Photon-counting apparatus
    1.
    发明授权

    公开(公告)号:US10185044B2

    公开(公告)日:2019-01-22

    申请号:US14956983

    申请日:2015-12-02

    摘要: According to one embodiment, a photon-counting apparatus includes an X-ray tube, an X-ray detector, a support mechanism, setting circuitry and data acquisition circuitry. The X-ray detector is configured to repetitively detect an X-ray photon generated by the X-ray tube, and repetitively generate an electrical signal corresponding to the repetitively detected X-ray photon. The support mechanism is configured to support the X-ray tube to be rotatable about a rotation axis. Setting circuitry configured to set one of a time length of a readout period and a readout cycle per unit time for the electrical signal. Data acquisition circuitry is configured to count a count number of electrical signals from the X-ray detector in accordance with the set one of the time length and readout cycle.

    X-ray computed tomography apparatus and X-ray detector
    2.
    发明授权
    X-ray computed tomography apparatus and X-ray detector 有权
    X射线计算机断层摄影仪和X射线探伤仪

    公开(公告)号:US09547090B2

    公开(公告)日:2017-01-17

    申请号:US14802176

    申请日:2015-07-17

    IPC分类号: G01T1/24 H04N5/32 G01T1/29

    摘要: An X-ray computed tomography apparatus according to an embodiment includes an X-ray detector that includes a first semiconductor chip including a plurality of elements configured to convert X-rays into an electrical signal, a substrate configured to collect the electrical signal from each element, a second semiconductor chip that is provided between the first semiconductor chip and the substrate and is formed of the same material as that of the first semiconductor chip, a plurality of first electrodes configured to couple each element of the first semiconductor chip to the second semiconductor chip, and a plurality of second electrodes that are configured to couple the second semiconductor chip to the substrate and are larger than the first electrodes. The second semiconductor chip wires the first electrodes and the second electrodes on a one-to-one basis.

    摘要翻译: 根据实施例的X射线计算机断层摄影装置包括:X射线检测器,其包括:第一半导体芯片,包括被配置为将X射线转换成电信号的多个元件;被配置为从每个元件收集电信号的基板 ,第二半导体芯片,设置在所述第一半导体芯片和所述基板之间,并且由与所述第一半导体芯片相同的材料形成;多个第一电极,被配置为将所述第一半导体芯片的每个元件耦合到所述第二半导体 芯片和多个第二电极,其被配置为将第二半导体芯片耦合到基板并且大于第一电极。 所述第二半导体芯片在一对一的基础上对所述第一电极和所述第二电极进行导线。

    X-ray CT apparatus and X-ray detector

    公开(公告)号:US11033245B2

    公开(公告)日:2021-06-15

    申请号:US15589205

    申请日:2017-05-08

    摘要: In one embodiment, an X-ray CT apparatus includes: an X-ray detector equipped with a plurality of detection elements each of which is configured to output an X-ray signal in accordance with X-rays passing through an object; and a scan controller configured to acquire X-ray signals in each of a first mode and a second mode in one scan by switching between the first mode and the second mode, the first mode being a mode of acquiring high-resolution data which are respective X-ray signals outputted from the plurality of detection elements, the second mode being a mode of acquiring normal-resolution data in which X-ray signals outputted from some of the plurality of detection elements are integrated.

    X-ray computed tomography apparatus

    公开(公告)号:US10945683B2

    公开(公告)日:2021-03-16

    申请号:US15801476

    申请日:2017-11-02

    IPC分类号: A61B6/03 A61B6/00

    摘要: According to one embodiment, an X-ray computed tomography apparatus includes processing circuitry. The processing circuitry sets a parameter of an examination protocol. Based on the set parameter, the processing circuitry determines the number of acquisition views and the number of reconstruction views of projection data. The processing circuitry acquires first projection data corresponding to the number of acquisition views. The processing circuitry calculates second projection data corresponding to the number of reconstruction views based on the first projection data. The processing circuitry reconstructs a CT image based on the second projection data.