公开(公告)号：US12032019B2

公开(公告)日：2024-07-09

申请号：US17582385

申请日：2022-01-24

Applicant: Samsung Electronics Co., Ltd.

Inventor： Yongjeong Kim ,  Jongjin An ,  Seonggwon Jang ,  Pilho Lee ,  Inhoon Jang

IPC: G01R31/3177 ,  G01R31/28 ,  G01R31/30 ,  G01R31/317 ,  G01R31/319 ,  H01L21/66 ,  H03K3/017 ,  H03K19/21 ,  H03L7/099

CPC classification number: G01R31/3177 ,  G01R31/2834 ,  G01R31/3004 ,  G01R31/31727 ,  G01R31/31924 ,  H03K3/017 ,  H03K19/21 ,  H03L7/099 ,  H01L22/34 ,  H01L2924/00 ,  H01L2924/0002

Abstract: Provided are a clock conversion device, a test system including the same, and a method of operating the test system. The clock conversion device includes a first clock generator configured to receive a first input clock signal from test logic and generate a first clock signal of which a frequency is multiplied and a phase is locked; a clock conversion circuit configured to receive the first clock signal and generate one or more second clock signals by converting at least one clock characteristic of the first clock signal; and an output selector configured to output any one of the first clock signal and the one or more second clock signals as an output clock signal, wherein the clock conversion device is configured to provide the output clock signal to a device under test (DUT).