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公开(公告)号:US11971371B2
公开(公告)日:2024-04-30
申请号:US17623462
申请日:2020-06-16
发明人: Paul Evans
IPC分类号: G01N23/087 , G01N23/083 , G01N23/20 , G01N23/20008 , G01N23/205 , G01N23/2055 , G01V5/22 , G01V5/222 , G01V5/226 , G21K1/02
CPC分类号: G01N23/20083 , G01N23/083 , G01N23/087 , G01N23/20 , G01N23/20008 , G01N23/205 , G01N23/2055 , G01V5/22 , G01V5/222 , G01V5/224 , G01V5/226 , G01V5/232 , G21K1/02 , G21K1/025 , G01N2223/04 , G01N2223/045 , G01N2223/056 , G01N2223/316 , G01N2223/401
摘要: A sample inspection system contains a source of electromagnetic radiation and an apparatus that includes a beam former, a collimator and an energy resolving detector. The beam former is adapted to receive electromagnetic radiation from the source to provide a polygonal shell beam formed of at least three walls of electromagnetic radiation. The collimator has a plurality of channels adapted to receive diffracted or scattered radiation at an angle. The energy resolving detector is arranged to detect radiation diffracted or scattered by a sample upon incidence of the polygonal shell beam onto the sample and transmitted by the collimator.
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公开(公告)号:US11624717B2
公开(公告)日:2023-04-11
申请号:US17262401
申请日:2019-07-10
发明人: Paul Evans , Keith Rogers
IPC分类号: G01N23/205 , G01N23/20008 , G01V5/00
摘要: There is presented an apparatus for identifying a sample. Such an apparatus may be used to detect unwanted items as part of a security screening system. The apparatus includes a platform for receiving the sample, at least one electromagnetic radiation emitter, a plurality of detectors and a calculator. The electromagnetic radiation emitter is adapted to provide a plurality of conical shells of radiation. Each conical shell has a characteristic propagation axis associated with it. The detectors are arranged to detect radiation diffracted by the sample upon incidence of one or more conical shells of radiation. Each detector is located on the characteristic propagation axis associated with a corresponding conical shell. The calculator is adapted to calculate a parameter of the sample based on the detected diffracted radiation. The parameter includes a lattice spacing of the sample.
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公开(公告)号:US09921173B2
公开(公告)日:2018-03-20
申请号:US14761315
申请日:2014-01-02
发明人: Paul Evans , Keith Rogers
IPC分类号: G01N23/20 , G01N23/205 , G01N23/04 , H04N5/232 , H04N5/32
CPC分类号: G01N23/2055 , G01N23/046 , G01N23/20008 , G01N23/20083 , G01N2223/419 , G01N2223/64 , H04N5/23293 , H04N5/32
摘要: A sample (106) is irradiated with electromagnetic radiation such as X-Rays and diffraction data is sampled at inner and outer caustic rims formed at a sensor surface (108) and defined by a continuum of Debye cones (130, 132) formed by diffraction of the incident radiation. Intensities of the inner and outer rims while translating and rotating the sample are converted using a tomographic technique into X-ray diffraction images and material discrimination is also possible.
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公开(公告)号:US11726048B2
公开(公告)日:2023-08-15
申请号:US17945434
申请日:2022-09-15
发明人: Paul Evans , Keith Rogers
IPC分类号: G01N23/00 , G01N23/20008 , G01N23/205
CPC分类号: G01N23/20008 , G01N23/205
摘要: A sample inspection apparatus includes a source of electromagnetic radiation, a beam former for producing a plurality of coaxial and substantially conical shells of radiation, a detection surface and a set of conical shell slot collimators. Each conical shell has a different opening angle. The detection surface is arranged to receive diffracted radiation after incidence of one or more of the conical shells upon the sample to be inspected. The set of conical shell slot collimators is provided at or close to the detection surface which each stare at different annular regions of different corresponding conical shells.
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公开(公告)号:US11467104B2
公开(公告)日:2022-10-11
申请号:US17180310
申请日:2021-02-19
发明人: Paul Evans , Keith Rogers
IPC分类号: G01N23/207 , G01N23/20008 , G01N23/205
摘要: A sample inspection apparatus includes a source of electromagnetic radiation, a beam former for producing a substantially conical shell of the radiation with the conical shell being incident on a sample to be inspected, a detection surface arranged to receive diffracted radiation after incidence of the conical shell beam upon the sample to be inspected, and an unfocused collimator provided at or close to the detection surface and having a grid structure formed of cells which each stare at different portions of the conical shell.
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公开(公告)号:US10948432B2
公开(公告)日:2021-03-16
申请号:US16549028
申请日:2019-08-23
发明人: Paul Evans , Keith Rogers
IPC分类号: G01N23/20008 , G01N23/205
摘要: A sample inspection apparatus irradiates a sample with a conical shell of X-ray or similar radiation generating a plurality of Debye rings originating from a circular path on the sample. The apparatus is provided with two detectors. A first detector receives diffracted radiation and a second detector receives radiation which is transmitted through a coded aperture provided at a detection surface of the first detector.
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