公开(公告)号：US20240242955A1

公开(公告)日：2024-07-18

申请号：US18436697

申请日：2024-02-08

申请人： THE TRUSTEES OF INDIANA UNIVERSITY

发明人： David E. CLEMMER ,  Martin F. JARROLD ,  Tarick J. EL-BABA ,  Corinne A. LUTOMSKI

IPC分类号： H01J49/16 ,  H01J49/00 ,  H01J49/04 ,  H01J49/26

CPC分类号： H01J49/165 ,  H01J49/0031 ,  H01J49/0468 ,  H01J49/26

摘要： A method for analyzing charged particles may include generating, in or into an ion source region, charged particles from a sample of particles, causing the charged particles to enter a mass spectrometer from the ion source region at each of a plurality of differing physical and/or chemical conditions in a range of physical and/or chemical conditions in which the sample particles undergo structural changes, controlling the mass spectrometer to measure at least the charge magnitudes of the generated charged particles at each of the plurality of differing physical and/or chemical conditions, determining, with a processor, an average charge magnitude of the generated charged particles at each of the plurality of differing physical and/or chemical conditions based on the measured charge magnitudes, and determining, with the processor, an average charge magnitude profile over the range of physical and/or chemical conditions based on the determined average charge magnitudes.

公开(公告)号：US20220216047A1

公开(公告)日：2022-07-07

申请号：US17602000

申请日：2020-04-22

申请人： THE TRUSTEES OF INDIANA UNIVERSITY

发明人： David E. CLEMMER ,  Martin F. JARROLD ,  Tarick J. EL-BABA ,  Corinne A. LUTOMSKI

IPC分类号： H01J49/16 ,  H01J49/00 ,  H01J49/04 ,  H01J49/26

摘要： A method for analyzing charged particles may include generating, in or into an ion source region, charged particles from a sample of particles, causing the charged particles to enter a mass spectrometer from the ion source region at each of a plurality of differing physical and/or chemical conditions in a range of physical and/or chemical conditions in which the sample particles undergo structural changes, controlling the mass spectrometer to measure at least the charge magnitudes of the generated charged particles at each of the plurality of differing physical and/or chemical conditions, determining, with a processor, an average charge magnitude of the generated charged particles at each of the plurality of differing physical and/or chemical conditions based on the measured charge magnitudes, and determining, with the processor, an average charge magnitude profile over the range of physical and/or chemical conditions based on the determined average charge magnitudes.