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公开(公告)号：US20220099835A1
公开(公告)日：2022-03-31
申请号：US17481587
申请日：2021-09-22
Applicant: TOPCON Corporation
Inventor： Shugo Akiyama
Abstract: A scan using a pulsed distance measuring light with two wavelengths of which reflectances are different with respect to a content of a nitrogen by a laser scanner, the two wavelengths are separated, lights are received, a distance measurement value and a light amount are detected for each pulsed distance measuring light and for each of the two wavelengths, a height of a crop is detected based on the distance measurement value, a received light amount ratio of the two wavelengths is detected, and a growth condition of the crop is detected based on the detected height and the received light amount ratio.
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公开(公告)号：US10408678B2
公开(公告)日：2019-09-10
申请号：US15569493
申请日：2016-04-20
Applicant: TOPCON CORPORATION
Inventor： Peng Zhao , Shugo Akiyama , Issei Hanya
Abstract: To provide a plant sensor device capable of obtaining a parameter to determine a growth status other than a spectroscopy vegetation index without increasing its configuration. The plant sensor device includes a light emission part for emitting a measurement light to irradiate a target plant, a light receiving part for receiving a reflected light from the target plant, and a control section for controlling the light emission part and light receiving part. The control section determines a spectroscopy vegetation index of the target plant by obtaining a reflection rate of the target plant based on the measurement light and reflected light. The control section calculates a distance from the target plant to the light emission part in accordance with the measurement light and reflected light, and determines a plant height of the target plant based on the distance.
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公开(公告)号：US10345232B2
公开(公告)日：2019-07-09
申请号：US16065971
申请日：2016-12-21
Applicant: TOPCON CORPORATION
Inventor： Kaoru Kumagai , Shugo Akiyama , Issei Hanya , Peng Zhao , Masashi Funahashi , Yoshimitsu Nakajima , Yuji Shirane
IPC: G01N21/35 , G01N33/38 , G01N21/27 , G01N21/359
Abstract: A method of measuring a state of concrete includes emitting an irradiation light to the concrete, the irradiation light including a wavelength range of near infrared light related to concrete measurement; and receiving a reflection light of the irradiation light P reflected on the concrete. At least five wavelengths λ1 to λ5, λ6 to λ10, different from each other by PLS regression analysis within a wavelength range of 900 nm to 2500 nm of absorption spectrum, are determined, and a degree of neutralization of the concrete caused by calcium hydroxide and a concentration of chloride ion is estimated.
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Patent Agency Ranking
公开(公告)号：US20230296500A1
公开(公告)日：2023-09-21
申请号：US18120743
申请日：2023-03-13
Applicant: TOPCON CORPORATION
Inventor： Shun Yamauchi , Shugo Akiyama
CPC classification number: G01N21/31 , G01N33/0098 , G01N2201/127 , G01N2201/062
Abstract: A grain-component sensor comprises a white LED for emitting a white light as a light emission source, a sample holder in which a sample is filled, a spectroscope for receiving a reflected light from the sample and performing a spectroscopic analysis, and as optical filter provided on an optical path between the white LED and the sample holder, the optical filter has an optical characteristic that is a transmittance of substantially 100% in a wavelength band from 950 nm to 1100 nm and cuts a light in a visible light region to substantially 0%, a light emitted from the white LED transmits through the optical filter and is irradiated to the sample as a detection light in a wavelength band from 950 nm to 1100 nm, and a diffused reflected light from the sample is condensed by a condenser lens and is entered the spectroscope.
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公开(公告)号：US11009453B2
公开(公告)日：2021-05-18
申请号：US16088131
申请日：2017-03-24
Applicant: TOPCON CORPORATION , MAEDA CORPORATION
Inventor： Issei Hanya , Shugo Akiyama , Ryosuke Tomizawa , Naoto Kasori , Yoshimitsu Nakajima , Yuji Shirane , Satoshi Suenaga
Abstract: A spectral curve acquiring device comprising: a light receiving optical system (6) for irradiating an irradiating light, a light receiving optical system (8) for dispersing and receiving a reflected irradiating light reflected by an object to be measured (7), a distance meter (4) for measuring a distance to the object to be measured, a storage module (25) for storing a plurality of reference spectral curves prepared based on a light receiving intensity for each wavelength at the time of measuring a white reference plate with different distances, and a control arithmetic module (24), wherein the control arithmetic module obtains a light receiving intensity of the dispersed reflected irradiating light for each wavelength based on the reference spectral curve corresponding to a distance to be measured, corrects a measurement spectral curve prepared based on the light receiving intensity, and prepares a spectral reflectance curve.
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公开(公告)号：US11195016B2
公开(公告)日：2021-12-07
申请号：US16140595
申请日：2018-09-25
Applicant: TOPCON CORPORATION
Inventor： Daisuke Sasaki , Koji Onishi , Masaki Takanashi , Kiyoyasu Takahashi , Shugo Akiyama
Abstract: A pile head analysis system captures a plurality of images of a construction site including a pile using a camera mounted on an unmanned aerial vehicle (UAV), acquires the images, generates a three-dimensional model of the construction site, detects a pile head from the three-dimensional model, and determines consistency between the detected pile head and preliminarily acquired design information.
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7.发明申请公开(公告)号：US20200300753A1
公开(公告)日：2020-09-24
申请号：US16088131
申请日：2017-03-24
Applicant: TOPCON Corporation , MAEDA CORPORATION
Inventor： Issei Hanya , Shugo Akiyama , Ryosuke Tomizawa , Naoto Kasori , Yoshimitsu Nakajima , Yuji Shirane , Satoshi Suenaga
Abstract: A spectral curve acquiring device comprising: a light receiving optical system (6) for irradiating an irradiating light, a light receiving optical system (8) for dispersing and receiving a reflected irradiating light reflected by an object to be measured (7), a distance meter (4) for measuring a distance to the object to be measured, a storage module (25) for storing a plurality of reference spectral curves prepared based on a light receiving intensity for each wavelength at the time of measuring a white reference plate with different distances, and a control arithmetic module (24), wherein the control arithmetic module obtains a light receiving intensity of the dispersed reflected irradiating light for each wavelength based on the reference spectral curve corresponding to a distance to be measured, corrects a measurement spectral curve prepared based on the light receiving intensity, and prepares a spectral reflectance curve.
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公开(公告)号：US10690499B2
公开(公告)日：2020-06-23
申请号：US16139646
申请日：2018-09-24
Applicant: TOPCON CORPORATION
Inventor： Daisuke Sasaki , Koji Onishi , Masaki Takanashi , Kiyoyasu Takahashi , Shugo Akiyama
Abstract: An analysis system for analyzing inclination of column members includes a laser scanner, a server, and an information terminal. The server includes a data acquisition unit configured to acquire three-dimensional point cloud data of the column members generated by the laser scanner, a surface detector configured to detect surfaces of the column members based on the three-dimensional point cloud data, and an inclination analyzer configured to analyze inclination of the column members by calculating inclination of the surfaces detected by the surface detector.
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