公开(公告)号：US20230251699A1

公开(公告)日：2023-08-10

申请号：US18105736

申请日：2023-02-03

Applicant: Tektronix, Inc.

Inventor： Madhusudan Acharya ,  Yogesh M. Pai ,  Krishna N H Sri ,  Anthony B. Ambrose ,  Blair Battye ,  Dallas J. Mohler

IPC: G06F1/30 ,  G06F1/28

CPC classification number: G06F1/305 ,  G06F1/28

Abstract: A test and measurement instrument includes components and methods for measuring noise at an output of a power supply, measuring jitter of a serial data signal produced by a data generating circuit coupled to the power supply and correlating the noise measured from the power supply to the jitter of the serial data signal. The correlation may be performed in the frequency domain. Spectral plots of the measured noise and the measured jitter may be generated and presented to the user.