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公开(公告)号:US20180102347A1
公开(公告)日:2018-04-12
申请号:US15840314
申请日:2017-12-13
Applicant: Samsung Electronics Co., Ltd.
Inventor: Young-seop SHIM , Jaehong Kim
IPC: H01L25/065
CPC classification number: H01L25/0657 , G11C5/04 , G11C16/0466 , G11C16/0483 , G11C16/10 , G11C16/30 , G11C29/021 , H01L23/49838 , H01L23/528 , H01L24/48 , H01L2224/48091 , H01L2224/48106 , H01L2224/48147 , H01L2224/48227 , H01L2225/06506 , H01L2225/0651 , H01L2225/06562 , H01L2225/06586 , H01L2924/1438 , H01L2924/15311
Abstract: Disclosed is a data storage device including a controller and a multi-stack chip package, and a method of operating a data storage device. The multi-stack chip package includes a first semiconductor chip arranged on a package substrate, a second semiconductor chip arranged on the first semiconductor chip, and a third semiconductor chip is arranged between the first and second semiconductor chips. The controller can control the first to third semiconductor chips by using a feature parameter measured from each semiconductor chip and a target value that may be originally designed by a memory vendor.
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公开(公告)号:US20170330860A1
公开(公告)日:2017-11-16
申请号:US15443963
申请日:2017-02-27
Applicant: Samsung Electronics Co., Ltd.
Inventor: Young-seop SHIM , JAEHONG KIM
IPC: H01L25/065 , G11C16/08 , G11C16/10 , H01L23/498 , H01L23/528 , G11C16/04 , G11C16/30 , H01L23/00
CPC classification number: H01L25/0657 , G11C5/04 , G11C16/0466 , G11C16/0483 , G11C16/10 , G11C16/30 , G11C29/021 , H01L23/49838 , H01L23/528 , H01L24/48 , H01L2224/48091 , H01L2224/48106 , H01L2224/48147 , H01L2224/48227 , H01L2225/06506 , H01L2225/0651 , H01L2225/06562 , H01L2225/06586 , H01L2924/1438 , H01L2924/15311
Abstract: Disclosed is a data storage device including a controller and a multi-stack chip package, and a method of operating a data storage device. The multi-stack chip package includes a first semiconductor chip arranged on a package substrate, a second semiconductor chip arranged on the first semiconductor chip, and a third semiconductor chip is arranged between the first and second semiconductor chips. The controller can control the first to third semiconductor chips by using a feature parameter measured from each semiconductor chip and a target value that may be originally designed by a memory vendor.
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