公开(公告)号：US20190384962A1

公开(公告)日：2019-12-19

申请号：US16338668

申请日：2017-10-26

Applicant: SCOPIO LABS LTD.

Inventor： Itai HAYUT ,  Erez NA'AMAN ,  Eran SMALL ,  Chen BRESTEL

IPC: G06K9/00 ,  G06T3/40 ,  G06T7/00 ,  G02B21/36 ,  G01N15/14

Abstract: Methods and systems are provided for improved imaging and analyzing of a sample with a large field-of-view at a high image resolution. A diagnostic system may comprise: a microscope comprising a low collection numerical aperture (NA); an imaging device coupled to the microscope; and a processor coupled to the imaging device. The imaging device may be configured to capture a plurality of low-resolution images of a region of a sample viewed by the microscope. The region of the sample may comprise cells. The processor may comprise instructions configured to reconstruct a high-resolution image of the region of the sample using the plurality of low-resolution images. The processor may further comprise instructions configured to analyze a spatial field of the high-resolution image to identify at least one of a cell type or a cell structure of at least one of the cells of the region of the sample.

公开(公告)号：US20180329194A1

公开(公告)日：2018-11-15

申请号：US15775370

申请日：2016-11-10

Applicant: Scopio Labs Ltd.

Inventor： Eran SMALL ,  Ittay MADAR ,  Chen BRESTEL ,  Erez NAAMAN

IPC: G02B21/24 ,  G02B21/06 ,  G02B21/36 ,  G02B21/02 ,  G02B7/36 ,  G02B7/09

Abstract: Systems and methods are disclosed for focusing a microscope using images acquired under multiple illumination conditions. In one implementation, an autofocus microscope may include an image capture device, a focus actuator, an illumination assembly, and a controller. The controller may cause the illumination assembly to illuminate a sample at a first illumination condition and at a second illumination condition. The controller may acquire a first image of the sample illuminated from the first illumination angle and a second image of the sample illuminated from the second illumination angle. The controller may further determine an amount of shift between image features present in the first image of the sample and a corresponding image features present in the second image of the sample, If the amount of determined shift is non-zero, the focus actuator may change the distance between the sample and the focal plane.