CHARGED PARTICLE STATE DETERMINATION APPARATUS AND METHOD OF USE THEREOF
    8.
    发明申请
    CHARGED PARTICLE STATE DETERMINATION APPARATUS AND METHOD OF USE THEREOF 审中-公开
    充电颗粒状态测定装置及其使用方法

    公开(公告)号:US20160271424A1

    公开(公告)日:2016-09-22

    申请号:US15167617

    申请日:2016-05-27

    IPC分类号: A61N5/10

    摘要: The invention comprises a system for determining the state of a charged particle beam, such as beam position, intensity, and/or energy. For example, the charged particle beam state is determined at or about a patient undergoing charged particle cancer therapy using one or more film layers designed to emit photons upon passage of a charged particle beam, which yields information on position and/or intensity of the charged particle beam. The emitted photons are used to calculate position of the treatment beam in imaging and/or during tumor treatment. Optionally and preferably, updating a tomography map uses the same hardware with the same alignment used for cancer therapy at proximately the same time.

    摘要翻译: 本发明包括用于确定带电粒子束的状态的系统,例如光束位置,强度和/或能量。 例如,带电粒子束状态是在使用一个或多个设计成在带电粒子束通过时发射光子的一个或多个膜层进行带电粒子癌治疗的患者或周围确定的,其产生关于带电粒子束的位置和/或强度的信息 粒子束。 发射的光子用于计算成像和/或肿瘤治疗期间治疗束的位置。 任选且优选地,更新断层摄影图使用与大致相同的时间使用与癌症治疗相同的比对的相同的硬件。