公开(公告)号：US11946879B2

公开(公告)日：2024-04-02

申请号：US17275935

申请日：2019-09-13

Applicant: TOKYO INSTITUTE OF TECHNOLOGY

Inventor： Mutsuko Hatano ,  Takayuki Iwasaki ,  Nobuhiko Nishiyama ,  Yuta Masuyama ,  Takuya Murooka

IPC: G01N22/00 ,  H01L27/144 ,  H01L31/028 ,  H01L31/105

CPC classification number: G01N22/00 ,  H01L27/1446 ,  H01L31/028 ,  H01L31/105

Abstract: A thin film has a band gap of 2.2 eV or more and in which a crystal includes an atomic vacancy and an electron, a microwave irradiation system configured to irradiate the thin film with a microwave in response to driving from outside, an excitation unit configured to excite the electron included in the thin film in response to driving from outside, and a detector configured to detect, as an electric signal, at least either one of an intensity of light outputted from the thin film when the electron transitions from an excited state to a ground state and a change in conductivity of the thin film based on excitation.

公开(公告)号：US11448729B2

公开(公告)日：2022-09-20

申请号：US16314292

申请日：2017-06-28

Applicant: NATIONAL UNIVERSITY CORPORATION YOKOHAMA NATIONAL UNIVERSITY ,  TOKYO INSTITUTE OF TECHNOLOGY

Inventor： Toshihiko Baba ,  Nobuhiko Nishiyama

IPC: G01S7/481 ,  G02B6/124 ,  G01S17/89 ,  G02B6/34 ,  G02F1/29 ,  G02B6/12 ,  G02B5/18

Abstract: In a light deflection device and a lidar device, a parallel operation can be realized with a simple constitution, so as to avoid enlargement or complication of a system. The reflection angle of the light deflection device depends on a wavelength and a refractive index, so that light beams with respective wavelengths different from each other are simultaneously and parallelly deflected in directions of deflection angles each defined by the wavelength and the refractive index. The light beams with the plural wavelengths different from each other are deflected at the different deflection angles each defined by each wavelength and the refractive index, so that they can be deflected simultaneously and parallelly. The plural deflected light beams can be distinguished from each other based on the difference in the wavelength and the deflection angle of the light, even in the simultaneous and parallel operation.