INTEGRATED CIRCUITS INCLUDING STANDARD CELLS AND METHODS OF MANUFACTURING THE INTEGRATED CIRCUITS

    公开(公告)号:US20200050728A1

    公开(公告)日:2020-02-13

    申请号:US16378751

    申请日:2019-04-09

    Abstract: An integrated circuit may include a first standard cell including first and second active regions extending in a first horizontal direction and a first gate line extending in a second horizontal direction orthogonal to the first horizontal direction; and a second standard cell including third and fourth active regions extending in the first horizontal direction and a second gate line aligned in parallel to the first gate in the second horizontal direction and being adjacent to the first standard cell. A distance between the second active region of the first standard cell and the third active region of the second standard cell may be greater than a distance between the first and second active regions of the first standard cell, and may be greater than a distance between the third and fourth active regions of the second standard cell.

    Scan flip-flop and scan test circuit including the same

    公开(公告)号:US11287474B2

    公开(公告)日:2022-03-29

    申请号:US16552109

    申请日:2019-08-27

    Abstract: A scan flip-flop includes an input unit and a flip-flop. The input unit is configured to select one signal from among a data input signal and a scan input signal to supply the selected one signal as an internal signal according to an operation mode. The flip-flop is configured to latch the internal signal according to a clock signal. The flip-flop includes a cross coupled structure that includes first and second tri-state inverters which share a first output node and face each other.

    Integrated circuits including standard cells and methods of manufacturing the integrated circuits

    公开(公告)号:US10990740B2

    公开(公告)日:2021-04-27

    申请号:US16378751

    申请日:2019-04-09

    Abstract: An integrated circuit may include a first standard cell including first and second active regions extending in a first horizontal direction and a first gate line extending in a second horizontal direction orthogonal to the first horizontal direction; and a second standard cell including third and fourth active regions extending in the first horizontal direction and a second gate line aligned in parallel to the first gate in the second horizontal direction and being adjacent to the first standard cell. A distance between the second active region of the first standard cell and the third active region of the second standard cell may be greater than a distance between the first and second active regions of the first standard cell, and may be greater than a distance between the third and fourth active regions of the second standard cell.

    Integrated circuit and method of designing integrated circuit

    公开(公告)号:US10216883B2

    公开(公告)日:2019-02-26

    申请号:US15351545

    申请日:2016-11-15

    Abstract: A computer-implemented method of designing an integrated circuit (IC) includes allocating a plurality of colors to a plurality of patterns corresponding to one layer of a first cell so that a multi-patterning technology is designated for use in forming the plurality of patterns, the first cell being a multi-height cell corresponding to a plurality of rows, generating a plurality of shift cells, in which a color remapping operation associated with the plurality of patterns is performed for each row, with respect to the first cell, and storing a cell set including the first cell and the plurality of shift cells in a standard cell library.

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