Point and line range sensors
    1.
    发明授权
    Point and line range sensors 失效
    点和线范围传感器

    公开(公告)号:US4891772A

    公开(公告)日:1990-01-02

    申请号:US38399

    申请日:1987-04-15

    IPC分类号: G01S7/481 G01S17/46 G01S17/87

    摘要: High precision, non-contact sensors are disclosed which optically measure distances from the sensor head to the surface or surfaces under test. The modular design of the system allows a large selection of identically packaged sensor heads with differing ranges and resolutions. Built-in algorithms automatically adjust exposure time and process data to maximize accuracy for most applications. The sensor heads contain a laser diode source which features visible radiation as well as infrared radiation to faciltiate set-up and use of the system. A unique optical system focuses the laser beam on a detector array. That data is processed to determine distance for point range sensors and surface profile for line range sensors. High speed algorithms are employed for reducing the data from the imaging array in the sensor head to meaningful range data. To compensate for widely varying surfaces of the software can vary the exposure and laser power to yield a dynamic range of 10.sup.7. The user can reject certain areas of the optical image and, therefore, eliminate erroneous readings that could be caused by multiple reflections from complex geometries. The operator can also select up to sixteen different heads, one at a time, for multiple measurements. Operator interface is conveniently provided through the keyboard to an attached computer system.

    摘要翻译: 公开了高精度,非接触式传感器,其光学地测量从传感器头到被测表面或表面的距离。 系统的模块化设计允许大量选择具有不同范围和分辨率的相同封装的传感器头。 内置算法可自动调整曝光时间和处理数据,以最大限度地提高精度。 传感器头包含具有可见辐射以及红外辐射的激光二极管源,以便于系统的建立和使用。 独特的光学系统将激光束聚焦在检测器阵列上。 处理该数据以确定点范围传感器的距离和线范围传感器的表面轮廓。 采用高速算法将数据从传感头中的成像阵列减少到有意义的距离数据。 为了补偿软件的广泛变化的表面可以改变曝光和激光功率以产生107的动态范围。用户可以拒绝光学图像的某些区域,并且因此消除可能由复杂的多次反射引起的错误读数 几何形状。 操作员还可以选择多达十六个不同的头,一次一个,用于多次测量。 操作员界面通过键盘方便地提供给附加的计算机系统。

    High precision semiconductor component alignment systems
    3.
    发明授权
    High precision semiconductor component alignment systems 失效
    高精度半导体元器件对准系统

    公开(公告)号:US5897611A

    公开(公告)日:1999-04-27

    申请号:US711380

    申请日:1996-09-06

    IPC分类号: G01B11/00 G01B11/27 H05K13/04

    CPC分类号: G01B11/00 G01B11/272

    摘要: High speed high precision alignment sensor systems for use on surface mount component placement machines. Light systems are used to correctly align and position component parts. The sensor system consists of a light source and an optical lens system causing more of the light from a light source to pass the component in order to obtain a sharper component image on a sensor array. Due to the optical lens systems disclosed, either low powered lasers, light emitting diodes, or other suitable light sources can be used in the system since optical efficiency is substantially increased over prior systems since more of the radiated light is collected from the light source for measurement at the detector. The sensor system is mounted directly on the carrying mechanism for the surface mount component placement machine. During transit of the component between the bin of components and the circuit board upon which the component is to be placed, the component is rotated and the sharp shadow which falls on the detector array is monitored. Several processing algorithms are disclosed for determining correct component angular orientation and coordinate (X,Y) location of the component on the quill. Thereafter, the sensor sends correcting signals to the component placement machine.

    摘要翻译: 用于表面贴装元件贴装机的高速高精度对位传感器系统。 光系统用于正确对准和定位组件。 传感器系统由光源和光学透镜系统组成,其中更多的来自光源的光通过部件以便在传感器阵列上获得更清晰的分量图像。 由于所公开的光学透镜系统,可以在系统中使用低功率激光器,发光二极管或其他合适的光源,因为与现有系统相比,光学效率显着增加,因为从光源收集更多的辐射光, 检测器测量。 传感器系统直接安装在表面安装元件贴装机的搬运机构上。 在组件箱和要放置组件的电路板之间的部件运输期间,部件被旋转并且监测落在检测器阵列上的尖锐阴影。 公开了几种用于确定组件在套筒上的正确的组件角取向和坐标(X,Y)位置的处理算法。 此后,传感器向组件贴装机发送校正信号。

    Laser-based semiconductor lead measurement system
    4.
    发明授权
    Laser-based semiconductor lead measurement system 失效
    基于激光的半导体引线测量系统

    公开(公告)号:US5309223A

    公开(公告)日:1994-05-03

    申请号:US719727

    申请日:1991-06-25

    CPC分类号: G01R31/311 H05K13/08

    摘要: A high speed, high precision laser-based semiconductor lead measurement system for use on surface mount component placement machines. A laser system is used to accurately sense the position and condition of each of the many leads used on integrated circuits prior to their placement on a surface mount circuit board by a pick and place machine. Using one, two or three laser beams, the non-contact sensor system can, with the highest degree of resolution, determine lateral orientation and coplanarity of leads for integrated circuit components, even those having an ultra-fine pitch. Determination of the lead position by the invention is based on the integrated circuit leads occluding the light of one or more precisely directed and focused laser light sources. Each integrated circuit lead is passed through the focal point of a laser beam. The position of each lead is determined when it blocks all or a portion of the light of the laser beam. A processor means is used to calculate the actual position of each lead. The difference between the actual position of the lead and the nominal position of the lead can then be computed. The position of each lead is then sorted to determine the greatest deviation of any lead from a best fit plane. The processor may then either generate a reject or a repositioning signal to the component placement machine for proper placement of the integrated circuit upon the surface mount circuit board.

    摘要翻译: 一种用于表面贴装元件贴装机的高速,高精度的基于激光的半导体引线测量系统。 激光系统用于在通过拾取和放置机器放置在表面安装电路板之前,精确地检测在集成电路上使用的许多引线中的每一个的位置和状态。 使用一个,两个或三个激光束,非接触式传感器系统可以以最高的分辨率确定用于集成电路部件的引线的横向取向和共面性,即使是具有超细间距的那些。 通过本发明确定引线位置是基于封闭一个或多个精确定向和聚焦的激光光源的光的集成电路引线。 每个集成电路引线通过激光束的焦点。 当它阻挡激光束的全部或一部分光时,确定每个引线的位置。 处理器装置用于计算每个引线的实际位置。 然后可以计算引线的实际位置和引线的标称位置之间的差异。 然后对每个引线的位置进行排序,以确定任何引线与最佳拟合平面的最大偏差。 然后,处理器可以向组件放置机器生成拒绝或重新定位信号,以便将集成电路正确放置在表面安装电路板上。

    Rotary sensor system with a single detector
    5.
    发明授权
    Rotary sensor system with a single detector 失效
    具有单个检测器的旋转传感器系统

    公开(公告)号:US06538750B1

    公开(公告)日:2003-03-25

    申请号:US09314169

    申请日:1999-05-19

    IPC分类号: G01B114

    CPC分类号: H05K13/0812

    摘要: The system of the present invention reports a signal related to a physical condition of an object, such as an electronic component, with the most basic realization of the system including a vacuum quill for releasably holding the object and a motion control system for rotating the quill. The invention includes control electronics coupled to the detector for providing a trigger signal where the detector is oriented to view a stripe in a viewing plane perpendicular to the central axis of the quill, and to provide an image of the stripe. The control electronics sends a plurality of trigger signals to the detector while the motion control system rotates the quill, with each trigger signal triggering the acquisition of another image of a stripe. A processing circuit processes the plurality of images of the stripes to provide the signal related to the physical condition of the object, which can include the orientation or location of the component, the presence or absence of balls on a ball grid array, the height of a specific lead on a leaded component, the distance between the leads on a leaded component or the coplanarity of features on the component. A method for picking and placing components is also disclosed for use with the apparatus of the present invention.

    摘要翻译: 本发明的系统报告与诸如电子部件的物体的物理状况相关的信号,其中包括用于可释放地保持物体的真空套筒的系统的最基本的实现以及用于旋转套筒的运动控制系统 。 本发明包括耦合到检测器的控制电子装置,用于提供触发信号,其中检测器被定向成在垂直于套筒的中心轴线的观察平面中观察条纹,并提供条纹图像。 当运动控制系统旋转套筒时,控制电子装置将多个触发信号发送到检测器,每个触发信号触发获取条带的另一个图像。 处理电路处理条纹的多个图像以提供与物体的物理状态相关的信号,其可以包括部件的取向或位置,球栅阵列上的球的存在或不存在, 引导元件上的特定引线,引导元件上的引线之间的距离或元件上特征的共面性。 还公开了用于拾取和放置部件的方法,用于与本发明的装置一起使用。

    Method and apparatus for electronic component lead measurement using
light based sensors on a component placement machine
    6.
    发明授权
    Method and apparatus for electronic component lead measurement using light based sensors on a component placement machine 失效
    使用元件贴装机上的基于光的传感器进行电子元件引线测量的方法和装置

    公开(公告)号:US6118538A

    公开(公告)日:2000-09-12

    申请号:US938244

    申请日:1997-09-26

    IPC分类号: H05K13/04 G01B11/24

    CPC分类号: H05K13/0413

    摘要: The present invention is a light based detection system for providing a low cost, very fast and very accurate measurements of lead positions and heights for integrated circuit board components. The alignment detections systems of the present invention are preferably located on a component placement head. The detector is a linear or rectangular array of pixels. The light path between the light source and the detector array is directed by the optical components across one or more leads in a plane that is neither parallel to nor perpendicular to the seating plane of the component. The light path is directed across the relevant leads without substantial interference from the body of the component or the other leads not being measured. A digital processor analyzes the measurements of the light sensitive detector to determine positions and/or coplanarity of the leads.

    摘要翻译: 本发明是一种基于光的检测系统,用于为集成电路板部件提供低成本,非常快速且非常精确的引线位置和高度的测量。 本发明的对准检测系统优选地位于组件放置头上。 检测器是像素的线性或矩形阵列。 光源和检测器阵列之间的光路由光学部件穿过一个或多个引线,平面不与零件的座面平行或垂直。 光路被引导穿过相关引线,而没有来自元件的主体或未被测量的其它引线的实质干扰。 数字处理器分析光敏检测器的测量以确定引线的位置和/或共面性。

    Rotary sensor system with at least two detectors
    7.
    发明授权
    Rotary sensor system with at least two detectors 失效
    具有至少两个探测器的旋转传感器系统

    公开(公告)号:US06292261B1

    公开(公告)日:2001-09-18

    申请号:US09314545

    申请日:1999-05-19

    IPC分类号: G01B1114

    CPC分类号: H05K13/0812

    摘要: The present invention includes a system for providing a signal related to a physical condition of an object, such as an electronic component. Various types of electronic components may be used with the present invention, including leaded components, column, pin or grid array packages, and the like. The system includes a quill for releasably holding the object. The object has a major surface defining a plane, and a motion control system for rotating the quill about a central axis. Control electronics in the invention provide a plurality of trigger signals to each of two detectors, each detector adapted to view the same stripe in the plane upon receipt of a trigger signal and to output an image of the stripe. The detectors view a plurality of stripes while the motion control system rotates the quill, and the output from the detectors is received by processing circuitry for processing the plurality of images of the stripes to provide the signal related to the physical condition of the object. The signal may be computed to provide the orientation of the object, the location of a feature on the object, the distance between leads on a leaded component or the coplanarity of raised features on the object. A method of picking and placing components is also disclosed for use with the apparatus of the present invention.

    摘要翻译: 本发明包括用于提供与诸如电子部件的物体的物理状况相关的信号的系统。 本发明可以使用各种类型的电子部件,包括引线元件,列,引脚或栅格阵列封装等。 该系统包括用于可释放地保持物体的套筒。 物体具有限定平面的主表面和用于围绕中心轴旋转套筒的运动控制系统。 本发明中的控制电子装置向两个检测器中的每一个提供多个触发信号,每个检测器适于在接收到触发信号时在平面中观看相同的条带并输出条纹图像。 当运动控制系统旋转套筒时,检测器观察多个条纹,并且来自检测器的输出由处理电路接收,用于处理条纹的多个图像以提供与物体的物理状况相关的信号。 可以计算信号以提供对象的取向,对象上特征的位置,有引导部件上的引线之间的距离或对象上凸起的特征​​的共面性。 还公开了一种拾取和放置部件的方法,用于与本发明的装置一起使用。

    Multi-beam laser sensor for semiconductor lead measurements
    8.
    发明授权
    Multi-beam laser sensor for semiconductor lead measurements 失效
    用于半导体引线测量的多光束激光传感器

    公开(公告)号:US5331406A

    公开(公告)日:1994-07-19

    申请号:US989519

    申请日:1992-12-11

    CPC分类号: G01R31/311 H05K13/08

    摘要: A high speed, high precision laser-based semiconductor lead measurement system for use on surface mount component placement machines. A multi-beam laser system is used to accurately sense the position and condition of each of the many leads used on integrated circuits prior to their placement on a surface mount circuit board by a pick and place machine. Using two, three or four laser beams, the non-contact sensor system can, with the highest degree of resolution, determine lateral orientation, height, colinearity, and coplanarity of leads for integrated circuit components, even those having an ultra-fine pitch. Determination of the lead position by the invention is based on the integrated circuit leads occluding the light of one or more precisely directed and focused laser light sources. Each integrated circuit lead is passed nominally through the focal point of a laser beam. The position of each lead is determined when it blocks all or a portion of the light of the laser beam. A processor means is used to calculate the actual position of each lead. The difference between the actual position of the lead and the nominal position of the lead can then be computed. The position of each lead is then sorted to determine the greatest deviation of any lead from a best fit line or from the Seating Plane. The processor may then either generate a reject or a repositioning signal to the component placement machine for proper placement of the integrated circuit upon the surface mount circuit board.

    摘要翻译: 一种用于表面贴装元件贴装机的高速,高精度的基于激光的半导体引线测量系统。 多光束激光系统用于在通过拾取和放置机器放置在表面安装电路板之前,精确地检测在集成电路上使用的许多引线中的每一个的位置和状态。 使用两个,三个或四个激光束,非接触式传感器系统可以以最高的分辨率确定集成电路部件的引线的横向,高度,共线性和共面性,甚至具有超细间距的引线。 通过本发明确定引线位置是基于封闭一个或多个精确定向和聚焦的激光光源的光的集成电路引线。 每个集成电路引线通过标称通过激光束的焦点通过。 当它阻挡激光束的全部或一部分光时,确定每个引线的位置。 处理器装置用于计算每个引线的实际位置。 然后可以计算引线的实际位置和引线的标称位置之间的差异。 然后对每个引线的位置进行排序,以确定任何引线与最佳拟合线或座面平面之间的最大偏差。 然后,处理器可以向组件放置机器生成拒绝或重新定位信号,以便将集成电路正确放置在表面安装电路板上。

    Use of prisms to obtain anamorphic magnification
    9.
    发明授权
    Use of prisms to obtain anamorphic magnification 失效
    使用棱镜获得变形放大

    公开(公告)号:US4872747A

    公开(公告)日:1989-10-10

    申请号:US38846

    申请日:1987-04-15

    摘要: An optical system designed to obtain anamorphic magnification without increasing overall system package size and without diminishing post-magnification light levels. Specifically, an output light beam passes a collimating lens and enters a prism at a near normal incidence to produce slight angular minification. The prism is aligned so that the light exits the prism at a steep angle thereby providing large angular magnification. The beam may then be focused. Additional prisms, appropriate angles between prism faces or prism orientation may be used to obtain various magnification or deflection angles depending on the desired application of the prismatic anamorphic optical system.

    摘要翻译: 一种设计用于获得变形放大率而不增加整个系统封装尺寸并且不减小后放大倍数的光级的光学系统。 具体地,输出光束通过准直透镜,并以近似的垂直入射方式进入棱镜,产生微小的角度缩小。 棱镜对准,使得光以陡峭的角度离开棱镜,从而提供大的角放大率。 然后可以将光束聚焦。 可以使用附加棱镜,棱镜面之间的适当角度或棱镜取向可以根据棱镜变形光学系统的期望应用来获得各种放大或偏转角度。