公开(公告)号：US11181571B2

公开(公告)日：2021-11-23

申请号：US16414077

申请日：2019-05-16

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dong-Uk Ryu ,  Seongbeom Kim ,  Janghyuk An

IPC: G01R31/26 ,  G01R31/27 ,  G01R19/165 ,  B60R16/023

Abstract: An electronic device including a processor and a sensor may be provided. The processor obtains a first degree of degradation of a first core based on a first parameter value associated with a lifetime of the first core and a first operating level associated with an operation of the first core. The processor obtains a second degree of degradation of a second core based on a second parameter value associated with a lifetime of the second core and a second operating level associated with an operation of the second core. The processor schedules a task of the first core and the second core based on the first degree of degradation and the second degree of degradation. The sensor provides the first parameter value and the first operating level to the first core and the second parameter value and the second operating level to the second core.

公开(公告)号：US12019520B2

公开(公告)日：2024-06-25

申请号：US17991189

申请日：2022-11-21

Applicant: Samsung Electronics Co., Ltd.

Inventor： Jaehyung Ahn ,  Seongbeom Kim ,  Byungwoo Bang ,  Uiseok Song ,  Junyeon Lee ,  Wooseok Chang ,  Hun Seong Choi

IPC: G06F11/00 ,  G06F11/14

CPC classification number: G06F11/1438 ,  G06F11/1448

Abstract: An electronic device and method with on-demand accelerator checkpointing are provided. In one general aspect, an electronic device includes a host processor, and an accelerator configured to operate according to instructions transmitted by the host processor to the accelerator, wherein, a memory of the host processor and a memory of the accelerator are respectively checkpointed to a storage at respective different intervals, and in response to a determination that a failure has occurred in the host processor, the memory of the accelerator is checkpointed to the storage.

公开(公告)号：US11946967B2

公开(公告)日：2024-04-02

申请号：US17491812

申请日：2021-10-01

Applicant: Samsung Electronics Co., Ltd.

Inventor： Dong-Uk Ryu ,  Seongbeom Kim ,  Janghyuk An

IPC: G01R31/26 ,  B60R16/023 ,  G01R19/165 ,  G01R31/27

CPC classification number: G01R31/2642 ,  B60R16/023 ,  G01R19/16576 ,  G01R31/27

Abstract: An electronic device including a processor and a sensor may be provided. The processor obtains a first degree of degradation of a first core based on a first parameter value associated with a lifetime of the first core and a first operating level associated with an operation of the first core. The processor obtains a second degree of degradation of a second core based on a second parameter value associated with a lifetime of the second core and a second operating level associated with an operation of the second core. The processor schedules a task of the first core and the second core based on the first degree of degradation and the second degree of degradation. The sensor provides the first parameter value and the first operating level to the first core and the second parameter value and the second operating level to the second core.

公开(公告)号：US12056004B2

公开(公告)日：2024-08-06

申请号：US17881793

申请日：2022-08-05

Applicant: Samsung Electronics Co., Ltd.

Inventor： Byungwoo Bang ,  Seongbeom Kim ,  Uiseok Song ,  Jaehyung Ahn ,  Junyeon Lee ,  Wooseok Chang

IPC: G06F11/00 ,  G06F1/30 ,  G06F11/07

CPC classification number: G06F11/0793 ,  G06F1/30 ,  G06F11/0796

Abstract: A method and apparatus with cosmic ray fault protection is included. A method includes obtaining cosmic ray information indicating at least one cosmic ray event, determining a soft error mitigation policy based on the cosmic ray information, accessing the soft error mitigation policy by a device, and based on the soft error mitigation policy, performing, by the device, a mitigation action that mitigates for soft errors related to the cosmic ray event.