Semiconductor device and method of monitoring a temperature thereof

    公开(公告)号:US12068747B2

    公开(公告)日:2024-08-20

    申请号:US17718456

    申请日:2022-04-12

    CPC classification number: H03K3/011 H03F3/45475

    Abstract: A semiconductor device includes a temperature-independent current generator that generates a reference current substantially independent of temperature and a mirror current that is a substantial duplicate of the reference current, a pulse signal generator that samples the mirror current so as to generate a pulse signal, and a counter that obtains a number of pulse signals generated by the pulse signal generator, that permits the pulse signal generator to generate a pulse signal when it is determined thereby that the number of pulse signals obtained thereby is less than a predetermined threshold value, and that inhibits the pulse signal generator from generating a pulse signal when it is determined thereby that the number of pulse signals obtained thereby is equal to the predetermined threshold value. A method for monitoring a temperature of the semiconductor device is also disclosed.

    TRANSISTOR CELLS FOR LONGER CHANNEL TRANSISTORS

    公开(公告)号:US20230178605A1

    公开(公告)日:2023-06-08

    申请号:US17545825

    申请日:2021-12-08

    CPC classification number: H01L29/0696 H01L27/088 H01L29/401

    Abstract: A device including at least one transistor cell including metal-oxide semiconductor field-effect transistors each having drain/source terminals and a channel length. The at least one transistor cell includes a first number of transistors of the metal-oxide semiconductor field-effect transistors connected in series, with one of the drain/source terminals of one of the first number of transistors connected to one of the drain/source terminals of another one of the first number of transistors and gates of the first number of transistors connected together. The at least one transistor cell configured to be used to provide a transistor having a longer channel length than the channel length of each of the metal-oxide semiconductor field-effect transistors.

    LDO/Band Gap Reference Circuit
    4.
    发明申请

    公开(公告)号:US20230063492A1

    公开(公告)日:2023-03-02

    申请号:US17458707

    申请日:2021-08-27

    Abstract: Systems and methods as described herein may take a variety of forms. In one example, systems and methods are provided for a circuit for powering a voltage regulator. A voltage regulator circuit has an output electrically coupled to a gate of an output driver transistor, the output driver transistor having a first terminal electrically coupled to a voltage source and a second terminal electrically coupled to a first terminal of a voltage divider, the voltage divider having an second terminal electrically coupled to ground, and the voltage divider having an output of a stepped down voltage. A power control circuitry transistor has a first terminal electrically coupled to the voltage source, the power control circuitry transistor having a second terminal electrically coupled to the gate terminal of the output driver transistor, and the power control circuitry transistor having a gate terminal electrically coupled to a status voltage signal.

    Semiconductor Device and Method of Monitoring a Temperature Thereof

    公开(公告)号:US20240364315A1

    公开(公告)日:2024-10-31

    申请号:US18770826

    申请日:2024-07-12

    CPC classification number: H03K3/011 H03F3/45475

    Abstract: A semiconductor device includes a temperature-independent current generator that generates a reference current substantially independent of temperature and a mirror current that is a substantial duplicate of the reference current, a pulse signal generator that samples the mirror current so as to generate a pulse signal, and a counter that obtains a number of pulse signals generated by the pulse signal generator, that permits the pulse signal generator to generate a pulse signal when it is determined thereby that the number of pulse signals obtained thereby is less than a predetermined threshold value, and that inhibits the pulse signal generator from generating a pulse signal when it is determined thereby that the number of pulse signals obtained thereby is equal to the predetermined threshold value. A method for monitoring a temperature of the semiconductor device is also disclosed.

    LDO/Band Gap Reference Circuit
    7.
    发明公开

    公开(公告)号:US20230244258A1

    公开(公告)日:2023-08-03

    申请号:US18296474

    申请日:2023-04-06

    CPC classification number: G05F1/468 G05F3/262 G05F1/461 G05F1/465 G05F3/30

    Abstract: Systems and methods as described herein may take a variety of forms. In one example, systems and methods are provided for a circuit for powering a voltage regulator. A voltage regulator circuit has an output electrically coupled to a gate of an output driver transistor, the output driver transistor having a first terminal electrically coupled to a voltage source and a second terminal electrically coupled to a first terminal of a voltage divider, the voltage divider having an second terminal electrically coupled to ground, and the voltage divider having an output of a stepped down voltage. A power control circuitry transistor has a first terminal electrically coupled to the voltage source, the power control circuitry transistor having a second terminal electrically coupled to the gate terminal of the output driver transistor, and the power control circuitry transistor having a gate terminal electrically coupled to a status voltage signal.

    Semiconductor Device and Method of Monitoring a Temperature Thereof

    公开(公告)号:US20230049398A1

    公开(公告)日:2023-02-16

    申请号:US17718456

    申请日:2022-04-12

    Abstract: A semiconductor device includes a temperature-independent current generator that generates a reference current substantially independent of temperature and a mirror current that is a substantial duplicate of the reference current, a pulse signal generator that samples the mirror current so as to generate a pulse signal, and a counter that obtains a number of pulse signals generated by the pulse signal generator, that permits the pulse signal generator to generate a pulse signal when it is determined thereby that the number of pulse signals obtained thereby is less than a predetermined threshold value, and that inhibits the pulse signal generator from generating a pulse signal when it is determined thereby that the number of pulse signals obtained thereby is equal to the predetermined threshold value. A method for monitoring a temperature of the semiconductor device is also disclosed.

    LOW-DROPOUT (LDO) VOLTAGE REGULATOR

    公开(公告)号:US20220365550A1

    公开(公告)日:2022-11-17

    申请号:US17456934

    申请日:2021-11-30

    Abstract: A middle-range (mid) low dropout (LDO) voltage has both sinking and sourcing current capability. The mid LDO can provide a voltage reference in active mode and power mode for core only design to work in a Safe Operating Area (SOA). The output of mid LDO can track TO power and/or core power dynamically. The mid LDO can comprise a voltage reference generator and a power-down controller connected to an amplifier, which output is connected to a decoupling capacitor. The provision of a high ground signal allows the mid LDO provide the sinking and sourcing currents.

    Bandgap reference circuit
    10.
    发明授权

    公开(公告)号:US11086348B2

    公开(公告)日:2021-08-10

    申请号:US16682683

    申请日:2019-11-13

    Abstract: A bandgap reference (BGR) circuit is provided. The BGR circuit includes a first node, a second node, and a third node. A first resistive element is connected between the second node and the third node. The BGR circuit is operative to provide a reference voltage as an output. The BGR circuit further includes a current shunt path connected between the first node and the third node, the current shunt path being operable to regulate a voltage drop across the first resistive element.

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