公开(公告)号：US09875154B2

公开(公告)日：2018-01-23

申请号：US14789168

申请日：2015-07-01

Applicant: Seiko Instruments Inc.

Inventor： Masanori Miyagi ,  Taro Yamasaki

IPC: G06F11/10 ,  G11C29/42 ,  G11C29/36 ,  G11C29/52

CPC classification number: G06F11/1068 ,  G06F11/1048 ,  G11C29/36 ,  G11C29/42 ,  G11C29/52

Abstract: Provided is a non-volatile semiconductor storage device which can be downsized with a simple circuit without impairing the function of an error correcting section, and a method of testing the non-volatile semiconductor storage device. An error correction circuit is configured to perform error detection and correction of merely the same number of bits as data bits, and a circuit for performing error detection and correction of check bits is omitted to downsize the circuit. A multiplexer for, in a testing state, replacing a part of the data bits read out from a storage element array with the check bits, and inputting the check bits to the error correction circuit is provided. Thus, error detection and correction of the check bits are performed to enable shipment inspection concerning the check bits as well.