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1.发明申请METHODS AND DEVICES FOR HIGH THROUGHPUT CRYSTAL STRUCTURE ANALYSIS BY ELECTRON DIFFRACTION 有权通过电子衍射进行高通量晶体结构分析的方法和装置公开(公告)号：US20110220796A1
公开(公告)日：2011-09-15
申请号：US13127455
申请日：2009-11-06
IPC分类号： H01J37/26
CPC分类号： H01J37/28 , G01N23/20058 , H01J37/05 , H01J37/222 , H01J37/256 , H01J37/2955 , H01J2237/226 , H01J2237/25 , H01J2237/2802
摘要： A method and device for electron diffraction tomography of a crystal sample, which employs scanning of the electron beam over a plurality of discrete locations of the sample, in combination with a beam scanning protocol as the beam converges at every discrete location (42, 43) of the sample (38) to obtain a series of electron diffraction patterns, use of template matching to determine crystal orientations and thickness maps to obtain a common intensity scaling factor.
摘要翻译： 一种晶体样品的电子衍射断层摄影的方法和装置，当束在每个离散位置（42,43）处会聚时，其结合光束扫描方案，在样本的多个离散位置上扫描电子束， 的样品（38）以获得一系列电子衍射图案，使用模板匹配来确定晶体取向和厚度图以获得共同的强度比例因子。
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2.发明授权Methods and devices for high throughput crystal structure analysis by electron diffraction 有权用于通过电子衍射进行高通量晶体结构分析的方法和装置公开(公告)号：US08253099B2
公开(公告)日：2012-08-28
申请号：US13127455
申请日：2009-11-06
IPC分类号： H01J37/28
CPC分类号： H01J37/28 , G01N23/20058 , H01J37/05 , H01J37/222 , H01J37/256 , H01J37/2955 , H01J2237/226 , H01J2237/25 , H01J2237/2802
摘要： A method and device for electron diffraction tomography of a crystal sample, which employs scanning of the electron beam over a plurality of discrete locations of the sample, in combination with a beam scanning protocol as the beam converges at every discrete location (42, 43) of the sample (38) to obtain a series of electron diffraction patterns, use of template matching to determine crystal orientations and thickness maps to obtain a common intensity scaling factor.
摘要翻译： 一种晶体样品的电子衍射断层摄影的方法和装置，当束在每个离散位置（42,43）处会聚时，其结合光束扫描方案，在样本的多个离散位置上扫描电子束， 的样品（38）以获得一系列电子衍射图案，使用模板匹配来确定晶体取向和厚度图以获得共同的强度比例因子。
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