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公开(公告)号:US20240282829A1
公开(公告)日:2024-08-22
申请号:US18500797
申请日:2023-11-02
Applicant: Samsung Electronics Co., Ltd.
Inventor: Young Woo Kim , Kyoung Woo Lee , Min Chan Gwak , Guk Hee Kim , Sang Cheol Na , Anthony Dongick Lee
IPC: H01L29/417 , H01L23/48 , H01L29/06 , H01L29/423 , H01L29/775 , H01L29/786
CPC classification number: H01L29/41733 , H01L23/481 , H01L29/0673 , H01L29/42392 , H01L29/775 , H01L29/78696
Abstract: A semiconductor device includes a substrate that has first and second surfaces opposite to each other in a first direction, a first fin-type pattern that protrudes in the first direction from the first surface of the substrate and extends in a second direction, a first source/drain pattern on the first fin-type pattern, a first source/drain contact on the first source/drain pattern, a contact connection via that extends in the first direction and is electrically connected to the first source/drain contact, a buried conductive pattern that is in the substrate, is electrically connected to the contact connection via, and has first and second surfaces opposite to each other in the first direction, the first surface of the buried conductive pattern facing the first source/drain contact, and first buried insulating liners that extend along sidewalls and along the first surface of the buried conductive pattern.
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公开(公告)号:US20240304513A1
公开(公告)日:2024-09-12
申请号:US18397389
申请日:2023-12-27
Applicant: Samsung Electronics Co., Ltd.
Inventor: Anthony Dongick Lee , Min Chan Gwak , Guk Hee Kim , Young Woo Kim , Sang Cheol Na , Kyoung Woo Lee
IPC: H01L23/367 , H01L21/683 , H01L23/528 , H01L29/06 , H01L29/417 , H01L29/423 , H01L29/775
CPC classification number: H01L23/3672 , H01L21/6835 , H01L23/5286 , H01L29/0673 , H01L29/41733 , H01L29/42392 , H01L29/775 , H01L2221/68309
Abstract: A semiconductor device includes an active pattern on a first surface of a substrate and extending in a first direction, a field insulating film on the first surface and a side surface of the active pattern, a gate structure on the active pattern and field insulating film and extending in a second direction intersecting the first direction, a source/drain area on a side surface of the gate structure and contacting the active pattern, and a through-contact extending in a third direction perpendicular to the first and second directions and extending through the field insulating film. The device further includes a buried pattern in the substrate contacting the through-contact, a backside wiring structure on a second surface of the substrate and electrically connected to the buried pattern, and a heat-dissipating structure in the substrate adjacent to the buried pattern. The heat-dissipating structure fills a trench extending from the second surface into the substrate.
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