System on chip for performing scan test and method of designing the same

    公开(公告)号:US11940494B2

    公开(公告)日:2024-03-26

    申请号:US17859870

    申请日:2022-07-07

    Abstract: A system on chip includes a one-time programmable (OTP) memory configured to store secure data, an OTP controller including at least one shadow register configured to read the secure data from the OTP memory and to store the secure data, a power management unit configured to receive an operation mode signal from an external device and to output test mode information indicating whether an operation mode is a test mode according to the operation mode signal and a test valid signal corresponding to the secure data, and a test circuit configured to receive the test mode information from the power management unit, to receive test data from the external device, and to output a scan mode signal and a test mode signal according to the test data and a test deactivation signal, wherein the test deactivation signal corresponds to development state data indicating a chip development state in the secure data.

    INTEGRATED CIRCUIT AND OPERATING METHOD THEREOF

    公开(公告)号:US20220269306A1

    公开(公告)日:2022-08-25

    申请号:US17559255

    申请日:2021-12-22

    Abstract: Provided is an integrated circuit. The integrated circuit includes a plurality of clock generators configured to respectively generate a plurality of clock signals, a plurality of logic circuits configured to operate in synchronization with the plurality of clock signals, and controller circuitry configured to identify meta-stability information based on frequencies of the plurality of clock signals, and configured to control at least one clock generator so that at least one of the plurality of clock signals is randomly delayed in response to the meta-stability information.

    Semiconductor device including secure patchable ROM and patch method thereof

    公开(公告)号:US11270003B2

    公开(公告)日:2022-03-08

    申请号:US16858963

    申请日:2020-04-27

    Abstract: A method for patching a patchable function programmed in a read only memory (ROM) of a semiconductor device by using firmware loaded onto a first memory includes receiving an encrypted and digitally signed firmware image; generating a verification result by verifying the firmware image by using a public key; decrypting the firmware image by using a secret key depending on the verification result; loading firmware decrypted from the firmware image onto the first memory; and running a replacement function corresponding to an identifier of the patchable function included in the firmware, when the patchable function is called.

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