Surface roughness frequency to control pits on foam core imaging supports
    2.
    发明申请
    Surface roughness frequency to control pits on foam core imaging supports 失效
    表面粗糙度频率来控制泡沫芯成像支架上的凹坑

    公开(公告)号:US20050191568A1

    公开(公告)日:2005-09-01

    申请号:US10788964

    申请日:2004-02-27

    摘要: The present invention relates to an imaging element comprising an imaging layer and a support, wherein the support comprises a core layer having a surface roughness of at least 1.4 microns and a pit camouflaging flange layer between the support and the imaging layer. The present invention also relates to a method of forming an imaging support comprising extruding a polymer layer onto a core layer of surface roughness of at least 1.4 microns, and passing the extruded polymer layer on the core layer between two temperature controlled rollers, one of which comprises a pit camouflaging surface and a method of forming an imaging support comprising extruding a polymer layer, passing the extruded polymer layer between two temperature controlled rollers, one of which comprises a pit camouflaging surface, and laminating the polymer layer onto a core layer with a surface roughness of at least 1.4 microns.

    摘要翻译: 本发明涉及一种包括成像层和支撑体的成像元件,其中所述支撑件包括具有至少1.4微米的表面粗糙度的芯层和在所述支撑件和所述成像层之间的凹坑伪装凸缘层。 本发明还涉及一种形成成像支架的方法,包括将聚合物层挤出到至少1.4微米的表面粗糙度的芯层上,并将挤出的聚合物层在核心层上通过两个温度受控辊之间,其中之一 包括凹坑伪装表面和形成成像支撑体的方法,包括挤出聚合物层,将挤出的聚合物层通过两个温度控制的辊之间,其中一个包括凹坑伪装表面,并将聚合物层层压到芯层上, 表面粗糙度至少为1.4微米。