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公开(公告)号：US5307199A
公开(公告)日：1994-04-26
申请号：US735792
申请日：1991-07-25
CPC分类号： G02F1/293
摘要： The optical apparatus includes first and second deflection members, a mask, a pumping light source, and a controller. The first and second deflection members are formed of nonlinear optical material whose refractive index is changed upon light radiation. The mask is arranged on an optical path extending from a front side of the first deflection member to a rear side of a second deflection member. The mask has a predetermined transmission pattern. The pumping light source radiates first and second beams on predetermined regions of the first and second deflection members. This changes the refractive indices of the predetermined regions to bend the optical path. The controller variably controls the intensity of the first and second beams.
摘要翻译： 光学装置包括第一和第二偏转构件，掩模，泵浦光源和控制器。 第一偏转构件和第二偏转构件由折射率在光辐射下变化的非线性光学材料形成。 掩模布置在从第一偏转构件的前侧延伸到第二偏转构件的后侧的光路上。 掩模具有预定的传输图案。 泵浦光源在第一和第二偏转构件的预定区域上辐射第一和第二光束。 这改变了预定区域的折射率以弯曲光路。 控制器可变地控制第一和第二光束的强度。
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公开(公告)号：US4994663A
公开(公告)日：1991-02-19
申请号：US355608
申请日：1989-05-23
摘要： An apparatus for measuring an autocorrelation wavaeform of intensity of input light comprises a beam splitting means for dividing the input light into two light beams, a photoelectric converter for converting one of the divided beams into an electrical signal, an optical modulating means for modulating the other light beam in accordance with the electrical signal, a delay means for varying a relative delay time between arrival times to the optical modulating means of the light beam and the electrical signal, and a photodetector having a response speed faster than that of the delay time variation for detecting output light from the optical modulating means.
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公开(公告)号：US5237388A
公开(公告)日：1993-08-17
申请号：US762457
申请日：1991-09-19
申请人： Isuke Hirano , Hironori Takahashi , Tsuneyuki Urakami , Tamiki Takemori , Yutaka Tsuchiya , Shinichiro Aoshima
发明人： Isuke Hirano , Hironori Takahashi , Tsuneyuki Urakami , Tamiki Takemori , Yutaka Tsuchiya , Shinichiro Aoshima
CPC分类号： G01J4/04
摘要： Young's interferometer consisting of a single slit and a double slit member, and an analyzer are arranged along the axis of light to be measured. Parallel slits of the double slit member are provided with respective polarizers whose paralyzing directions are at .+-.45.degree. to the longitudinal direction of the parallel slits. The polarizing direction of the analyzer is set in parallel with the parallel slits. The incident light passes through Young's interferometer and the analyzer to form an interference fringe, which is detected by an image detector unit. An image analyzer unit produces an intensity profile of the interference fringe and determines the polarization state of the incident light, for instance, by comparing the produced intensity profile with conceivable profiles stored in advance.
摘要翻译： 由单个狭缝和双缝隙构件组成的杨氏干涉仪和分析器沿着待测量的光轴设置。 双缝构件的平行狭缝设置有各自的偏振器，其麻痹方向与平行狭缝的纵向方向成+/- 45度。 分析仪的偏振方向与平行狭缝平行设置。 入射光通过杨氏干涉仪和分析仪，形成一个由图像检测器单元检测的干涉条纹。 图像分析器单元产生干涉条纹的强度分布并且确定入射光的偏振状态，例如通过将产生的强度分布与预先存储的可想到的曲线进行比较。
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公开(公告)号：US5198921A
公开(公告)日：1993-03-30
申请号：US795397
申请日：1991-11-21
CPC分类号： G02B6/2713 , G02B6/105 , G02B6/126 , G02B6/276 , H01S3/06708 , H01S5/5036 , H01S3/06712
摘要： A semiconductor light amplifier is driven by a drive device, and selectively amplifies one of a TM mode component and a TE mode component of input light. For example, TE mode light is selectively amplified by making thickness of the active layer of the semiconductor light amplifier not more than 0.05 .mu.m, or by tilting at least one of the entrance and exit faces of the semiconductor light amplifier by 10 to 16 degrees. An another type of light amplifying polarizer, input signal light and excitation light are combined by a half mirror or an optical coupler, and combined light is input to a rare-earth-element doped, polarization maintaining optical fiber.
摘要翻译： 半导体光放大器由驱动装置驱动，并且选择性地放大输入光的TM模式分量和TE模式分量之一。 例如，通过使半导体光放大器的有源层的厚度不大于0.05μm，或者通过使半导体光放大器的入射面和出射面中的至少一个倾斜10〜16度来选择性地放大TE模式光 。 另一种类型的光放大偏振器，输入信号光和激发光通过半透半反镜或光耦合器组合，组合光输入到稀土元素掺杂的保偏光纤。
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公开(公告)号：US5025142A
公开(公告)日：1991-06-18
申请号：US353948
申请日：1989-05-19
IPC分类号： G02B27/00 , G02F1/35 , H01S5/00 , H04B10/00 , H04B10/07 , H04B10/293 , H04B10/299
CPC分类号： H04B10/299 , H04B10/2914
摘要： A light waveform shaping apparatus comprises; a beam splitting means for branching an input optical signal into two optical signals; a photoelectric converter for converting one of the two branched optical signals into an electrical signal; an optical amplifier whose gain is adjustable by a controlling electrical signal, for amplifying an optical signal; an input optical path for introducing the other branched optical signal to the optical amplifier; and an electrical circuit for introducing the electrical signal from the photoelectric converter to the optical amplifier; wherein the optical and controlling electrical signals are supplied to the optical amplifier at a predetermined timing of generally coincident arrival.
摘要翻译： 光波形整形装置包括： 分束装置，用于将输入光信号分成两个光信号; 用于将两个分支光信号之一转换为电信号的光电转换器; 光放大器，其增益由控制电信号调节，用于放大光信号; 用于将另一分支光信号引入光放大器的输入光路; 以及用于将来自光电转换器的电信号引入到光放大器的电路; 其中所述光学和控制电信号在大致重合到达的预定定时被提供给所述光放大器。
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公开(公告)号：US4958354A
公开(公告)日：1990-09-18
申请号：US348450
申请日：1989-05-08
IPC分类号： H01S3/137 , G05D25/02 , H01S3/131 , H01S3/23 , H01S5/06 , H01S5/068 , H01S5/0683 , H01S5/50 , H05B37/02
CPC分类号： H05B37/02 , G05D25/02 , H01S5/0683 , H01S5/50
摘要： A light intensity stabilizing apparatus comprises an optical amplifier such as a non-resonant traveling-wave type optical amplifier, whose gain is adjustable by a controlling electrical signal and which amplifies incident light emitted from a light source, a beam splitting means for branching output light of the optical amplifier into stabilized output light and feedback light, a light intensity detector for converting said feedback light into an electrical signal, and a control unit for producing said controlling electrical signal in accordance with said electrical signal from said light intensity detector.
摘要翻译： 一种光强度稳定装置，其特征在于包括：非均匀行波型光放大器等光放大器，其增益可通过控制电信号进行调节，并放大从光源发射的入射光;分束装置， 的光放大器转换成稳定的输出光和反馈光，用于将所述反馈光转换成电信号的光强度检测器，以及用于根据来自所述光强度检测器的所述电信号产生所述控制电信号的控制单元。
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公开(公告)号：US4980632A
公开(公告)日：1990-12-25
申请号：US358220
申请日：1989-05-30
CPC分类号： G01R13/347
摘要： The electrical signal observing device measures the electrical signal by applying the electrical signal to be measured to an optical amplifier in order to modulate a short pulse light train directed through the electrical amplifier. The electrical signal to be measured acts as a gain control for the optical amplifier. The photodetector detects the output of the optical amplifier and applies a resultant electrical signal to an integrator circuit after which the signal is displayed. The signal may be displayed in a time base fashion using a sweep generated by a delay system of the short pulse light train.
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公开(公告)号：US5583444A
公开(公告)日：1996-12-10
申请号：US618406
申请日：1996-03-19
IPC分类号： G01R19/00 , G01R1/07 , G01R15/16 , G01R15/22 , G01R31/28 , G01R31/312 , G01R31/302
CPC分类号： G01R1/071 , G01R31/312 , G01R15/22 , G01R15/241
摘要： This invention has as its object to provide a voltage measurement apparatus which has a compact probe unit, and which can perform a measurement in a non-contact manner. The voltage measurement apparatus includes detection means for detecting an electric field generated in a space by a voltage applied to the surface of a device to be measured, light-emitting means for modulating output light by superposing a detected signal obtained from the detection means on a bias current which is supplied to inductively radiate the output light, a constant current source for supplying the bias current to the light-emitting means, extraction means for extracting a signal component of the output light from the light-emitting means, and light-transmission means for guiding the output light from the light-emitting means to the extraction means, and measures the applied voltage to the surface of the device to be measured by bringing the detection means close to the device to be measured in a non-contact manner.
摘要翻译： 本发明的目的是提供一种电压测量装置，其具有紧凑的探针单元，并且可以以非接触方式进行测量。 电压测量装置包括检测装置，用于通过施加到被测量装置的表面的电压来检测在空间中产生的电场;发光装置，用于通过将从检测装置获得的检测信号叠加在一个 提供用于感应放射输出光的偏置电流，用于向发光装置提供偏置电流的恒流源，用于从发光装置提取输出光的信号分量的提取装置，以及光传输 用于将来自发光装置的输出光引导到提取装置的装置，并且通过以非接触的方式使检测装置靠近被测量装置来测量施加到要测量装置的表面的电压。
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9.发明授权Polarization interferometer optical voltage detector utilizing movement of interference fringe 失效利用干涉条纹移动的偏振干涉仪光电压检测器
公开(公告)号：US5420686A
公开(公告)日：1995-05-30
申请号：US200568
申请日：1994-02-22
CPC分类号： G01R15/242 , G01R1/071
摘要： Polarized light is input to an optical modulator typically consisting of an electrooptic crystal. The polarization state of the input light is changed in accordance with a voltage being applied to the optical modulator. Receiving the light output from the optical modulator, a polarization interferometer produces an interference fringe on the input surface of a photodetector such as a streak camera and a CCD line sensor. Based on an output signal of the photodetector, an analyzing device calculates a pitch and a movement distance of the interference fringe to determine the voltage being applied to the optical modulator.
摘要翻译： 偏振光被输入到通常由电光晶体组成的光学调制器。 输入光的偏振状态根据施加于光调制器的电压而变化。 接收来自光调制器的光输出，偏振干涉仪在诸如条纹照相机和CCD线传感器的光电检测器的输入表面上产生干涉条纹。 基于光检测器的输出信号，分析装置计算干涉条纹的间距和移动距离，以确定施加到光调制器的电压。
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公开(公告)号：US5220579A
公开(公告)日：1993-06-15
申请号：US735647
申请日：1991-07-25
IPC分类号： H01S3/0915 , H01S3/106 , H01S3/108 , H01S3/11
CPC分类号： H01S3/117 , H01S3/108 , H01S3/0805
摘要： A pulse laser has a laser resonator, a laser medium in the laser resonator, and a deflecting device. The laser medium emits an emission light. The deflecting device switches an optical path of the emission light to output the emission light as a laser pulse. The deflecting device includes a deflecting member and a pumping device. The deflecting member is arranged in the optical path of the emission light. The deflection member has a refractive index which changes based on a pumping light incident thereon. The pumping device radiates the pumping light on a predetermined region of the deflection member and varies the refractive index of the predetermined region to switch the optical path of the emission light.
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