstract: A semiconductor device includes a peripheral circuit structure including peripheral circuits on a substrate and first bonding pads electrically connected to the peripheral circuits and a cell array structure including memory cells on a semiconductor layer and second bonding pads electrically connected to the memory cells and bonded to the first bonding pads. The cell array structure includes a stacked structure including insulating layers and electrodes, an external connection pad on a surface of the semiconductor layer, a dummy pattern at a same level as the semiconductor layer relative to the substrate, and a photosensitive insulating layer on the semiconductor layer and the dummy pattern. A first thickness of a portion of the photosensitive insulating layer vertically overlapping the external connection pad is greater than a second thickness of another portion of the photosensitive insulating layer vertically overlapping the dummy pattern.
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公开(公告)号:US20230163090A1
公开(公告)日:2023-05-25
申请号:US18048606
申请日:2022-10-21
Applicant: Samsung Electronics Co., Ltd.
Inventor: Chajea Jo , Inhyo Hwang
IPC: H01L23/00 , H01L25/065 , H01L25/18
CPC classification number: H01L24/08 , H01L25/0657 , H01L25/18 , H01L2224/08145 , H01L2924/1431 , H01L2924/14511
Abstract: A memory device is provided. The memory device includes a first structure and a second structure stacked on the first structure in a vertical direction. The first structure includes a first substrate, peripheral circuitry, an auxiliary memory cell array, a first insulating layer, and a plurality of first bonding pads. The second structure includes a second substrate, a main memory cell array, a second insulating layer, and a plurality of second bonding pads. The plurality of first bonding pads are in contact with the plurality of second bonding pads, respectively.
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公开(公告)号:US20250054915A1
公开(公告)日:2025-02-13
申请号:US18930667
申请日:2024-10-29
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyunsoo Chung , Young Lyong Kim , Inhyo Hwang
IPC: H01L25/065 , H01L23/00 , H01L23/31 , H01L23/498 , H01L25/00
Abstract: A semiconductor package includes a first semiconductor chip on a substrate, a buried solder ball on the substrate and spaced apart from the first semiconductor chip, a first molding layer on the substrate and encapsulating and exposing the first semiconductor chip and the buried solder ball, a second semiconductor chip on the first molding layer and vertically overlapping the buried solder ball and a portion of the first semiconductor chip, and a second molding layer on the first molding layer and covering the second semiconductor chip. The second semiconductor chip is supported on the first semiconductor chip through a dummy solder ball between the first and second semiconductor chips. The second semiconductor chip is connected to the buried solder ball through a signal solder ball between the buried solder ball and the second semiconductor chip.
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公开(公告)号:US12218100B2
公开(公告)日:2025-02-04
申请号:US17680617
申请日:2022-02-25
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Inhyo Hwang , Young Lyong Kim
IPC: H01L25/065 , H01L23/498 , H01L23/00
Abstract: Provided is a semiconductor package including a first semiconductor chip provided on a package substrate, an interconnection substrate provided on the package substrate, the interconnection substrate having a side surface facing the first semiconductor chip, and a second semiconductor chip provided on the interconnection substrate and extended to a region on a top surface of the first semiconductor chip, wherein the interconnection substrate includes a lower interconnection layer facing the package substrate, an upper interconnection layer facing the first semiconductor chip, and a passive device between the lower interconnection layer and the upper interconnection layer, and wherein the passive device is electrically connected to the second semiconductor chip.
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公开(公告)号:US12033948B2
公开(公告)日:2024-07-09
申请号:US17539963
申请日:2021-12-01
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Young Lyong Kim , Hyunsoo Chung , Inhyo Hwang
IPC: H01L23/538 , H01L23/31 , H01L25/065
CPC classification number: H01L23/5385 , H01L23/3114 , H01L23/5384 , H01L23/5386 , H01L25/0655
Abstract: A semiconductor package includes a package substrate with a first vent hole, a first semiconductor chip mounted the package substrate, an interposer including supporters on a bottom surface of the interposer and a second vent hole, wherein the supporters contact a top surface of the first semiconductor chip, and the interposer is electrically connected to the package substrate through connection terminals. The semiconductor package further include a second semiconductor chip mounted on the interposer, and a molding layer disposed on the package substrate to cover the first semiconductor chip, the interposer, and the second semiconductor chip.
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公开(公告)号:US20250046749A1
公开(公告)日:2025-02-06
申请号:US18783805
申请日:2024-07-25
Applicant: Samsung Electronics Co., Ltd.
Inventor: Hyunsoo Chung , Kwangsoo Kim , Inhyo Hwang
IPC: H01L23/00 , H01L23/31 , H01L23/498 , H01L23/538 , H01L25/18 , H10B80/00
Abstract: A semiconductor package includes an interposer; a plurality of semiconductor devices that are on the interposer and spaced apart from each other; and a package underfill layer that includes a first underfill layer in a first gap that is between the plurality of semiconductor devices and a second underfill layer in a second gap that is between the plurality of semiconductor devices and the interposer, where the second underfill layer includes a second underfill layer side surface that faces a lateral direction, where the second underfill layer side surface does not contact the plurality of semiconductor devices and a portion of the interposer that is adjacent to the second gap, where the second underfill layer side surface extends between a top surface of the interposer and bottom surfaces of the plurality of semiconductor devices and extends from a lower outer boundary.
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公开(公告)号:US20250022843A1
公开(公告)日:2025-01-16
申请号:US18428633
申请日:2024-01-31
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Hyunsoo Chung , Jaesic Lee , Inhyo Hwang
IPC: H01L25/065 , H01L23/00 , H01L23/29 , H01L23/31 , H01L23/367 , H01L23/373 , H01L25/00 , H01L25/18
Abstract: Provided a semiconductor package including a redistribution structure, a semiconductor structure on the redistribution structure, a plurality of semiconductor stacking structures on the redistribution structure, the plurality of semiconductor stacking structures being adjacent to the semiconductor structure, and a height of each of the plurality of semiconductor stacking structures being greater than a height of the semiconductor structure, and a heat dissipation structure on the semiconductor structure, the heat dissipation structure including a plurality of through openings, wherein each semiconductor stacking structure among the plurality of semiconductor stacking structures is positioned within a corresponding through opening among the plurality of through openings, and wherein an upper surface of each of the plurality of semiconductor stacking structures is exposed through the corresponding through opening.
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公开(公告)号:US20240332200A1
公开(公告)日:2024-10-03
申请号:US18737527
申请日:2024-06-07
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor: Young Lyong Kim , Hyunsoo Chung , Inhyo Hwang
IPC: H01L23/538 , H01L23/31 , H01L25/065
CPC classification number: H01L23/5385 , H01L23/3114 , H01L23/5384 , H01L23/5386 , H01L25/0655
Abstract: A semiconductor package includes a package substrate with a first vent hole, a first semiconductor chip mounted the package substrate, an interposer including supporters on a bottom surface of the interposer and a second vent hole, wherein the supporters contact a top surface of the first semiconductor chip, and the interposer is electrically connected to the package substrate through connection terminals. The semiconductor package further include a second semiconductor chip mounted on the interposer, and a molding layer disposed on the package substrate to cover the first semiconductor chip, the interposer, and the second semiconductor chip.
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