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公开(公告)号：US12000876B2
公开(公告)日：2024-06-04
申请号：US16540546
申请日：2019-08-14
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor： Krishnasawamy Nagaraj , Paul Kimelman , Abhijit Kumar Das
IPC: G01R27/26
CPC classification number: G01R27/2605
Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.
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公开(公告)号：US09846185B2
公开(公告)日：2017-12-19
申请号：US14189447
申请日：2014-02-25
Applicant: Texas Instruments Incorporated
Inventor： Krishnasawamy Nagaraj , Paul Kimelman , Abhijit Kumar Das
IPC: G01R27/26
CPC classification number: G01R27/2605
Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, and the controller causing the time period for capacitance measurements to vary even when the capacitance is constant.
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公开(公告)号：US20180335459A1
公开(公告)日：2018-11-22
申请号：US16048559
申请日：2018-07-30
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor： Krishnasawamy Nagaraj , Paul Kimelman , Abhijit Kumar Das
IPC: G01R27/26
CPC classification number: G01R27/2605
Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.
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公开(公告)号：US09521614B2
公开(公告)日：2016-12-13
申请号：US14034439
申请日：2013-09-23
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor： Leonardo W. Estevez , Paul Kimelman , Avraham Baum
CPC classification number: H04W52/0206 , H04W84/18 , Y02D70/142 , Y02D70/162
Abstract: A method for automation and control of a wireless device in a WiFi environment. The method includes a wireless mobile device configured with a soft access point (softAP) transmitting probe requests to home automation devices and traditional stationary access points. The wireless mobile device periodically wakes up to scan for other services, sends a probe request, authenticates the received probe response from the another device and receives control information via the received probe response.
Abstract translation: 一种用于WiFi环境中的无线设备的自动化和控制的方法。 该方法包括配置有将接入点发送到家庭自动化设备和传统的固定接入点的软接入点（softAP）的无线移动设备。 无线移动设备周期性地唤醒扫描其他服务，发送探测请求，从另一设备认证接收到的探测响应，并通过接收到的探测响应接收控制信息。
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公开(公告)号：US20140314124A1
公开(公告)日：2014-10-23
申请号：US13866301
申请日：2013-04-19
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor： Mikel K. Ash , Krishnaswamy Nagaraj , Paul Kimelman , Steve Vu
IPC: G01K7/18
CPC classification number: G01K7/01
Abstract: Methods and circuits for measuring the temperature of a transistor are disclosed. An embodiment of the method includes, providing a current into a circuit, wherein the circuit is connected to the transistor. A variable resistance is connected between the base and collector of the transistor. The circuit has a first mode and a second mode, wherein the current in the first mode flows into the base of the transistor and through the resistance and the current in the second mode flows into the emitter of the transistor. Voltages in both the first mode and the second mode are measured using different resistance settings. The temperature of the transistor is calculated based on the difference between the different voltages.
Abstract translation: 公开了用于测量晶体管的温度的方法和电路。 该方法的实施例包括：向电路提供电流，其中电路连接到晶体管。 可变电阻连接在晶体管的基极和集电极之间。 电路具有第一模式和第二模式，其中第一模式中的电流流入晶体管的基极并通过电阻，并且第二模式中的电流流入晶体管的发射极。 使用不同的电阻设置来测量第一模式和第二模式中的电压。 基于不同电压之间的差值来计算晶体管的温度。
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Patent Agency Ranking
公开(公告)号：US10466286B2
公开(公告)日：2019-11-05
申请号：US15845898
申请日：2017-12-18
Applicant: Texas Instruments Incorporated
Inventor： Krishnasawamy Nagaraj , Paul Kimelman , Abhijit Kumar Das
IPC: G01R27/26
Abstract: A system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, and the controller causing the time period for capacitance measurements to vary even when the capacitance is constant.
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公开(公告)号：US10422822B2
公开(公告)日：2019-09-24
申请号：US16048559
申请日：2018-07-30
Applicant: TEXAS INSTRUMENTS INCORPORATED
Inventor： Krishnasawamy Nagaraj , Paul Kimelman , Abhijit Kumar Das
IPC: G01R27/26
Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.
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公开(公告)号：US10060959B2
公开(公告)日：2018-08-28
申请号：US14189461
申请日：2014-02-25
Applicant: Texas Instruments Incorporated
Inventor： Krishnasawamy Nagaraj , Paul Kimelman , Abhijit Kumar Das
Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, a noise measurement circuit configured to measure electrical noise on the node, and the controller receiving the measurement of noise from the noise measurement circuit.
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公开(公告)号：US20180106844A1
公开(公告)日：2018-04-19
申请号：US15845898
申请日：2017-12-18
Applicant: Texas Instruments Incorporated
Inventor： Krishnasawamy Nagaraj , Paul Kimelman , Abhijit Kumar Das
IPC: G01R27/26
Abstract: A capacitive sensing system includes a controller, a node connected to one side of a capacitance, the controller configured to measure the capacitance by measuring a time for a voltage across the capacitance to reach a predetermined reference voltage, and the controller causing the time period for capacitance measurements to vary even when the capacitance is constant.
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公开(公告)号：US09335223B2
公开(公告)日：2016-05-10
申请号：US13866301
申请日：2013-04-19
Applicant: Texas Instruments Incorporated
Inventor： Mikel K. Ash , Krishnaswamy Nagaraj , Paul Kimelman , Steve Vu
CPC classification number: G01K7/01
Abstract: Methods and circuits for measuring the temperature of a transistor are disclosed. An embodiment of the method includes, providing a current into a circuit, wherein the circuit is connected to the transistor. A variable resistance is connected between the base and collector of the transistor. The circuit has a first mode and a second mode, wherein the current in the first mode flows into the base of the transistor and through the resistance and the current in the second mode flows into the emitter of the transistor. Voltages in both the first mode and the second mode are measured using different resistance settings. The temperature of the transistor is calculated based on the difference between the different voltages.
Abstract translation: 公开了用于测量晶体管的温度的方法和电路。 该方法的实施例包括：向电路提供电流，其中电路连接到晶体管。 可变电阻连接在晶体管的基极和集电极之间。 电路具有第一模式和第二模式，其中第一模式中的电流流入晶体管的基极并通过电阻，并且第二模式中的电流流入晶体管的发射极。 使用不同的电阻设置来测量第一模式和第二模式中的电压。 基于不同电压之间的差值来计算晶体管的温度。
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