摘要:
In a load testing system, a transmission device measures a bandwidth of user data transmitted from a user terminal in real time, calculates a calculation bandwidth by subtracting the bandwidth of the user data from an evaluation bandwidth preset to evaluate the performance of a network, and transmits test data corresponding to the calculation bandwidth with the user data corresponding to the bandwidth of the user data. A reception device receives the user data and the test data transmitted with the user data, and evaluates the performance of the network based on the user data and test data.
摘要:
A testing apparatus for testing a packet switch includes one of a test packet transmitting part and a test packet receiving part or both. The test packet transmitting part includes a test packet generating part generating a test packet, and a transmit control part that controls the test packet generating part in accordance with a timing defined by a format of packet. The test packet receiving part includes a test packet checking part for checking the address and test data contained in the test packet, and a receive control part for controlling the test packet checking part in accordance with the timing defined by the format of packet.
摘要:
A network has communication apparatuses communicatively interconnected in compliance with a maintenance protocol. An LBM frame transmission unit transmits an LBM frame to the network. An MEP information acquisition unit identifies a communication apparatus having transmitted an LBR frame as an MEP when the LBR frame is received, and acquires MEP information from the LBR frame. An LTM frame transmission unit transmits an LTM frame to the MEP identified by the MEP information acquisition unit. An MIP information acquisition unit identifies a communication apparatus as an MIP from an LTR frame when the LTR frame is received as a response to the LTM frame, and acquires MIP information indicating information about the MIP. A topology information generation unit generates topology information representing a configuration of the network from the MEP information acquired by the MEP information acquisition unit and the MIP information acquired by the MIP information acquisition unit.
摘要:
According to an aspect of an embodiment, an apparatus is transmitting/receiving an OAM frame containing kinds of tests indicating one or more tests for Ethernet-OAM to/from a relay apparatus, storing configuration information to generate a network configuration needed for each of the plurality of tests in a pseudo manner, distinguishing the kind of test contained in the relevant OAM frame and obtaining network information of a network to which the relay apparatus that transmitted the OAM frame belongs and obtaining configuration information corresponding to the obtained network information obtained from the stored configuration information.
摘要:
According to an aspect of an embodiment, an apparatus is transmitting/receiving an OAM frame containing kinds of tests indicating one or more tests for Ethernet-OAM to/from a relay apparatus, storing configuration information to generate a network configuration needed for each of the plurality of tests in a pseudo manner, distinguishing the kind of test contained in the relevant OAM frame and obtaining network information of a network to which the relay apparatus that transmitted the OAM frame belongs and obtaining configuration information corresponding to the obtained network information obtained from the stored configuration information.
摘要:
According to an aspect of an embodiment, an apparatus is transmitting/receiving an OAM frame containing kinds of tests indicating one or more tests for Ethernet-OAM to/from a relay apparatus, storing configuration information to generate a network configuration needed for each of the plurality of tests in a pseudo manner, distinguishing the kind of test contained in the relevant OAM frame and obtaining network information of a network to which the relay apparatus that transmitted the OAM frame belongs and obtaining configuration information corresponding to the obtained network information obtained from the stored configuration information.
摘要:
An abnormal traffic eliminating apparatus eliminates an abnormal traffic that is generated in a network through which frames including a MAC header part, an IP header part and an IP datagram part are transmitted. The apparatus is provided with a write part for writing an FCS field of an MAC frame that is received by a plurality of ports to a search engine part, and a loop monitoring and detecting part counting a number of received MAC frames having identical FCS values and judging that the network is in a loop state if the number of received MAC frames having the identical FCS values and received within a predetermined time exceeds a preset threshold value.
摘要:
In a testing apparatus for an optical access network, a converting unit converts an optical signal received through the optical access network into an electrical signal to create 10b coded data. A protocol processing unit performs a processing according to a protocol of the optical access network on the 10b coded data, and records a plurality of different protocol processing data corresponding to protocol information assigned to a plurality of ONUs. A memory unit stores the 10b coded data output from the converting unit. A CPU analyzes the 10b coded data in the memory unit.
摘要:
A semiconductor device (18) includes: a gate electrode (102) formed on a substrate (101); a semiconductor layer (104) formed above the gate electrode (102) and including a source region, a drain region, and a channel region; a source electrode (106) connected to the source region above the semiconductor layer (104); and a drain electrode (107) connected to the drain region above the semiconductor layer (104). The semiconductor layer (104) has, at a portion overlapping the drain electrode (107), a protrusion that protrudes outward along an extending direction of a drain line drawn out from the drain electrode (107). At an outside of the channel region sandwiched between the drain electrode (107) and the source electrode (106), the semiconductor layer (104) has an adjustment portion where an outer boundary of the semiconductor layer (104) is positioned more inward than an outer boundary of the gate electrode (102).
摘要:
The disclosed method for manufacturing an active matrix substrate includes a step in which a first mask is used to pattern a first conductive layer G, CS, and S, a step in which a second mask is used to pattern a first insulating layer, a step in which a third mask is used to pattern a semiconductor layer, a step in which a fourth mask is used to pattern a second conductive later, a step in which a fifth mask is used to pattern a second insulating layer, and a step in which a sixth mask is used to pattern a third conductive layer.