Method for Characterising a Product by Means of Topological Spectral Analysis
    2.
    发明申请
    Method for Characterising a Product by Means of Topological Spectral Analysis 有权
    通过拓扑光谱分析表征产品的方法

    公开(公告)号:US20160061720A1

    公开(公告)日:2016-03-03

    申请号:US14888270

    申请日:2014-04-25

    CPC classification number: G01N21/359 G01N21/3577

    Abstract: The invention relates to a method for generating and optimising a bank of spectral data that can be used in a method for characterising a target product by means of topological spectral analysis based on a limited number of available standards, the method consisting of a first step of performing the same spectral analysis on the standards, and, from the spectra obtained, forming a bank of spectral data A at multiple wavelengths and/or wavelength ranges.

    Abstract translation: 本发明涉及一种用于生成和优化光谱数据库的方法,该方法可以用于基于有限数量的可用标准的拓扑光谱分析的用于表征目标产品的方法,所述方法包括第一步骤 对标准进行相同的光谱分析,并且从所获得的光谱中,在多个波长和/或波长范围内形成一组光谱数据A.

    Method for characterizing a product by means of topological spectral analysis

    公开(公告)号:US10241040B2

    公开(公告)日:2019-03-26

    申请号:US14888262

    申请日:2014-04-25

    Abstract: The invention relates to a method for characterizing a target product, including the steps of: (a) forming a bank of spectral data comprising samples; (b) having measured characteristics and spectra; (c) performing a spectral analysis of the target product and comparing the spectrum obtained with the spectral data in the data bank; (d) identifying the “near neighbor” points of the target product; and (e) performing a topological calculation of the characteristic of the target product as a function of the corresponding characteristics of the near neighbor points, based on a weighting linked to the inverse of the distance between the target product and the near neighbor points.

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