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公开(公告)号:US20240055406A1
公开(公告)日:2024-02-15
申请号:US18364802
申请日:2023-08-03
发明人: Yeongseon Kim , Dohyun Kim , Juhyeon Kim , Hyoeun Kim , Seonkyung Seo , Chajea Jo
IPC分类号: H01L25/065 , H01L25/10 , H01L23/31 , H01L23/00
CPC分类号: H01L25/0657 , H01L25/105 , H01L23/3107 , H01L24/03 , H01L24/05 , H01L24/08 , H01L24/80 , H01L2225/06541 , H01L2225/06565 , H01L2224/0384 , H01L2224/039 , H01L2224/05014 , H01L2224/05015 , H01L2224/05541 , H01L2224/05554 , H01L2224/05555 , H01L2224/08121 , H01L2224/08148 , H01L2224/08235 , H01L2224/80203 , H01L2224/80895 , H01L2224/80896 , H01L2924/1431 , H01L2924/1434 , H01L2924/38
摘要: A semiconductor package includes a first semiconductor chip including a first semiconductor device, a second semiconductor chip including a second semiconductor device, and a bonding structure between the first and second semiconductor chips, the bonding structure including a first bonding pad, a first bonding insulating layer, a second bonding pad in contact with the first bonding pad, and a second bonding insulating layer in contact with the first bonding insulating layer. The first bonding pad may include a first pad metal layer and a first conductive barrier layer surrounding the first pad metal layer, and the first conductive barrier layer may include a horizontal extension portion extending on an edge of an upper surface of the first pad metal layer.