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公开(公告)号:US10818727B2
公开(公告)日:2020-10-27
申请号:US16161370
申请日:2018-10-16
Applicant: Samsung Electronics Co., Ltd.
Inventor: Myoungsu Son , Seung Pil Ko , Jung Hyuk Lee , Shinhee Han , Gwan-Hyeob Koh , Yoonjong Song
IPC: H01L27/22 , H01L43/02 , H01L43/12 , H01L43/08 , H01L23/522
Abstract: A semiconductor device includes a gate structure on a substrate, source and drain contacts respectively on opposite sides of the gate structure and connected to the substrate, a magnetic tunnel junction connected to the drain contact, a first conductive line connected to the source contact, and a second conductive line connected to the first conductive line through a first via contact. The second conductive line is distal to the substrate in relation to the first conductive line. The first and second conductive lines extend in parallel along a first direction. The first and second conductive lines have widths in a second direction intersecting the first direction. The widths of the first and second conductive lines are the same. The first via contact is aligned with the source contact along a third direction perpendicular to a top surface of the substrate.
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公开(公告)号:US11271038B2
公开(公告)日:2022-03-08
申请号:US17027980
申请日:2020-09-22
Applicant: Samsung Electronics Co., Ltd.
Inventor: Myoungsu Son , Seung Pil Ko , Jung Hyuk Lee , Shinhee Han , Gwan-Hyeob Koh , Yoonjong Song
IPC: H01L27/22 , H01L43/02 , H01L43/12 , H01L43/08 , H01L23/522
Abstract: A semiconductor device includes a gate structure on a substrate, source and drain contacts respectively on opposite sides of the gate structure and connected to the substrate, a magnetic tunnel junction connected to the drain contact, a first conductive line connected to the source contact, and a second conductive line connected to the first conductive line through a first via contact. The second conductive line is distal to the substrate in relation to the first conductive line. The first and second conductive lines extend in parallel along a first direction. The first and second conductive lines have widths in a second direction intersecting the first direction. The widths of the first and second conductive lines are the same. The first via contact is aligned with the source contact along a third direction perpendicular to a top surface of the substrate.
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