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公开(公告)号:US20220209782A1
公开(公告)日:2022-06-30
申请号:US17133745
申请日:2020-12-24
Applicant: Texas Instruments Incorporated
Inventor: Narasimhan RAJAGOPAL , Chirag Chandrahas SHETTY , Neeraj SHRIVASTAVA , Prasanth K , Eeshan MIGLANI
Abstract: A method of using an analog-to-digital converter system includes receiving a sampled voltage corresponding to one of an input voltage and a known voltage, causing preamplifiers to generate output signals based on the sampled voltage, generating first and second signals based on the output signals, causing a delay-resolving delay-to-digital backend to generate a single-bit digital signal representing an order of receipt of the first and second signals, and adjusting one or more of the preamplifiers based on the digital signal. The disclosure also relates to a system which includes a voltage-to-delay frontend and a delay-resolving backend, and to a method which includes causing a delay comparator to generate a single-bit digital signal representing an order of receipt of input signals, causing the comparator to transmit a residue delay signal to a succeeding comparator, and transmitting a signal to adjust one or more of the preamplifiers based on the digital signal.
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公开(公告)号:US20240372557A1
公开(公告)日:2024-11-07
申请号:US18772635
申请日:2024-07-15
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Narasimhan RAJAGOPAL , Nithin GOPINATH , Viswanathan NAGARAJAN , Neeraj SHRIVASTAVA , Visvesvaraya A. PENTAKOTA , Harshit MOONDRA , Abhinav CHANDRA
IPC: H03M1/10
Abstract: A circuit includes a nonlinear analog-to-digital converter (ADC) configured to provide a first digital output based on an analog input signal. The circuit also includes a linearization circuit having a lookup table (LUT) memory configured to store initial calibration data. The linearization circuit is coupled to the nonlinear ADC and is configured to: determine updated calibration data based on the initial calibration data; replace the initial calibration data in the LUT memory with the updated calibration data; and provide a second digital output at a linearization circuit output of the linearization circuit based on the first digital output and the updated calibration data.
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公开(公告)号:US20230387932A1
公开(公告)日:2023-11-30
申请号:US17825864
申请日:2022-05-26
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Narasimhan RAJAGOPAL , Nithin GOPINATH , Viswanathan NAGARAJAN , Neeraj SHRIVASTAVA , Visvesvaraya A. PENTAKOTA , Harshit MOONDRA , Abhinav CHANDRA
IPC: H03M1/10
CPC classification number: H03M1/1014
Abstract: A circuit includes a nonlinear analog-to-digital converter (ADC) configured to provide a first digital output based on an analog input signal. The circuit also includes a linearization circuit having a lookup table (LUT) memory configured to store initial calibration data. The linearization circuit is coupled to the nonlinear ADC and is configured to: determine updated calibration data based on the initial calibration data; replace the initial calibration data in the LUT memory with the updated calibration data; and provide a second digital output at a linearization circuit output of the linearization circuit based on the first digital output and the updated calibration data.
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公开(公告)号:US20220190856A1
公开(公告)日:2022-06-16
申请号:US17689627
申请日:2022-03-08
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Sarma Sundareswara GUNTURI , Jagannathan VENKATARAMAN , Jawaharlal TANGUDU , Narasimhan RAJAGOPAL , Eeshan MIGLANI
Abstract: Techniques maintaining receiver reliability, including determining a present attenuation level for an attenuator, wherein the attenuation level is set by a gain controller, determining a relative reliability threshold based on the present attenuation level, receiving a radio frequency (RF) signal, determining a voltage level of the received RF signal, comparing the voltage level of the received RF signal to the relative reliability threshold to determine that a reliability condition exists, and overriding, in response to the determination that the reliability condition exists, the present attenuation level set by the gain controller with an override attenuation level based on the present attenuation level.
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公开(公告)号:US20210175914A1
公开(公告)日:2021-06-10
申请号:US17112137
申请日:2020-12-04
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor: Sarma Sundareswara GUNTURI , Jagannathan VENKATARAMAN , Jawaharlal TANGUDU , Narasimhan RAJAGOPAL , Eeshan MIGLANI
Abstract: Techniques maintaining receiver reliability, including determining a present attenuation level for an attenuator, wherein the attenuation level is set by a gain controller, determining a relative reliability threshold based on the present attenuation level, receiving a radio frequency (RF) signal, determining a voltage level of the received RF signal, comparing the voltage level of the received RF signal to the relative reliability threshold to determine that a reliability condition exists, and overriding, in response to the determination that the reliability condition exists, the present attenuation level set by the gain controller with an override attenuation level based on the present attenuation level.
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公开(公告)号:US20190280703A1
公开(公告)日:2019-09-12
申请号:US16249225
申请日:2019-01-16
Applicant: Texas Instruments Incorporated
Inventor: Srinivas Kumar Reddy NARU , Narasimhan RAJAGOPAL , Shagun DUSAD , Viswanathan NAGARAJAN , Visvesvaraya Appala PENTAKOTA
Abstract: In described examples, a stochastic comparator includes a first comparator that compares an input signal and a primary threshold to generate a first signal. A second comparator compares the input signal and the primary threshold to generate a second signal. A decision block generates a control signal in response to the first signal, the second signal and a PRBS (pseudo random binary sequence) signal. A XOR gate generates a detection signal in response the first signal and the second signal.
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公开(公告)号:US20190007071A1
公开(公告)日:2019-01-03
申请号:US16125826
申请日:2018-09-10
Applicant: TEXAS INSTRUMENTS INCORPORATED
CPC classification number: H03M13/39 , H03M1/0641 , H03M1/1014 , H03M1/1245 , H03M1/164 , H03M13/1145
Abstract: A pipeline ADC comprising an ADC segment and a digital backend coupled to the ADC segment. In some examples the ADC is configured to receive an analog signal, generate a first partial digital code representing a first sample of the analog signal, and generate a second partial digital code representing a second sample of the analog signal. In some examples the digital backend is configured to receive the first and second partial digital codes from the ADC segment, generate a combined digital code based at least partially on the first and second partial digital codes, determine a gain error of the ADC segment based at least partially on a first correlation of a PRBS with a difference between the first and second partial digital codes, and apply a first correction to the combined digital code based at least partially on the gain error of the ADC segment.
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