MAGNETIC DETECTION CIRCUIT, MRAM AND OPERATION METHOD THEREOF

    公开(公告)号:US20190140020A1

    公开(公告)日:2019-05-09

    申请号:US15875140

    申请日:2018-01-19

    摘要: A magnetic detection circuit for a magnetic random access memory (MRAM) is provided. The magnetic detection circuit includes a sensing array including a plurality of sensing cells and a controller. Each of the sensing cells includes a first magnetic tunnel junction (MTJ) device. The controller is configured to access the first MRAM cells to detect the external magnetic field strength of the MRAM. The controller determines whether to stop the write operation of a plurality of memory cells of the MRAM according to the external magnetic field strength of the MRAM, and each of the memory cells includes a second MTJ device. The first MTJ device is smaller than the second MTJ device.

    APPARATUS AND METHOD FOR METROLOGY
    3.
    发明申请

    公开(公告)号:US20190145756A1

    公开(公告)日:2019-05-16

    申请号:US15908201

    申请日:2018-02-28

    IPC分类号: G01B11/06 G03F7/20

    摘要: A method of performing metrology analysis of a thin film includes coupling a radiation into an optical element disposed adjacent to a surface of the thin film. The radiation is coupled such that the radiation is totally internally reflected at an interface between the optical element and the thin film. An evanescent radiation generated at the interface penetrates the thin film. The method furthers include analyzing the evanescent radiation scattered by the thin film to obtain properties of the thin film.

    METHOD FOR WRITING TO MAGNETIC RANDOM ACCESS MEMORY

    公开(公告)号:US20200312393A1

    公开(公告)日:2020-10-01

    申请号:US16902134

    申请日:2020-06-15

    IPC分类号: G11C11/16

    摘要: A method of manufacturing an array of magnetic random access memory cells includes writing to a magnetic random access memory cell. The writing to a memory cell includes determining an optimum write current for the array of memory cells, and applying the optimum write current to a first memory cell in the array. A first read current is applied to the first memory cell to determine whether a magnetic orientation of the first memory cell has changed in response to applying the optimum write current. A second write current is applied to the first memory cell when the magnetic orientation of the first memory cell has not changed. The second write current is different from the optimum write current. A second read current is applied to the first memory cell to determine whether the magnetic orientation of the first memory cell changed in response to applying the second write current.

    MAGNETIC DETECTION CIRCUIT, MRAM AND OPERATION METHOD THEREOF

    公开(公告)号:US20200286951A1

    公开(公告)日:2020-09-10

    申请号:US16882600

    申请日:2020-05-25

    摘要: A magnetic detection circuit for a magnetic random access memory (MRAM) is provided. The magnetic detection circuit includes a sensing array and a controller. The sensing array includes a plurality of sensing cells, and each of plurality of sensing cells includes a first magnetic tunnel junction (MTJ) device. The controller is configured to periodically write and read the sensing cells to obtain a difference between first data written to the sensing cells and second data read from the sensing cells. When the difference between the first data and the second data is greater than a threshold value, the controller is configured to stop a write operation of a plurality of memory cells of the MRAM until the difference between the first data and the second data is less than the threshold value.

    METHOD FOR WRITING TO MAGNETIC RANDOM ACCESS MEMORY

    公开(公告)号:US20200020375A1

    公开(公告)日:2020-01-16

    申请号:US16377036

    申请日:2019-04-05

    IPC分类号: G11C11/16

    摘要: A method of manufacturing an array of magnetic random access memory cells includes writing to a magnetic random access memory cell. The writing to a memory cell includes determining an optimum write current for the array of memory cells, and applying the optimum write current to a first memory cell in the array. A first read current is applied to the first memory cell to determine whether a magnetic orientation of the first memory cell has changed in response to applying the optimum write current. A second write current is applied to the first memory cell when the magnetic orientation of the first memory cell has not changed. The second write current is different from the optimum write current. A second read current is applied to the first memory cell to determine whether the magnetic orientation of the first memory cell changed in response to applying the second write current.