Sample inspection system
    2.
    发明授权

    公开(公告)号:US11624717B2

    公开(公告)日:2023-04-11

    申请号:US17262401

    申请日:2019-07-10

    摘要: There is presented an apparatus for identifying a sample. Such an apparatus may be used to detect unwanted items as part of a security screening system. The apparatus includes a platform for receiving the sample, at least one electromagnetic radiation emitter, a plurality of detectors and a calculator. The electromagnetic radiation emitter is adapted to provide a plurality of conical shells of radiation. Each conical shell has a characteristic propagation axis associated with it. The detectors are arranged to detect radiation diffracted by the sample upon incidence of one or more conical shells of radiation. Each detector is located on the characteristic propagation axis associated with a corresponding conical shell. The calculator is adapted to calculate a parameter of the sample based on the detected diffracted radiation. The parameter includes a lattice spacing of the sample.

    Sample inspection apparatus employing a diffraction detector

    公开(公告)号:US11726048B2

    公开(公告)日:2023-08-15

    申请号:US17945434

    申请日:2022-09-15

    CPC分类号: G01N23/20008 G01N23/205

    摘要: A sample inspection apparatus includes a source of electromagnetic radiation, a beam former for producing a plurality of coaxial and substantially conical shells of radiation, a detection surface and a set of conical shell slot collimators. Each conical shell has a different opening angle. The detection surface is arranged to receive diffracted radiation after incidence of one or more of the conical shells upon the sample to be inspected. The set of conical shell slot collimators is provided at or close to the detection surface which each stare at different annular regions of different corresponding conical shells.

    Sample inspection apparatus employing a diffraction detector

    公开(公告)号:US11467104B2

    公开(公告)日:2022-10-11

    申请号:US17180310

    申请日:2021-02-19

    摘要: A sample inspection apparatus includes a source of electromagnetic radiation, a beam former for producing a substantially conical shell of the radiation with the conical shell being incident on a sample to be inspected, a detection surface arranged to receive diffracted radiation after incidence of the conical shell beam upon the sample to be inspected, and an unfocused collimator provided at or close to the detection surface and having a grid structure formed of cells which each stare at different portions of the conical shell.