公开(公告)号：US07568381B2

公开(公告)日：2009-08-04

申请号：US11780208

申请日：2007-07-19

Applicant: Stuart T. Smith ,  Jonathan D. Ellis

Inventor： Stuart T. Smith ,  Jonathan D. Ellis

IPC: G01N3/48

CPC classification number: G01N3/42 ,  G01N2203/0078 ,  G01N2203/0082 ,  G01N2203/0286 ,  G01N2203/0623 ,  G01N2203/0682

Abstract: The present invention provides an apparatus and method for performing surface property measurements, such as workpiece hardness and other material property measurements, with in-process compensation for instrument frame distortion and the like. The apparatus includes a substantially rigid base; a stylus coupled to the substantially rigid base, the stylus configured and selectively positioned to interact with a surface of a specimen at points along a central axis of the stylus; a proximity detector sensor coupled to the substantially rigid base, the proximity detector sensor disposed at a predetermined distance from the surface of the specimen and operable for sensing the predetermined distance between the proximity detector sensor and the surface of the specimen; and a proximity detector actuator coupled to the substantially rigid base, the proximity detector actuator operable for maintaining the predetermined distance between the proximity detector sensor and the surface of the specimen as the substantially rigid base and the stylus are moved with respect to the surface of the specimen along the central axis of the stylus.

Abstract translation: 本发明提供了一种用于进行诸如工件硬度和其它材料性质测量的表面性质测量的装置和方法，其中用于仪器框架失真等的过程中补偿。 该装置包括基本刚性的基座; 触针连接到基本上刚性的基部，触针构造并选择性地定位成与沿着触针的中心轴线的点处的样本表面相互作用; 接近检测器传感器，其耦合到所述基本上刚性的基部，所述接近检测器传感器设置在距离所述样本表面预定距离处，并且可操作以感测所述接近检测器传感器和所述样本表面之间的预定距离; 以及耦合到所述基本上刚性的基座的接近检测器致动器，所述接近检测器致动器可操作以在所述接近检测器传感器和所述样本的表面之间保持所述预定距离，因为所述基本上刚性的基部和所述触针相对于所述接触检测器的表面移动 沿着手写笔的中心轴的样本。

公开(公告)号：US20080028840A1

公开(公告)日：2008-02-07

申请号：US11780208

申请日：2007-07-19

Applicant: Stuart T. Smith ,  Jonathan D. Ellis

Inventor： Stuart T. Smith ,  Jonathan D. Ellis

IPC: G01N3/30

CPC classification number: G01N3/42 ,  G01N2203/0078 ,  G01N2203/0082 ,  G01N2203/0286 ,  G01N2203/0623 ,  G01N2203/0682

Abstract: The present invention provides an apparatus and method for performing surface property measurements, such as workpiece hardness and other material property measurements, with in-process compensation for instrument frame distortion and the like. The apparatus includes a substantially rigid base; a stylus coupled to the substantially rigid base, the stylus configured and selectively positioned to interact with a surface of a specimen at points along a central axis of the stylus; a proximity detector sensor coupled to the substantially rigid base, the proximity detector sensor disposed at a predetermined distance from the surface of the specimen and operable for sensing the predetermined distance between the proximity detector sensor and the surface of the specimen; and a proximity detector actuator coupled to the substantially rigid base, the proximity detector actuator operable for maintaining the predetermined distance between the proximity detector sensor and the surface of the specimen as the substantially rigid base and the stylus are moved with respect to the surface of the specimen along the central axis of the stylus.

Abstract translation: 本发明提供了一种用于进行诸如工件硬度和其它材料性质测量的表面性质测量的装置和方法，其中用于仪器框架失真等的过程中补偿。 该装置包括基本刚性的基座; 触针连接到基本上刚性的基部，触针构造并选择性地定位成与沿着触针的中心轴线的点处的样本表面相互作用; 接近检测器传感器，其耦合到所述基本上刚性的基部，所述接近检测器传感器设置在距离所述样本表面预定距离处，并且可操作以感测所述接近检测器传感器和所述样本表面之间的预定距离; 以及耦合到所述基本上刚性的基座的接近检测器致动器，所述接近检测器致动器可操作以在所述接近检测器传感器和所述样本的表面之间保持所述预定距离，因为所述基本上刚性的基部和所述触针相对于所述接触检测器的表面移动 沿着手写笔的中心轴的样本。

公开(公告)号：US20150077759A1

公开(公告)日：2015-03-19

申请号：US14446790

申请日：2014-07-30

Applicant: Jonathan D. Ellis ,  Christopher Roll ,  Andrew Keene ,  Michael A. Echter

Inventor： Jonathan D. Ellis ,  Christopher Roll ,  Andrew Keene ,  Michael A. Echter

IPC: G01B9/02 ,  G01B11/14 ,  G01B11/26 ,  G01B11/00

CPC classification number: G01B11/26 ,  G01B9/02007 ,  G01B9/02021 ,  G01B9/02032 ,  G01B2290/45

Abstract: An optical probe system has a light source fiber-delivered and the detector fiber-coupled for analyzing carrier fringes using a line sensor to measure displacement and tilt. Simultaneous surface metrology to measure both the front and back surface of the same optic, is enabled provided the two surfaces are substantially parallel to within the measurement range. Alternatively, the front surface can be measured and then subsequently the back surface.

Abstract translation: 光学探针系统具有光纤光纤传送和检测器光纤耦合，用于使用线传感器分析载体条纹以测量位移和倾斜。 只要两个表面基本上平行于测量范围，就可以同时测量同一光学元件的前表面和后表面。 或者，可以测量前表面，然后测量后表面。

公开(公告)号：US20150103356A1

公开(公告)日：2015-04-16

申请号：US14361106

申请日：2012-11-29

Applicant: Jonathan D. Ellis ,  Josephus Wilhelmus Spronck

Inventor： Jonathan D. Ellis ,  Josephus Wilhelmus Spronck

IPC: G01B9/02 ,  G01B11/14

CPC classification number: G01B9/0207 ,  G01B9/02003 ,  G01B9/02015 ,  G01B9/02059 ,  G01B11/14 ,  G01B2290/45 ,  G01B2290/60

Abstract: A compact, balanced, up to three degrees of freedom measuring interferometer which enables fiber delivery of an optical source without periodic nonlinearity, an interferometer system, and method for using an interferometer to measure up to three degrees of freedom is disclosed.

Abstract translation: 公开了一种紧凑的，平衡的，高达三个自由度的测量干涉仪，其使光源不具有周期性非线性的光纤传送，干涉仪系统以及使用干涉仪测量高达三个自由度的方法。

公开(公告)号：US09518816B2

公开(公告)日：2016-12-13

申请号：US14361106

申请日：2012-11-29

Applicant: Jonathan D. Ellis ,  Josephus Wilhelmus Spronck

Inventor： Jonathan D. Ellis ,  Josephus Wilhelmus Spronck

IPC: G01B9/02 ,  G01B11/14

CPC classification number: G01B9/0207 ,  G01B9/02003 ,  G01B9/02015 ,  G01B9/02059 ,  G01B11/14 ,  G01B2290/45 ,  G01B2290/60

Abstract: A compact, balanced, up to three degrees of freedom measuring interferometer having dual beam splitters rotated ninety degrees with respect to each other and a measurement detector including a quadrant detector or multi-core fiber with four detectors which enables fiber delivery of an optical source without periodic error, an interferometer system, and method for using is disclosed.

Abstract translation: 具有相对于彼此旋转90度的双光束分离器的紧凑，平衡，高达三个自由度的测量干涉仪，以及包括具有四个检测器的象限检测器或多芯光纤的测量检测器，其能够光纤输送光源， 公开了周期性误差，干涉仪系统和使用方法。