公开(公告)号：US20150350042A1

公开(公告)日：2015-12-03

申请号：US14819798

申请日：2015-08-06

Applicant: Tektronix, Inc.

Inventor： Pavel R. Zivny ,  Maria Agoston ,  Kan Tan

IPC: H04L12/26

CPC classification number: H04L43/087 ,  H04L1/205 ,  H04L43/045

Abstract: Method and systems are described for estimating signal impairments, in particular jitter that includes uncorrelated, non-periodic signal impairments. One system may take the form of an oscilloscope. The estimates may take the form of a probability density function (PDF) for uncorrelated signal impairments that has been modified to replace low probability regions with a known approximation and an extrapolation of the known approximation.

Abstract translation: 描述了用于估计信号损伤的方法和系统，特别是包括不相关的非周期信号损伤的抖动。 一个系统可能采用示波器的形式。 估计可以采用未相关信号损伤的概率密度函数（PDF）的形式，其已经被修改以用已知近似的已知近似和外推来代替低概率区域。

公开(公告)号：US20240027507A1

公开(公告)日：2024-01-25

申请号：US18354584

申请日：2023-07-18

Applicant: Tektronix, Inc.

Inventor： Donald J. Dalebroux ,  Alexander Krauska ,  Maria Agoston ,  Alejandro C. Buritica

IPC: G01R31/00 ,  G01R13/00

CPC classification number: G01R31/00 ,  G01R13/00

Abstract: A test and measurement instrument has an arbitrary waveform generator having at least two waveform generators. Each waveform generator includes a signal generator to generate in-phase (I) and quadrature (Q) digital signals according to a selected signal type for a digital constituent output signal, a pulse envelope sequencer to modulate amplitude of the I and Q digital signals, and one or more multipliers to combine the I and Q digital signals with a carrier signal to produce the digital constituent output signal. The arbitrary waveform generator includes a stream manager to produce modulation descriptor words for the waveform generators, a summing block to selectively combine digital constituent output signals to produce a digital multi-constituent output signal, a digital-to-analog converter to convert the digital multi-constituent output signal to an analog output signal, and an internal signal analyzer to receive an analyzer input of one of more of the digital output signals.

公开(公告)号：US12146914B2

公开(公告)日：2024-11-19

申请号：US17745797

申请日：2022-05-16

Applicant: Tektronix, Inc.

Inventor： Maria Agoston ,  John J. Pickerd ,  Kan Tan

IPC: G01R31/319 ,  G01R31/26 ,  H04B17/00 ,  H04L1/20

Abstract: A test and measurement system includes a machine learning system, a test and measurement device including a port configured to connect the test and measurement device to a device under test (DUT), and one or more processors, configured to execute code that causes the one or more processors to: acquire a waveform from the device under test (DUT), transform the waveform into a composite waveform image, and send the composite waveform image to the machine learning system to obtain a bit error ratio (BER) value for the DUT. A method of determining a bit error ratio for a device under test (DUT), includes acquiring one or more waveforms from the DUT, transforming the one or more waveforms into a composite waveform image, and sending the composite waveform image to a machine learning system to obtain a bit error ratio (BER) value for the DUT.

公开(公告)号：US20220373597A1

公开(公告)日：2022-11-24

申请号：US17745797

申请日：2022-05-16

Applicant: Tektronix, Inc.

Inventor： Maria Agoston ,  John J. Pickerd ,  Kan Tan

IPC: G01R31/319 ,  H04B17/00 ,  G01R31/26 ,  H04L1/20

Abstract: A test and measurement system includes a machine learning system, a test and measurement device including a port configured to connect the test and measurement device to a device under test (DUT), and one or more processors, configured to execute code that causes the one or more processors to: acquire a waveform from the device under test (DUT),transform the waveform into a composite waveform image, and send the composite waveform image to the machine learning system to obtain a bit error ratio (BER) value for the DUT. A method of determining a bit error ratio for a device under test (DUT), includes acquiring one or more waveforms from the DUT, transforming the one or more waveforms into a composite waveform image, and sending the composite waveform image to a machine learning system to obtain a bit error ratio (BER) value for the DUT.

公开(公告)号：US09363045B2

公开(公告)日：2016-06-07

申请号：US13706289

申请日：2012-12-05

Applicant: TEKTRONIX, INC.

Inventor： Maria Agoston ,  Pavel R. Zivny

IPC: G01R29/26 ,  H04L1/20

CPC classification number: H04L1/205

Abstract: Methods and systems are described for analyzing signal impairments using a test and measurement instrument. A method may include decomposing aggregate signal impairments into signal impairments that are correlated and uncorrelated to an acquired data pattern. The uncorrelated signal impairments may be further decomposed into periodic signal impairments (e.g., PJ) and non-periodic uncorrelated signal impairments. A PDF of the non-periodic uncorrelated signal impairments may be mathematically integrated, thereby producing an estimated cumulative distribution function (CDF) curve. Random signal impairments may be estimated as an unbound Gaussian distribution. The CDF curve of the non-periodic uncorrelated signal impairments and the unbound Gaussian distribution may be plotted in Q-space on a display device. Non-periodic bounded uncorrelated signal impairments (e.g., NP-BUJ) PDF may then be isolated. Bounded uncorrelated signal impairments PDF may then be synthesized. Complete uncorrelated signal impairments PDF may be synthesized. A synthesis of the decomposed components can be performed at a user-defined bit error rate to generate the total estimated jitter (e.g., TJ@BER or TN@BER).

Abstract translation: 描述了使用测试和测量仪器分析信号损伤的方法和系统。 一种方法可以包括将聚合信号损伤分解成与所获取的数据模式相关并且不相关的信号损伤。 不相关的信号损伤可以进一步分解为周期性信号损伤（例如PJ）和非周期性不相关信号损伤。 非周期性不相关信号损伤的PDF可以在数学上被整合，从而产生估计的累积分布函数（CDF）曲线。 随机信号损伤可以被估计为未结合的高斯分布。 非周期性不相关信号损伤和未结合高斯分布的CDF曲线可以绘制在显示装置上的Q空间中。 然后可以分离非周期性有界不相关信号损伤（例如，NP-BUJ）PDF。 然后可以合成有界的不相关信号损伤PDF。 完全不相关的信号障碍PDF可能被合成。 分解组件的合成可以以用户定义的误码率进行，以产生总估计抖动（例如，TJ @ BER或TN @ BER）。

公开(公告)号：US20130142242A1

公开(公告)日：2013-06-06

申请号：US13706289

申请日：2012-12-05

Applicant: TEKTRONIX, INC.

Inventor： Maria Agoston ,  Pavel R. ZIivny

IPC: H04L1/20

CPC classification number: H04L1/205

Abstract: Methods and systems are described for analyzing signal impairments using a test and measurement instrument. A method may include decomposing aggregate signal impairments into signal impairments that are correlated and uncorrelated to an acquired data pattern. The uncorrelated signal impairments may be further decomposed into periodic signal impairments (e.g., PJ) and non-periodic uncorrelated signal impairments. A PDF of the non-periodic uncorrelated signal impairments may be mathematically integrated, thereby producing an estimated cumulative distribution function (CDF) curve. Random signal impairments may be estimated as an unbound Gaussian distribution. The CDF curve of the non-periodic uncorrelated signal impairments and the unbound Gaussian distribution may be plotted in Q-space on a display device. Non-periodic bounded uncorrelated signal impairments (e.g., NP-BUJ) PDF may then be isolated. Bounded uncorrelated signal impairments PDF may then be synthesized. Complete uncorrelated signal impairments PDF may be synthesized. A synthesis of the decomposed components can be performed at a user-defined bit error rate to generate the total estimated jitter (e.g., TJ@BER or TN@BER).

Abstract translation: 描述了使用测试和测量仪器分析信号损伤的方法和系统。 一种方法可以包括将聚合信号损伤分解成与所获取的数据模式相关并且不相关的信号损伤。 不相关的信号损伤可以进一步分解为周期性信号损伤（例如PJ）和非周期性不相关信号损伤。 非周期性不相关信号损伤的PDF可以在数学上被整合，从而产生估计的累积分布函数（CDF）曲线。 随机信号损伤可以被估计为未结合的高斯分布。 非周期性不相关信号损伤和未结合高斯分布的CDF曲线可以绘制在显示装置上的Q空间中。 然后可以分离非周期性有界不相关信号损伤（例如，NP-BUJ）PDF。 然后可以合成有界的不相关信号损伤PDF。 完全不相关的信号障碍PDF可能被合成。 分解组件的合成可以以用户定义的误码率进行，以产生总估计抖动（例如，TJ @ BER或TN @ BER）。