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    Method for providing user interface and electronic device therefor
    3.
    发明授权
    Method for providing user interface and electronic device therefor 有权

    公开(公告)号：US11586342B2

    公开(公告)日：2023-02-21

    申请号：US17156262

    申请日：2021-01-22

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Jongho Kim ,  Minjung Sohn ,  Seolhye Won ,  Hoon Yoon ,  Kangmin Lee ,  Sangwoong Hwang

    IPC: G06F3/04842 ,  H04L67/306 ,  H04W88/02 ,  G06Q10/10 ,  H04L67/50 ,  G06Q10/101

    Abstract: An electronic device is disclosed. The electronic device includes a display, a communication circuit, a memory, and a processor. The processor may be configured to obtain a user input for communication with a first external electronic device and output a first user interface for the communication with the first external electronic device on the display, based on the user input. The processor is also configured to obtain permission information for accessing a second external electronic device associated with an account of the first external electronic device, during the communication with the first external electronic device, and display a second user interface for accessing the second external electronic device on a partial region of the first user interface based on the permission information.

    WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME
    6.
    发明公开
    WAFER-LEVEL MULTI-DEVICE TESTER AND SYSTEM INCLUDING THE SAME 审中-公开

    公开(公告)号：US20240085478A1

    公开(公告)日：2024-03-14

    申请号：US18299265

    申请日：2023-04-12

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Seongkwan Lee ,  Hyungsun Ryu ,  Kangmin Lee ,  Jaemoo Choi

    IPC: G01R31/319 ,  G01R31/28

    CPC classification number: G01R31/31926 ,  G01R31/2844

    Abstract: A tester, which is adapted to test a device under test (DUT), includes a first plurality of signal analysis circuits configured to analyze signals generated by a plurality of DUTs, and a second plurality of signal processing units configured to process the signals analyzed by the first plurality of signal analysis circuits. A switch array is provided, which is electrically coupled between the first plurality of signal analysis circuits and the second plurality of signal processing units. The switch array is configured to electrically connect selected ones of the first plurality of signal analysis circuits with corresponding ones of the second plurality of signal processing units. The number of signal processing units within the second plurality may be less than a maximum number of DUTs that can be connected to the first plurality of signal analysis circuits when the tester is testing a plurality of the DUTs.

    SYSTEM AND METHOD FOR CONTROLLING AN ELECTRONIC DEVICE
    10.
    发明申请
    SYSTEM AND METHOD FOR CONTROLLING AN ELECTRONIC DEVICE 审中-公开
    用于控制电子设备的系统和方法

    公开(公告)号：US20130110261A1

    公开(公告)日：2013-05-02

    申请号：US13661828

    申请日：2012-10-26

    Applicant: Samsung Electronics Co., Ltd.

    Inventor： Kangmin Lee ,  Hyungrae Cho ,  Jihyeon Kweon ,  Seokmin Oh

    IPC: G05B11/01

    CPC classification number: H04L12/2818 ,  H04L12/2814 ,  H04L67/34

    Abstract: A system and method for controlling an electronic device based on a state of the electronic device and external information. A system includes an electronic device for providing a search word; a server for providing operation information for operating the electronic device based on the search word; and a managing device for acquiring the operation information corresponding to the search word, and controlling the electronic device based on the acquired operation information.

    Abstract translation: 一种用于基于电子设备的状态和外部信息来控制电子设备的系统和方法。 一种系统包括用于提供搜索词的电子设备; 用于提供基于搜索词操作电子设备的操作信息的服务器; 以及管理装置，用于获取与搜索词相对应的操作信息，并且基于获取的操作信息来控制电子设备。

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