公开(公告)号：US20250023578A1

公开(公告)日：2025-01-16

申请号：US18739160

申请日：2024-06-10

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: H03M1/66 ,  H04B1/69

Abstract: A wideband signal generator has one or more digital-to-analog converters (DAC), each of the one or more DACs having one or more pipes and a sample rate, a multiplexer to receive analog outputs from at least two pipes from the one or more DACs and multiplex the analog outputs and zero into an output stream, a bandpass filter to receive the output stream and filter out frequency components in the output stream that are outside a target frequency band and produce a radio frequency (RF) output signal in the in the target frequency band, and one or more processors configured to execute code that causes the one or more processors to generate digital samples and transfer the digital samples to the one or more DACs, the digital samples generated to produce analog outputs that cause the RF output signal to match the target RF frequency band.

公开(公告)号：US11940889B2

公开(公告)日：2024-03-26

申请号：US17877829

申请日：2022-07-29

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan

IPC: G06F11/27 ,  G06F1/02 ,  G06F11/22

CPC classification number: G06F11/27 ,  G06F1/022 ,  G06F11/2273

Abstract: A test and measurement system has a test and measurement instrument, a test automation platform, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to receive a waveform created by operation of a device under test, generate one or more tensor arrays, apply machine learning to a first tensor array of the one or more tensor arrays to produce equalizer tap values, apply machine learning to a second tensor array of the one of the one or more tensor arrays to produce predicted tuning parameters for the device under test, use the equalizer tap values to produce a Transmitter and Dispersion Eye Closure Quaternary (TDECQ) value, and provide the TDECQ value and the predicted tuning parameters to the test automation platform. A method of testing devices under test includes receiving a waveform created by operation of a device under test, generating one or more tensor arrays, applying machine learning to a first tensor array of the one or more tensor arrays to produce equalizer tap values, applying machine learning to a second tensor array of the one or more tensor arrays to produce predicted tuning parameters for the device under test, using the equalizer tap values to produce a Transmitter Dispersion Eye Closure Quaternary (TDECQ) value, and providing the TDECQ value and the predicted tuning parameters to a test automation platform.

公开(公告)号：US11907090B2

公开(公告)日：2024-02-20

申请号：US17876817

申请日：2022-07-29

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd

IPC: G06F11/273 ,  G06F11/267

CPC classification number: G06F11/2733 ,  G06F11/267

Abstract: A test and measurement instrument has an input configured to receive a signal from a device under test, a memory, a user interface to allow the user to input settings for the test and measurement instrument, and one or more processors, the one or more processors configured to execute code that causes the one or more processors to: acquire a waveform representing the signal received from the device under test; generate one or more tensor arrays based on the waveform; apply machine learning to the one or more tensor arrays to produce equalizer tap values; and apply equalization to the waveform using the equalizer tap values to produce an equalized waveform; and perform a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test. A method of testing a device under test includes acquiring a waveform representing a signal received from the device under test, generating one or more tensor arrays based on the waveform, applying machine learning to the one or more tensor arrays to produce equalizer tap values, applying the equalizer taps values to the waveform to produce an equalized waveform, performing a measurement on the equalized waveform to produce a value related to a performance requirement for the device under test.

公开(公告)号：US20220393914A1

公开(公告)日：2022-12-08

申请号：US17825981

申请日：2022-05-26

Applicant: Tektronix, Inc.

Inventor： Kan Tan

IPC: H04L25/03

Abstract: A method of equalizing a communication link includes setting a number of coefficients equal to a required number of coefficients, determining a number of pulse responses for a waveform, the number of pulse responses being greater than the number of coefficients, setting all values in a set of values to zero, the set of values having a number of values equal to the number of coefficients, repeating, until all values in the set of values have been assigned, determining a current lowest parameter in a set of given parameters, using a position of the current lowest parameter in the set of given parameters as an index, determining a minimum value between a first term in the set of given parameters multiplied by a main pulse response minus a summation of each parameter in the set of parameters multiplied by each value in the set of values, divided by the current lowest parameter, and a corresponding pulse response, and assigning the minimum value to the value in the set of values having a position equal to position of the current lowest parameter, and determining a value of each coefficient in a set of coefficients by multiplying each value in the set of values with the sign of a corresponding pulse response in the number of pulse responses; defining an equalizer having a number of taps equal to the number of coefficients, each tap having a value based on the corresponding coefficient; and applying the equalizer to a waveform received through the communication link to produce an equalized waveform. A test and measurement device is also disclosed.

公开(公告)号：US20220247648A1

公开(公告)日：2022-08-04

申请号：US17592437

申请日：2022-02-03

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan

IPC: H04L43/045 ,  H04L27/02

Abstract: A system for generating images on a test and measurement device includes a first input for accepting a waveform input signal carrying sequential digital information and an image generator structured to generate a visual image using a segment of the waveform input only when two or more sequential codes of digital information match sequential codes carried in the sequential digital information of the segment of the waveform input. A user-defined state-machine comparator may be used to determine which segments of the waveform input signal are used in the image generation.

公开(公告)号：US10895588B1

公开(公告)日：2021-01-19

申请号：US15958927

申请日：2018-04-20

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Pirooz Hojabri ,  Kan Tan

IPC: G01R1/28 ,  G01R1/30 ,  H04L25/03 ,  H04B15/00

Abstract: A test and measurement system including a plurality of channels and one or more processors. The one or more processors are configured to cause the test and measurement system to receive, via a first channel of the plurality of channels, a positive side of a reference differential signal pair, receive, via a second channel of the plurality of channels, a negative side of the reference differential signal pair, and produce a reference signal based the reference differential signal pair. A combined signal is received, from a combiner, that is a balanced signal produced from the reference differential signal pair. A de-embed filter is generated based on the reference signal and the combined signal and an additional signal is received from the combiner and an effect of the combiner is removed from the additional signal by applying the de-embed filter to the additional signal.

公开(公告)号：US10274520B2

公开(公告)日：2019-04-30

申请号：US14870357

申请日：2015-09-30

Applicant: Tektronix, Inc.

Inventor： John J. Pickerd ,  Kan Tan

IPC: G01R13/02 ,  H03M1/18

Abstract: A test and measurement instrument, including a splitter configured to split an input signal into two split input signals and output each split input signal onto a separate path and a combiner configured to receive and combine an output of each path to reconstruct the input signal. Each path includes an amplifier configured to receive the split input signal and to compress the split input signal with a sigmoid function, a digitizer configured to digitize an output of the amplifier; and at least one processor configured to apply an inverse sigmoid function on the output of the digitizer.

公开(公告)号：US20150350042A1

公开(公告)日：2015-12-03

申请号：US14819798

申请日：2015-08-06

Applicant: Tektronix, Inc.

Inventor： Pavel R. Zivny ,  Maria Agoston ,  Kan Tan

IPC: H04L12/26

CPC classification number: H04L43/087 ,  H04L1/205 ,  H04L43/045

Abstract: Method and systems are described for estimating signal impairments, in particular jitter that includes uncorrelated, non-periodic signal impairments. One system may take the form of an oscilloscope. The estimates may take the form of a probability density function (PDF) for uncorrelated signal impairments that has been modified to replace low probability regions with a known approximation and an extrapolation of the known approximation.

Abstract translation: 描述了用于估计信号损伤的方法和系统，特别是包括不相关的非周期信号损伤的抖动。 一个系统可能采用示波器的形式。 估计可以采用未相关信号损伤的概率密度函数（PDF）的形式，其已经被修改以用已知近似的已知近似和外推来代替低概率区域。

公开(公告)号：US20130237170A1

公开(公告)日：2013-09-12

申请号：US13869708

申请日：2013-04-24

Applicant: TEKTRONIX, INC.

Inventor： John J. Pickerd ,  Kan Tan

IPC: G01R13/02

CPC classification number: G01R13/0218 ,  G01R13/0236 ,  G01R13/0272 ,  G01R19/2506

Abstract: An apparatus and method for splitting a wide band input signal and overlaying multiple frequency bands on each path associated with one or more digitizers. All frequencies from the split signal on each path can be fed to a mixer. The local oscillator of each mixer receives a sum of signals, which can each be set to any arbitrary frequency, as long as an associated matrix determinant of coefficients is non-zero. Each oscillator signal is multiplied by a coefficient, which can represent phase and magnitude, prior to summing the oscillator signals together. Each mixer mixes a combined signal with the input, thereby generating a set of multiple overlaid frequency bands. The digitized signals are processed to substantially reconstruct the original input signal. Thus, the wide band input signal is digitized using multiple individual digitizers. In particular, a system can support two wide band signals using four digitizers of narrower bandwidth.

Abstract translation: 一种用于分割宽带输入信号并在与一个或多个数字化仪相关联的每个路径上重叠多个频带的装置和方法。 来自每个路径上的分割信号的所有频率可以馈送到混频器。 每个混合器的本地振荡器接收信号总和，其可以被设置为任何任意频率，只要系数的相关联的矩阵行列式不为零。 在将振荡器信号相加在一起之前，每个振荡器信号乘以可表示相位和幅度的系数。 每个混合器将组合的信号与输入混合，从而生成一组多个重叠的频带。 处理数字化信号以基本上重建原始输入信号。 因此，使用多个单独的数字化仪将宽带输入信号数字化。 特别地，系统可以使用具有较窄带宽的四个数字化仪来支持两个宽带信号。

公开(公告)号：US20240168471A1

公开(公告)日：2024-05-23

申请号：US18514800

申请日：2023-11-20

Applicant: Tektronix, Inc.

Inventor： Kan Tan ,  John J. Pickerd ,  Sam J. Strickling

IPC: G05B23/02

CPC classification number: G05B23/0254 ,  G05B23/0216

Abstract: A test system includes a repository of component models containing characteristic parameters for each component model, one or more processors to receive a list of selected component models through a user interface to be tested as a combination, access the characteristic parameters for each selected component model, build a tensor image using the characteristic parameters, send the tensor image to one or more trained neural networks to predict interoperability of the combination, and receive a prediction about the combination. A method includes receiving a list of selected component models through a user interface to be tested as a combination, accessing characteristic parameters for the selected component models, building a tensor image for each combination of the selected component models, sending the tensor image to one or more trained neural networks to predict interoperability of the combination, and receiving a prediction about the combination.