公开(公告)号：US20240127425A1

公开(公告)日：2024-04-18

申请号：US18195190

申请日：2023-05-09

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Sungwook HWANG ,  Tae Soo SHIN ,  Seulgi OK ,  Kibum LEE

IPC: G06T7/00 ,  G01N23/2251 ,  G06T7/70

CPC classification number: G06T7/001 ,  G01N23/2251 ,  G06T7/70 ,  G01N2223/418 ,  G01N2223/6116 ,  G06T2207/10061 ,  G06T2207/20084 ,  G06T2207/20132 ,  G06T2207/30148

Abstract: A defect detection device includes: a memory configured to store a layout image indicating a circuit pattern and indicating a dummy pattern; and a controller comprising an artificial neural network configured to learn the layout image, the controller being configured to: determine, based on an inspection image obtained by photographing an area including a defect on a wafer, whether the defect is in a first area in which the circuit pattern is positioned or in a second area in which the dummy pattern is positioned, by using the artificial neural network, and determine a type of the defect based on whether the defect is positioned is in the first area or in the second area.

公开(公告)号：US20240061345A1

公开(公告)日：2024-02-22

申请号：US18207510

申请日：2023-06-08

Applicant: SAMSUNG ELECTRONICS CO., LTD.

Inventor： Kibum LEE ,  Taesoo SHIN ,  Seulgi OK ,  Sungwook HWANG

IPC: G03F7/20

CPC classification number: G03F7/7065

Abstract: A method of detecting defects of a wafer including generating a composite wafer map comprising defect points by combining a plurality of wafer level maps generated by measuring the wafer according to the respective process operations; sorting the defect points according to defect clusters using positions of the defect points included in the composite wafer map; and detecting an initial process operation, from among the respective process operations, in which a defect occurred, using operation information, for each of the defect clusters.

公开(公告)号：US20130154877A1

公开(公告)日：2013-06-20

申请号：US13713884

申请日：2012-12-13

Applicant: Samsung Electronics Co., Ltd.

Inventor： Sungwook HWANG

IPC: G01S19/39

CPC classification number: G01S19/39 ,  H04W56/0025 ,  H04W56/006

Abstract: A method for acquiring and maintaining Global Positioning System (GPS) synchronization is provided for use in the wireless communication system. The method includes receiving, by at least one Global Positioning System (GPS) receiver, GPS absolute time information and GPS information from at least one GPS satellite; transmitting, from the at least one GPS receiver, to a base station, reference time information generated based on the GPS absolute time information; and generating, by the base station, base station absolute time information based on the reference time information.

Abstract translation: 提供了一种用于获取和维护全球定位系统（GPS）同步的方法，用于无线通信系统。 该方法包括由至少一个全球定位系统（GPS）接收器接收来自至少一个GPS卫星的GPS绝对​​时间信息和GPS信息; 从所述至少一个GPS接收机向基站发送基于所述GPS绝对​​时间信息生成的参考时间信息; 以及基站基于参考时间信息生成基站绝对时间信息。