公开(公告)号：US20240259029A1

公开(公告)日：2024-08-01

申请号：US18629230

申请日：2024-04-08

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Viswanathan NAGARAJAN ,  Aniket DATTA ,  Nithin GOPINATH

IPC: H03M1/10

CPC classification number: H03M1/1014

Abstract: An analog-to-digital converter (ADC) includes: a set of comparators configured to provide comparison results based on an analog signal and respective reference thresholds for comparators of the set of comparators; digitization circuitry configured to provide a digital output code based on the comparison results and a mapping; and calibration circuitry. The calibration circuitry is configured to: receive the comparison results; determine if the analog signal is proximate to one of the respective reference thresholds based on the comparison results; in response to determining the analog signal is proximate to one of the respective reference thresholds, receive ADC values based on different pseudorandom binary sequence (PRBS) values being applied to the analog signal; determine an offset error based on the ADC values; and provide a comparator input offset calibration signal at a calibration circuitry output if the estimated offset error is greater than an offset error threshold.

公开(公告)号：US20240372557A1

公开(公告)日：2024-11-07

申请号：US18772635

申请日：2024-07-15

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Narasimhan RAJAGOPAL ,  Nithin GOPINATH ,  Viswanathan NAGARAJAN ,  Neeraj SHRIVASTAVA ,  Visvesvaraya A. PENTAKOTA ,  Harshit MOONDRA ,  Abhinav CHANDRA

IPC: H03M1/10

Abstract: A circuit includes a nonlinear analog-to-digital converter (ADC) configured to provide a first digital output based on an analog input signal. The circuit also includes a linearization circuit having a lookup table (LUT) memory configured to store initial calibration data. The linearization circuit is coupled to the nonlinear ADC and is configured to: determine updated calibration data based on the initial calibration data; replace the initial calibration data in the LUT memory with the updated calibration data; and provide a second digital output at a linearization circuit output of the linearization circuit based on the first digital output and the updated calibration data.

公开(公告)号：US20230033830A1

公开(公告)日：2023-02-02

申请号：US17390362

申请日：2021-07-30

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Sthanunathan RAMAKRISHNAN ,  Nithin GOPINATH ,  Sai Aditya NURANI ,  Joseph Palackal MATHEW ,  Nagalinga Swamy Basayya AREMALLAPUR

IPC: H03M1/06

Abstract: Aspects of the description provide for an analog-to-digital converter (ADC) operable to convert an analog input signal to an output signal at an output of the ADC. In some examples, the ADC includes multiple sub-ADCs coupled in parallel, each of the multiple sub-ADCs coupled to the output of the ADC and operable to receive the analog input signal. The ADC is configured to operate the sub-ADCs in a consecutive operation loop including a transition phase in which the ADC operates each of the sub-ADCs sequentially for a first number of sequences, an estimation phase in which the ADC operates each of the sub-ADCs sequentially for a second number of sequences following the first number of sequences, and a randomization phase in which the ADC operates subsets of the sub-ADCs for a third number of sequences following the second number of sequences.

公开(公告)号：US20230387933A1

公开(公告)日：2023-11-30

申请号：US17828967

申请日：2022-05-31

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Viswanathan NAGARAJAN ,  Aniket DATTA ,  Nithin GOPINATH

IPC: H03M1/10

CPC classification number: H03M1/1014

Abstract: An analog-to-digital converter (ADC) includes: a set of comparators configured to provide comparison results based on an analog signal and respective reference thresholds for comparators of the set of comparators; digitization circuitry configured to provide a digital output code based on the comparison results and a mapping; and calibration circuitry. The calibration circuitry is configured to: receive the comparison results; determine if the analog signal is proximate to one of the respective reference thresholds based on the comparison results; in response to determining the analog signal is proximate to one of the respective reference thresholds, receive ADC values based on different pseudorandom binary sequence (PRBS) values being applied to the analog signal; determine an offset error based on the ADC values; and provide a comparator input offset calibration signal at a calibration circuitry output if the estimated offset error is greater than an offset error threshold.

公开(公告)号：US20230387932A1

公开(公告)日：2023-11-30

申请号：US17825864

申请日：2022-05-26

Applicant: TEXAS INSTRUMENTS INCORPORATED

Inventor： Narasimhan RAJAGOPAL ,  Nithin GOPINATH ,  Viswanathan NAGARAJAN ,  Neeraj SHRIVASTAVA ,  Visvesvaraya A. PENTAKOTA ,  Harshit MOONDRA ,  Abhinav CHANDRA

IPC: H03M1/10

CPC classification number: H03M1/1014

Abstract: A circuit includes a nonlinear analog-to-digital converter (ADC) configured to provide a first digital output based on an analog input signal. The circuit also includes a linearization circuit having a lookup table (LUT) memory configured to store initial calibration data. The linearization circuit is coupled to the nonlinear ADC and is configured to: determine updated calibration data based on the initial calibration data; replace the initial calibration data in the LUT memory with the updated calibration data; and provide a second digital output at a linearization circuit output of the linearization circuit based on the first digital output and the updated calibration data.