Multi-beam laser sensor for semiconductor lead measurements
    1.
    发明授权
    Multi-beam laser sensor for semiconductor lead measurements 失效
    用于半导体引线测量的多光束激光传感器

    公开(公告)号:US5331406A

    公开(公告)日:1994-07-19

    申请号:US989519

    申请日:1992-12-11

    CPC分类号: G01R31/311 H05K13/08

    摘要: A high speed, high precision laser-based semiconductor lead measurement system for use on surface mount component placement machines. A multi-beam laser system is used to accurately sense the position and condition of each of the many leads used on integrated circuits prior to their placement on a surface mount circuit board by a pick and place machine. Using two, three or four laser beams, the non-contact sensor system can, with the highest degree of resolution, determine lateral orientation, height, colinearity, and coplanarity of leads for integrated circuit components, even those having an ultra-fine pitch. Determination of the lead position by the invention is based on the integrated circuit leads occluding the light of one or more precisely directed and focused laser light sources. Each integrated circuit lead is passed nominally through the focal point of a laser beam. The position of each lead is determined when it blocks all or a portion of the light of the laser beam. A processor means is used to calculate the actual position of each lead. The difference between the actual position of the lead and the nominal position of the lead can then be computed. The position of each lead is then sorted to determine the greatest deviation of any lead from a best fit line or from the Seating Plane. The processor may then either generate a reject or a repositioning signal to the component placement machine for proper placement of the integrated circuit upon the surface mount circuit board.

    摘要翻译: 一种用于表面贴装元件贴装机的高速,高精度的基于激光的半导体引线测量系统。 多光束激光系统用于在通过拾取和放置机器放置在表面安装电路板之前,精确地检测在集成电路上使用的许多引线中的每一个的位置和状态。 使用两个,三个或四个激光束,非接触式传感器系统可以以最高的分辨率确定集成电路部件的引线的横向,高度,共线性和共面性,甚至具有超细间距的引线。 通过本发明确定引线位置是基于封闭一个或多个精确定向和聚焦的激光光源的光的集成电路引线。 每个集成电路引线通过标称通过激光束的焦点通过。 当它阻挡激光束的全部或一部分光时,确定每个引线的位置。 处理器装置用于计算每个引线的实际位置。 然后可以计算引线的实际位置和引线的标称位置之间的差异。 然后对每个引线的位置进行排序,以确定任何引线与最佳拟合线或座面平面之间的最大偏差。 然后,处理器可以向组件放置机器生成拒绝或重新定位信号,以便将集成电路正确放置在表面安装电路板上。

    Rotary sensor system with a single detector
    2.
    发明授权
    Rotary sensor system with a single detector 失效
    具有单个检测器的旋转传感器系统

    公开(公告)号:US06538750B1

    公开(公告)日:2003-03-25

    申请号:US09314169

    申请日:1999-05-19

    IPC分类号: G01B114

    CPC分类号: H05K13/0812

    摘要: The system of the present invention reports a signal related to a physical condition of an object, such as an electronic component, with the most basic realization of the system including a vacuum quill for releasably holding the object and a motion control system for rotating the quill. The invention includes control electronics coupled to the detector for providing a trigger signal where the detector is oriented to view a stripe in a viewing plane perpendicular to the central axis of the quill, and to provide an image of the stripe. The control electronics sends a plurality of trigger signals to the detector while the motion control system rotates the quill, with each trigger signal triggering the acquisition of another image of a stripe. A processing circuit processes the plurality of images of the stripes to provide the signal related to the physical condition of the object, which can include the orientation or location of the component, the presence or absence of balls on a ball grid array, the height of a specific lead on a leaded component, the distance between the leads on a leaded component or the coplanarity of features on the component. A method for picking and placing components is also disclosed for use with the apparatus of the present invention.

    摘要翻译: 本发明的系统报告与诸如电子部件的物体的物理状况相关的信号,其中包括用于可释放地保持物体的真空套筒的系统的最基本的实现以及用于旋转套筒的运动控制系统 。 本发明包括耦合到检测器的控制电子装置,用于提供触发信号,其中检测器被定向成在垂直于套筒的中心轴线的观察平面中观察条纹,并提供条纹图像。 当运动控制系统旋转套筒时,控制电子装置将多个触发信号发送到检测器,每个触发信号触发获取条带的另一个图像。 处理电路处理条纹的多个图像以提供与物体的物理状态相关的信号,其可以包括部件的取向或位置,球栅阵列上的球的存在或不存在, 引导元件上的特定引线,引导元件上的引线之间的距离或元件上特征的共面性。 还公开了用于拾取和放置部件的方法,用于与本发明的装置一起使用。

    Rotary sensor system with at least two detectors
    3.
    发明授权
    Rotary sensor system with at least two detectors 失效
    具有至少两个探测器的旋转传感器系统

    公开(公告)号:US06292261B1

    公开(公告)日:2001-09-18

    申请号:US09314545

    申请日:1999-05-19

    IPC分类号: G01B1114

    CPC分类号: H05K13/0812

    摘要: The present invention includes a system for providing a signal related to a physical condition of an object, such as an electronic component. Various types of electronic components may be used with the present invention, including leaded components, column, pin or grid array packages, and the like. The system includes a quill for releasably holding the object. The object has a major surface defining a plane, and a motion control system for rotating the quill about a central axis. Control electronics in the invention provide a plurality of trigger signals to each of two detectors, each detector adapted to view the same stripe in the plane upon receipt of a trigger signal and to output an image of the stripe. The detectors view a plurality of stripes while the motion control system rotates the quill, and the output from the detectors is received by processing circuitry for processing the plurality of images of the stripes to provide the signal related to the physical condition of the object. The signal may be computed to provide the orientation of the object, the location of a feature on the object, the distance between leads on a leaded component or the coplanarity of raised features on the object. A method of picking and placing components is also disclosed for use with the apparatus of the present invention.

    摘要翻译: 本发明包括用于提供与诸如电子部件的物体的物理状况相关的信号的系统。 本发明可以使用各种类型的电子部件,包括引线元件,列,引脚或栅格阵列封装等。 该系统包括用于可释放地保持物体的套筒。 物体具有限定平面的主表面和用于围绕中心轴旋转套筒的运动控制系统。 本发明中的控制电子装置向两个检测器中的每一个提供多个触发信号,每个检测器适于在接收到触发信号时在平面中观看相同的条带并输出条纹图像。 当运动控制系统旋转套筒时,检测器观察多个条纹,并且来自检测器的输出由处理电路接收,用于处理条纹的多个图像以提供与物体的物理状况相关的信号。 可以计算信号以提供对象的取向,对象上特征的位置,有引导部件上的引线之间的距离或对象上凸起的特征​​的共面性。 还公开了一种拾取和放置部件的方法,用于与本发明的装置一起使用。

    Inspection system with vibration resistant video capture
    4.
    发明授权
    Inspection system with vibration resistant video capture 失效
    检测系统采用防震视频采集

    公开(公告)号:US06549647B1

    公开(公告)日:2003-04-15

    申请号:US09522519

    申请日:2000-03-10

    IPC分类号: G06K900

    摘要: Methods and an apparatus are disclosed for providing enhanced vibration immunity in a solder paste inspection system, although they are usable in any number of industries that require rapid acquisition of several images. The method includes capturing at least three images on a frame transfer CCD array before any data is sequentially read from the array. The present method is extendable to a larger number of images. Additionally, the masked memory area can be larger than the image area of the frame transfer CCD array.

    摘要翻译: 公开了用于在焊膏检查系统中提供增强的抗振动性的方法和装置,尽管它们可用于需要快速采集多个图像的任意数量的工业。 该方法包括在从阵列顺序读取任何数据之前在帧传送CCD阵列上捕获至少三个图像。 本方法可扩展到更多的图像。 此外,掩蔽的存储区域可以大于帧传送CCD阵列的图像区域。

    Solder paste inspection system
    5.
    发明授权
    Solder paste inspection system 有权
    焊膏检测系统

    公开(公告)号:US06750899B1

    公开(公告)日:2004-06-15

    申请号:US09524133

    申请日:2000-03-10

    IPC分类号: H04N718

    摘要: A novel inspection system for inspecting an article of manufacture, such as a printed circuit board, is disclosed, where the system includes a strobed illuminator adapted to project light through a reticle so as to project a pattern of light onto an area of the printed circuit board. A board transport responsively positions the board to at least two distinct positions, where each position corresponding to a different phase of the projected light. Also included is a detector adapted to acquire at least two images of the area, each image corresponding to one of the at least two different phases. An encoder monitors the movement of the board and outputs a position output, and a processor connected to the encoder, the board transport, the illuminator and the detector controlledly energizes the illuminator to expose the area as a function of the position output, the processor co-siting the at least two images and constructing a height map image with the co-sited images.

    摘要翻译: 公开了一种用于检查诸如印刷电路板的制品的新型检查系统,其中系统包括频闪照明器,其适用于通过掩模版投射光以将光线投射到印刷电路的区域上 板。 板传输响应地将板定位到至少两个不同的位置,其中每个位置对应于投影光的不同相位。 还包括检测器,其适于获取该区域的至少两个图像,每个图像对应于至少两个不同相中的一个。 编码器监视电路板的移动并输出位置输出,连接到编码器的处理器,电路板传输,照明器和检测器控制地照亮照明器,使位置输出的函数露出该区域,处理器 选择所述至少两个图像并且使用所述共同图像构建高度图图像。

    Embedded inspection image archival for electronics assembly machines
    7.
    发明申请
    Embedded inspection image archival for electronics assembly machines 审中-公开
    电子装配机的嵌入式检查图像存档

    公开(公告)号:US20070276867A1

    公开(公告)日:2007-11-29

    申请号:US11439376

    申请日:2006-05-23

    IPC分类号: G06F17/00

    CPC分类号: H05K13/0812

    摘要: A pick and place machine includes a vision system for acquiring at least one image relative to at least one component-related operation within the pick and place machine. The at least one image is stored along with one or more trace keys associated with the component-related operation. A database of images and associated trace keys can then be used to analyze operation of the pick and place machine to identify aspects that are out of control, or threaten to be out of control.

    摘要翻译: 拾取和放置机器包括用于相对于拾取和放置机器中的至少一个部件相关操作获取至少一个图像的视觉系统。 至少一个图像与与组件相关操作相关联的一个或多个跟踪键一起存储。 然后可以使用图像数据库和关联的跟踪键来分析拾取和放置机器的操作,以识别出失控或可能失控的方面。

    INSPECTION SYSTEM AND METHOD
    8.
    发明申请
    INSPECTION SYSTEM AND METHOD 有权
    检查系统和方法

    公开(公告)号:US20100007896A1

    公开(公告)日:2010-01-14

    申请号:US12567224

    申请日:2009-09-25

    申请人: David Fishbaine

    发明人: David Fishbaine

    IPC分类号: G01B11/25

    摘要: A manufacturing method and system are disclosed for illuminating a target. A light controller has a plurality of pixels, and light is projected from at least a first light source to the light controller, wherein the light from the first light source is incident on the light controller at a first angle. The pixels are controlled to establish illumination characteristics for first and second optical paths between the light controller and the target.

    摘要翻译: 公开了用于照射目标的制造方法和系统。 光控制器具有多个像素,并且光从至少第一光源投射到光控制器,其中来自第一光源的光以第一角度入射在光控制器上。 控制像素以建立光控制器和目标之间的第一和第二光路的照明特性。

    Phase profilometry system with telecentric projector
    9.
    发明授权
    Phase profilometry system with telecentric projector 失效
    具有远心投影仪的相轮廓测量系统

    公开(公告)号:US06577405B2

    公开(公告)日:2003-06-10

    申请号:US09754991

    申请日:2001-01-05

    IPC分类号: G01B1124

    摘要: An optical system for computing a height of a target on a surface includes a light projector for projecting light. The light passes through a patterned reticle and a projector lens so as to illuminate the target with an image of the pattern. The light is projected telecentrically between the reticle and the projector lens, and a camera is positioned along a receive optical path. The camera receives an image of the target through a receive lens. The target and the pattern move at least three times with respect to each other, and the camera acquires an image of the object at each of at least three positions.

    摘要翻译: 用于计算表面上的目标的高度的光学系统包括用于投射光的投光器。 光通过图案化的掩模版和投影仪透镜,以用图案的图像照亮目标。 光线以中心方式投影在标线片和投影仪透镜之间,并且相机沿着接收光路定位。 相机通过接收镜头接收目标的图像。 目标和图案相对于彼此移动至少三次,并且相机在至少三个位置中的每一个处获取对象的图像。

    Apparatus and method for estimating background tilt and offset
    10.
    发明授权
    Apparatus and method for estimating background tilt and offset 有权
    用于估计背景倾斜和偏移的装置和方法

    公开(公告)号:US06385335B1

    公开(公告)日:2002-05-07

    申请号:US09654278

    申请日:2000-09-01

    IPC分类号: G06K952

    摘要: A computer implemented software device for estimating background tilt and offset is disclosed to preferably be adaptable to an optical measurement instrument wherein the estimated parameters are resolved to generate a reference plane to be subtracted from a height map of a phase profile. A set of histograms of heights is used to develop a merit function. A two-dimensional high speed iterative search is used to optimize the merit function to generate a reference plane coincident with the spatial tilt of the phase profile. The invention enables real-time measurement of substrate height for preferred use in high-speed image processing operations relating to circuit-board production lines.

    摘要翻译: 公开了一种用于估计背景倾斜和偏移的计算机实现的软件设备,以优选地适用于光学测量仪器,其中所估计的参数被分辨以产生要从相位轮廓的高度图中减去的参考平面。 使用一组高度的直方图来开发优点函数。 使用二维高速迭代搜索来优化优值函数以生成与相位轮廓的空间倾斜一致的参考平面。 本发明能够实现基板高度的实时测量,以便优选用于与电路板生产线有关的高速图像处理操作。