公开(公告)号：US20210215991A1

公开(公告)日：2021-07-15

申请号：US16073509

申请日：2018-01-29

Applicant: SOUTHEAST UNIVERSITY

Inventor： Yan TU ,  Lanlan YANG ,  Jingjing GUO ,  Lili WANG ,  Baoping WANG ,  Yuning ZHANG ,  Xuefei ZHONG

IPC: G02F1/19 ,  G02F1/01

Abstract: A visible light band reflection metasurface device and a reflected light wavelength modulation method. The device successively includes, from top to bottom, a metal metasurface layer with periodically arranged antenna units, a modulation layer formed by an electro-optic material, a metal reflection layer and a substrate layer; the antenna unit period is less than the incident wavelength, and the thickness is greater than the skin depth of metal and less than 100 nm; the thickness of the modulation layer is less than the wavelength of the incident light; and the thickness of the metal reflection layer is greater than the skin depth of metal and less than the wavelength of the incident light; and an external voltage source can modulate the color of the reflected light, and can achieve voltage modulation of the color of reflected light in the visible light band.

公开(公告)号：US20210056468A1

公开(公告)日：2021-02-25

申请号：US17043715

申请日：2019-03-12

Applicant: Southeast University

Inventor： Peng CAO ,  Bingqian XU ,  Jingjing GUO ,  Mengxiao LI ,  Jun YANG

IPC: G06N20/00 ,  G01R31/28

Abstract: A method for predicting the fluctuation of circuit path delay on the basis of machine learning, comprising the following steps: S1: selecting suitable sample characteristics by means of analyzing the relationship between circuit characteristics and path delay; S2: generating a random path by means of enumerating values of randomized parameters, acquiring the maximum path delay by means of performing Monte Carlo simulation on the random path, selecting a reliable path by means of the 3σ standard, and using the sample characteristics and path delay of the reliable path as a sample set (D); S3: establishing a path delay prediction model, and adjusting parameters of the model; S4: verifying the precision and stability of the path delay prediction model; S5: obtaining the path delay. The method for predicting the fluctuation of circuit path delay on the basis of machine learning has the advantages of high precision and low running time, thereby having remarkable advantages in the accuracy and efficiency of timing analysis.

公开(公告)号：US20230153502A1

公开(公告)日：2023-05-18

申请号：US16969474

申请日：2020-02-24

Applicant: SOUTHEAST UNIVERSITY

Inventor： Peng CAO ,  Tai YANG ,  Jingjing GUO

IPC: G06F30/3315 ,  G06F30/3312

CPC classification number: G06F30/3315 ,  G06F30/3312 ,  G06F2119/12

Abstract: It discloses a statistical timing analysis method of an integrated circuit under an advanced process and a low voltage. By simulating the fluctuation of process parameters of the integrated circuit under the advanced process, a statistical circuit timing model is built based on the relationship between the delay of the integrated circuit under the low voltage and the process parameters, and the maximum delay and the minimum delay under timing fluctuation of the integrated circuit are analyzed.