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公开(公告)号：US12056004B2
公开(公告)日：2024-08-06
申请号：US17881793
申请日：2022-08-05
Applicant: Samsung Electronics Co., Ltd.
Inventor： Byungwoo Bang , Seongbeom Kim , Uiseok Song , Jaehyung Ahn , Junyeon Lee , Wooseok Chang
CPC classification number: G06F11/0793 , G06F1/30 , G06F11/0796
Abstract: A method and apparatus with cosmic ray fault protection is included. A method includes obtaining cosmic ray information indicating at least one cosmic ray event, determining a soft error mitigation policy based on the cosmic ray information, accessing the soft error mitigation policy by a device, and based on the soft error mitigation policy, performing, by the device, a mitigation action that mitigates for soft errors related to the cosmic ray event.
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公开(公告)号：US12086599B2
公开(公告)日：2024-09-10
申请号：US17717302
申请日：2022-04-11
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jaehyung Ahn , Wooseok Chang , Yongha Park
CPC classification number: G06F9/3838 , G06F9/3877 , G06F9/4881 , G06F13/12 , G06N3/08 , G06F2213/0026
Abstract: A method of operating an accelerator includes receiving, from a central processing unit (CPU), commands for the accelerator and a peripheral device of the accelerator, processing the received commands according to a subject of performance of each of the commands, and transmitting a completion message indicating that performance of the commands is completed to the CPU after the performance of the commands is completed.
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公开(公告)号：US12019520B2
公开(公告)日：2024-06-25
申请号：US17991189
申请日：2022-11-21
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jaehyung Ahn , Seongbeom Kim , Byungwoo Bang , Uiseok Song , Junyeon Lee , Wooseok Chang , Hun Seong Choi
CPC classification number: G06F11/1438 , G06F11/1448
Abstract: An electronic device and method with on-demand accelerator checkpointing are provided. In one general aspect, an electronic device includes a host processor, and an accelerator configured to operate according to instructions transmitted by the host processor to the accelerator, wherein, a memory of the host processor and a memory of the accelerator are respectively checkpointed to a storage at respective different intervals, and in response to a determination that a failure has occurred in the host processor, the memory of the accelerator is checkpointed to the storage.
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Patent Agency Ranking
公开(公告)号：US10269111B2
公开(公告)日：2019-04-23
申请号：US15597262
申请日：2017-05-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Joonseo Song , Sung Yoon Ryu , Wahseng Yap , Yunjung Jee , Yusin Yang , Chungsam Jun , Yoo Jin Jeoung , Jaehyung Ahn , Janghee Lee
IPC: G06T7/00
Abstract: A method of inspecting a semiconductor wafer is provided, the method includes scanning a plurality of inspection swaths on a wafer to obtain a plurality of image sets and producing a plurality of reference images from the plurality of image sets, respectively. The method of inspecting a semiconductor wafer further includes selecting a plurality of target images from the plurality of image sets, respectively. The method of inspecting a semiconductor wafer additionally includes comparing each reference image of the plurality of reference images with each target image of the plurality of target images to detect a defect image from each of the plurality of target images. A reference image being compared and a target image being compared are images scanned from the same inspection swath.
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公开(公告)号：US20180053292A1
公开(公告)日：2018-02-22
申请号：US15597262
申请日：2017-05-17
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Joonseo Song , Sung Yoon Ryu , Wahseng Yap , Yunjung Jee , Yusin Yang , Chungsam Jun , Yoo Jin Jeoung , Jaehyung Ahn , Janghee Lee
IPC: G06T7/00
CPC classification number: G06T7/001 , G06T2207/30148
Abstract: A method of inspecting a semiconductor wafer is provided, the method includes scanning a plurality of inspection swaths on a wafer to obtain a plurality of image sets and producing a plurality of reference images from the plurality of image sets, respectively. The method of inspecting a semiconductor wafer further includes selecting a plurality of target images from the plurality of image sets, respectively. The method of inspecting a semiconductor wafer additionally includes comparing each reference image of the plurality of reference images with each target image of the plurality of target images to detect a defect image from each of the plurality of target images. A reference image being compared and a target image being compared are images scanned from the same inspection swath.
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公开(公告)号：US12014215B2
公开(公告)日：2024-06-18
申请号：US17327600
申请日：2021-05-21
Applicant: SAMSUNG ELECTRONICS CO., LTD.
Inventor： Jieun Lee , Jin-Hong Kim , Jaehyung Ahn , Sungduk Cho
CPC classification number: G06F9/5038 , G06F9/3877 , G06F9/505 , G06F9/542
Abstract: An active scheduling method performed with a master processor and a plurality of slave processors. The method includes determining whether a job to be performed has a dependency by referencing a job queue; in a case in which it is determined that the job to be performed has a dependency, updating a state of the job to be performed in a table in which information of each of a plurality of jobs is recorded; analyzing a state of a job preceding the job to be performed based on the table; and in a case in which the job preceding the job to be performed is determined to have been completed, performing the job to be performed by retrieving the job to be performed from the job queue.
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公开(公告)号：US12014202B2
公开(公告)日：2024-06-18
申请号：US17119197
申请日：2020-12-11
Inventor： Jaehyung Ahn , Minsoo Rhu , Yujeong Choi
CPC classification number: G06F9/461 , G06F9/485 , G06F15/161 , G06N3/04 , G06N3/08
Abstract: A method of operating the accelerator includes receiving a request for preemption during an execution of a first task using one or more processing elements included in the accelerator, in response to the request for preemption, moving context information of the first task stored in an internal memory of the accelerator to an external memory of the accelerator, and executing a second task associated with the request for preemption using the processing elements.
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公开(公告)号：US20230281081A1
公开(公告)日：2023-09-07
申请号：US17991189
申请日：2022-11-21
Applicant: Samsung Electronics Co., Ltd.
Inventor： Jaehyung Ahn , SEONGBEOM KIM , BYUNGWOO BANG , UISEOK SONG , JUNYEON LEE , WOOSEOK CHANG , HUN SEONG CHOI
IPC: G06F11/14
CPC classification number: G06F11/1438 , G06F11/1448
Abstract: An electronic device and method with on-demand accelerator checkpointing are provided. In one general aspect, an electronic device includes a host processor, and an accelerator configured to operate according to instructions transmitted by the host processor to the accelerator, wherein, a memory of the host processor and a memory of the accelerator are respectively checkpointed to a storage at respective different intervals, and in response to a determination that a failure has occurred in the host processor, the memory of the accelerator is checkpointed to the storage.
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