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公开(公告)号：US07046365B1
公开(公告)日：2006-05-16
申请号：US10343017
申请日：2000-07-27
IPC分类号： G01B9/02
摘要： A light pulse from an ultrashort pulse light source 11 is split by a beam splitter 12 and guided, to a detection medium 4, as an excitation pulse and probe pulse having respective predetermined linearly polarized states by an excitation optical system 2 and probe optical system 3, respectively. A light track region which is generated in the detection medium 4 by incidence of the excitation pulse, and in which the refractive index is changed by a nonlinear optical effect, is irradiated with the probe pulse. Of components which have passed through the detection medium 4, a probe pulse component whose polarized state has changed through the light track region is detected by a camera 53 via an analyzer 51 in a photodetection part 5. This realizes a light track observation apparatus capable of directly observing the light track of an excitation pulse.
摘要翻译： 来自超短脉冲光源11的光脉冲被分束器12分离，并通过激发光学系统2和探针光学系统3被引导到检测介质4作为具有各自的预定线偏振态的激励脉冲和探针脉冲 ， 分别。 用探测脉冲照射通过入射激励脉冲而在检测介质4中产生的光线区域，其中折射率由非线性光学效应改变。 已经通过检测介质4的部件中，通过光检测部分5中的分析器51，通过照相机53检测其偏振状态已经通过光轨区域改变的探针脉冲分量。 这实现了能够直接观察激励脉冲的光轨的光轨观察装置。
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公开(公告)号：US5237388A
公开(公告)日：1993-08-17
申请号：US762457
申请日：1991-09-19
申请人： Isuke Hirano , Hironori Takahashi , Tsuneyuki Urakami , Tamiki Takemori , Yutaka Tsuchiya , Shinichiro Aoshima
发明人： Isuke Hirano , Hironori Takahashi , Tsuneyuki Urakami , Tamiki Takemori , Yutaka Tsuchiya , Shinichiro Aoshima
CPC分类号： G01J4/04
摘要： Young's interferometer consisting of a single slit and a double slit member, and an analyzer are arranged along the axis of light to be measured. Parallel slits of the double slit member are provided with respective polarizers whose paralyzing directions are at .+-.45.degree. to the longitudinal direction of the parallel slits. The polarizing direction of the analyzer is set in parallel with the parallel slits. The incident light passes through Young's interferometer and the analyzer to form an interference fringe, which is detected by an image detector unit. An image analyzer unit produces an intensity profile of the interference fringe and determines the polarization state of the incident light, for instance, by comparing the produced intensity profile with conceivable profiles stored in advance.
摘要翻译： 由单个狭缝和双缝隙构件组成的杨氏干涉仪和分析器沿着待测量的光轴设置。 双缝构件的平行狭缝设置有各自的偏振器，其麻痹方向与平行狭缝的纵向方向成+/- 45度。 分析仪的偏振方向与平行狭缝平行设置。 入射光通过杨氏干涉仪和分析仪，形成一个由图像检测器单元检测的干涉条纹。 图像分析器单元产生干涉条纹的强度分布并且确定入射光的偏振状态，例如通过将产生的强度分布与预先存储的可想到的曲线进行比较。
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公开(公告)号：US5198921A
公开(公告)日：1993-03-30
申请号：US795397
申请日：1991-11-21
CPC分类号： G02B6/2713 , G02B6/105 , G02B6/126 , G02B6/276 , H01S3/06708 , H01S5/5036 , H01S3/06712
摘要： A semiconductor light amplifier is driven by a drive device, and selectively amplifies one of a TM mode component and a TE mode component of input light. For example, TE mode light is selectively amplified by making thickness of the active layer of the semiconductor light amplifier not more than 0.05 .mu.m, or by tilting at least one of the entrance and exit faces of the semiconductor light amplifier by 10 to 16 degrees. An another type of light amplifying polarizer, input signal light and excitation light are combined by a half mirror or an optical coupler, and combined light is input to a rare-earth-element doped, polarization maintaining optical fiber.
摘要翻译： 半导体光放大器由驱动装置驱动，并且选择性地放大输入光的TM模式分量和TE模式分量之一。 例如，通过使半导体光放大器的有源层的厚度不大于0.05μm，或者通过使半导体光放大器的入射面和出射面中的至少一个倾斜10〜16度来选择性地放大TE模式光 。 另一种类型的光放大偏振器，输入信号光和激发光通过半透半反镜或光耦合器组合，组合光输入到稀土元素掺杂的保偏光纤。
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4.发明授权Low noise pulsed light source utilizing laser diode and voltage detector device utilizing same low noise pulsed light source 失效低噪声脉冲光源利用激光二极管和电压检测器使用同样的低噪声脉冲光源
公开(公告)号：US5179565A
公开(公告)日：1993-01-12
申请号：US710392
申请日：1991-06-05
IPC分类号： G01R15/22 , H01S5/062 , H01S5/0683
CPC分类号： G01R15/22 , H01S5/06835 , H01S5/06216
摘要： A low noise pulsed light source utilizing a laser diode for generating a short pulsed light of a high repetitive frequency. The low noise pulsed light source includes a laser diode drived by an electric pulse generator for emitting repetitive pulsed light; a current source for supplying a bias current to the laser diode; and a photodetector for detecting the repetitive pulsed light emitted from the laser diode; and control means. The control means modulates at least one of the bias current from the current source and the amplitude of a pulse signal generated from the electric pulse generator in accordance with an output signal from the photodetector such that the intensity of the pulsed light is kept unchanged and any noise involved in the same is reduce. A feedback system including the photodetector and the control means has a peak in its frequency characteristics within a frequency band for light detecting in a light measuring system utilizing the low noise pulsed light source.
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公开(公告)号：US5034683A
公开(公告)日：1991-07-23
申请号：US460645
申请日：1990-01-03
IPC分类号： G01R15/24 , G01R31/308
CPC分类号： G01R31/308 , G01R15/242
摘要： A voltage detecting device for detecting voltages in an object under test including an electro-optic material covering a plurality of parts of the object under test; the refractive index of the electro-optic material being variable according to an applied voltage. A light source emits light through the electro-optic material toward the object under test and a detecting device receives an emergent light beam reflected from within the electro-optic material in order to detect voltages in the object. Further, a scanning device automatically scans the object under test with the light beam in order to detect voltages at a plurality of locations on the object.
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公开(公告)号：US5025142A
公开(公告)日：1991-06-18
申请号：US353948
申请日：1989-05-19
IPC分类号： G02B27/00 , G02F1/35 , H01S5/00 , H04B10/00 , H04B10/07 , H04B10/293 , H04B10/299
CPC分类号： H04B10/299 , H04B10/2914
摘要： A light waveform shaping apparatus comprises; a beam splitting means for branching an input optical signal into two optical signals; a photoelectric converter for converting one of the two branched optical signals into an electrical signal; an optical amplifier whose gain is adjustable by a controlling electrical signal, for amplifying an optical signal; an input optical path for introducing the other branched optical signal to the optical amplifier; and an electrical circuit for introducing the electrical signal from the photoelectric converter to the optical amplifier; wherein the optical and controlling electrical signals are supplied to the optical amplifier at a predetermined timing of generally coincident arrival.
摘要翻译： 光波形整形装置包括： 分束装置，用于将输入光信号分成两个光信号; 用于将两个分支光信号之一转换为电信号的光电转换器; 光放大器，其增益由控制电信号调节，用于放大光信号; 用于将另一分支光信号引入光放大器的输入光路; 以及用于将来自光电转换器的电信号引入到光放大器的电路; 其中所述光学和控制电信号在大致重合到达的预定定时被提供给所述光放大器。
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7.发明授权Voltage detector using electro-optic material having anti-reflective coatings 失效电压检测器使用具有抗反射涂层的电光材料
公开(公告)号：US4968881A
公开(公告)日：1990-11-06
申请号：US305346
申请日：1989-02-02
CPC分类号： G02F1/0311 , G01R15/242
摘要： A voltage detector comprises a light modulator which employs an electro-optic material whose refractive index changes according to the voltage developing in an object to be measured. A transparent anti-reflection film having a refractive index and thickness which are predetermined on the bases of a refractive index of the electro-optic material and a wavelength of incident light is formed on both light entrance and exit surfaces of the electro-optic material.
摘要翻译： 电压检测器包括光调制器，该光调制器采用其折射率根据在待测物体中产生的电压而变化的电光材料。 在电光材料的光入射表面和出射表面上形成具有在电光材料的折射率和入射光的波长的基础上预定的折射率和厚度的透明抗反射膜。
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公开(公告)号：US4958354A
公开(公告)日：1990-09-18
申请号：US348450
申请日：1989-05-08
IPC分类号： H01S3/137 , G05D25/02 , H01S3/131 , H01S3/23 , H01S5/06 , H01S5/068 , H01S5/0683 , H01S5/50 , H05B37/02
CPC分类号： H05B37/02 , G05D25/02 , H01S5/0683 , H01S5/50
摘要： A light intensity stabilizing apparatus comprises an optical amplifier such as a non-resonant traveling-wave type optical amplifier, whose gain is adjustable by a controlling electrical signal and which amplifies incident light emitted from a light source, a beam splitting means for branching output light of the optical amplifier into stabilized output light and feedback light, a light intensity detector for converting said feedback light into an electrical signal, and a control unit for producing said controlling electrical signal in accordance with said electrical signal from said light intensity detector.
摘要翻译： 一种光强度稳定装置，其特征在于包括：非均匀行波型光放大器等光放大器，其增益可通过控制电信号进行调节，并放大从光源发射的入射光;分束装置， 的光放大器转换成稳定的输出光和反馈光，用于将所述反馈光转换成电信号的光强度检测器，以及用于根据来自所述光强度检测器的所述电信号产生所述控制电信号的控制单元。
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9.发明授权Method of positioning an electrooptic probe of an apparatus for the measurement of voltage 失效定位用于测量电压的装置的电光探针的方法
公开(公告)号：US5552716A
公开(公告)日：1996-09-03
申请号：US213005
申请日：1994-03-14
IPC分类号： G01R19/00 , G01R31/302 , G01R31/308 , G01R29/12
CPC分类号： G01R31/308
摘要： An method of positioning an E-O probe applied to an apparatus for the measurement of voltage. In the first step, the relative position of the E-O probe against the magnifying optical system in the first condition of being focused the magnifying optical system on the base of the E-O probe, and the focal point difference between the focal plane of the magnifying optical system in the second condition that the E-O probe is substantially out of the optical path for observation of the surface of the device and the focal plane in the first condition are stored. The relative position and the focal point difference are fixed in the apparatus for the measurement of voltage regardless of the device to be measured. Next, in the second step, the focus of the magnifying optical system is adjusted to the observation position of the surface of the device in the second condition, and then in the third step, the magnifying optical system, the E-O probe, and the probe stage are separated from the device by the focal point difference stored in the first step by the Z-axis stage, and in the fourth step, the E-O probe is moved to the relative position of the E-O probe stored in the first step relative to the magnifying optical system by the probe stage.
摘要翻译： 将用于测量电压的设备的E-O探头定位的方法。 在第一步骤中，在将放大光学系统聚焦在EO探针的基座上的第一条件下，EO探针对放大光学系统的相对位置以及放大光学系统的焦平面之间的焦点差 在第二条件下，EO探针基本上不在用于观察装置的表面的光路中，并且在第一条件下存储焦平面。 无论要测量的装置如何，相对位置和焦点差都固定在用于测量电压的装置中。 接下来，在第二步骤中，放大光学系统的焦点在第二条件下被调整到装置的表面的观察位置，然后在第三步骤中，放大光学系统，EO探针和探针 通过Z轴级在第一步骤中存储的焦点差与装置分离阶段，并且在第四步骤中，将EO探针移动到相对于第一步骤中存储的EO探针的相对位置 通过探针台放大光学系统。
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公开(公告)号：US5307199A
公开(公告)日：1994-04-26
申请号：US735792
申请日：1991-07-25
CPC分类号： G02F1/293
摘要： The optical apparatus includes first and second deflection members, a mask, a pumping light source, and a controller. The first and second deflection members are formed of nonlinear optical material whose refractive index is changed upon light radiation. The mask is arranged on an optical path extending from a front side of the first deflection member to a rear side of a second deflection member. The mask has a predetermined transmission pattern. The pumping light source radiates first and second beams on predetermined regions of the first and second deflection members. This changes the refractive indices of the predetermined regions to bend the optical path. The controller variably controls the intensity of the first and second beams.
摘要翻译： 光学装置包括第一和第二偏转构件，掩模，泵浦光源和控制器。 第一偏转构件和第二偏转构件由折射率在光辐射下变化的非线性光学材料形成。 掩模布置在从第一偏转构件的前侧延伸到第二偏转构件的后侧的光路上。 掩模具有预定的传输图案。 泵浦光源在第一和第二偏转构件的预定区域上辐射第一和第二光束。 这改变了预定区域的折射率以弯曲光路。 控制器可变地控制第一和第二光束的强度。
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