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    Test and Measurement Probe Having a Touchscreen
    3.
    发明申请
    Test and Measurement Probe Having a Touchscreen 有权

    公开(公告)号：US20210263074A1

    公开(公告)日：2021-08-26

    申请号：US17251179

    申请日：2019-06-11

    Applicant: Tektronix, Inc.

    Inventor： Karl A. Rinder ,  David A. Sailor ,  Josiah A. Bartlett

    IPC: G01R1/067 ,  G01R31/302 ,  G01R1/02 ,  G01R1/04

    Abstract: A test-and-measurement probe (200) for a test-and-measurement instrument (101), the test-and-measurement probe having a probe head (103) and a touchscreen user interface (250). The probe head is configured to obtain a signal from a device under test. The touchscreen user interface is configured to visually convey test-and-measurement information to a user and to accept user touch input. In embodiments, the touchscreen user interface is removably connected to a compbox (105) of the test-and-measurement probe, through a wired connection or wirelessly.

    DIFFERENTIAL PIN TO RF ADAPTOR FOR PROBING APPLICATIONS
    5.
    发明申请
    DIFFERENTIAL PIN TO RF ADAPTOR FOR PROBING APPLICATIONS 有权

    公开(公告)号：US20170271828A1

    公开(公告)日：2017-09-21

    申请号：US15257681

    申请日：2016-09-06

    Applicant: Tektronix, Inc.

    Inventor： Michael J. Mende ,  Gary W. Reed ,  James D. Pileggi ,  Karl A. Rinder ,  Richard A. Booman

    IPC: H01R24/54

    CPC classification number: H01R24/542 ,  G01R1/0408 ,  H01R13/646 ,  H01R31/06 ,  H01R2103/00 ,  H01R2201/20

    Abstract: A differential pin to RF adaptor includes a center conductor contact with an RF connector on one end and a signal contact on the other end. An insulating sleeve surrounds the central contact. A reference contact surrounds the insulating sleeve. The signal pin of the differential pair interfaces with the center conductor contact of the RF connector. The adaptor is structured to slide down over a pair of pins/leads so that the reference contact abuts a circuit board attached to the pins. The pins/leads are shielded all the way to the circuit board, which shields/isolates the pins from common mode and other types of interference. The adaptor maintains the shape of the signal pin and the reference pin during testing. The adaptor maintains a fixed impedance of the pins, which reduces or eliminates uncontrolled impedance and hence preserves system frequency response and reduces/eliminates erroneous ripple currents.

    Flexible resistive tip cable assembly for differential probing
    7.
    发明授权
    Flexible resistive tip cable assembly for differential probing 有权

    公开(公告)号：US10302676B2

    公开(公告)日：2019-05-28

    申请号：US15259818

    申请日：2016-09-08

    Applicant: Tektronix, Inc.

    Inventor： Michael J. Mende ,  Gary W. Reed ,  James D. Pileggi ,  Karl A. Rinder ,  Richard A. Booman ,  Martin Van Pelt

    IPC: G01R1/067 ,  H03H1/00 ,  H01P1/22 ,  G01R1/18 ,  H01R13/6461 ,  H01R24/40 ,  H01R103/00

    Abstract: A flexible resistive tip cable assembly includes a probe Radio Frequency (RF) connector structured to receive a RF differential signal and a testing connection assembly. A coaxial cable is structured to conduct the RF differential signal between the probe RF connector and the testing connection assembly. The coaxial cable includes a cable for conducting the differential signal, and a plurality of magnetic elements positioned along a length of the cable and structured to isolate the differential signal from common mode interference. The magnetic elements are separated from adjacent magnetic elements by a gap with elastomeric elements is positioned in each gap to provide cable flexibility. The assembly may also include an Electrically Erasable Programmable Read Only Memory (EEPROM) loaded with an attenuation associated with the flexible resistive tip cable assembly for use in signal testing by a device coupled to the testing connection assembly.

    Connector for selectively coupling an electrical load to a device under test
    8.
    发明授权
    Connector for selectively coupling an electrical load to a device under test 有权
    用于选择性地将电负载耦合到被测设备的连接器

    公开(公告)号：US08714988B1

    公开(公告)日：2014-05-06

    申请号：US13662317

    申请日：2012-10-26

    Applicant: Tektronix, Inc.

    Inventor： Karl A. Rinder ,  Neil C. Clayton ,  Richard A. Booman

    IPC: H01R12/00

    CPC classification number: G01R31/04 ,  G01R1/0416 ,  G01R1/06772 ,  G01R1/07314 ,  G01R31/2808 ,  H01R12/716 ,  H01R13/635 ,  H01R13/6477 ,  H01R13/719 ,  H01R2201/20

    Abstract: A connector has a housing with an aperture formed therein having one portion larger than the other portion. The housing is mounted on the device under test with the housing positioned over a plurality of electrical contacts. An electrical load is positioned within the larger aperture of the housing and has a plurality of resistors disposed adjacent to an electrical contact assembly. A resilient member is positioned between the electrical load and the device under test such that a force directed on the electrical load compresses the resilient member to allow contact between a plurality of electrical contacts of the electrical contact assembly and the plurality of the electrical contacts on the device under test. Removing the force decompresses the resilient member and disconnects the plurality of contacts of the electrical contact assembly from the plurality of electrical contacts of the device under test.

    Abstract translation: 连接器具有其中形成有孔的外壳，其中一个部分大于另一部分。 壳体安装在被测设备上，壳体位于多个电触头上。 电负载位于壳体的较大孔内，并且具有与电接触组件相邻设置的多个电阻器。 弹性构件位于电负载和被测设备之间，使得朝向电负载的力压缩弹性构件，以允许电接触组件的多个电触点与多个电接触件 被测设备 去除力使弹性构件减压并且将电接触组件的多个触点与被测器件的多个电触头断开。

    Tip cable component of a measurement probe head assembly
    9.
    外观设计
    Tip cable component of a measurement probe head assembly 有权

    公开(公告)号：USD992437S1

    公开(公告)日：2023-07-18

    申请号：US29832636

    申请日：2022-03-29

    Applicant: Tektronix, Inc.

    Designer： David Thomas Engquist ,  Heather J. Vermilyea ,  Karl A. Rinder ,  Michael J. Mende ,  Tony Lee Tarr

    Abstract: FIG. 1 is a front-side isometric view of a tip cable component of a measurement probe head assembly.
    FIG. 2 is a front view of the tip cable component of FIG. 1.
    FIG. 3 is a rear view of the tip cable component of FIG. 1.
    FIG. 4 is a rear-side isometric view of the tip cable component of FIG. 1.
    FIG. 5 is a top view of the tip cable component of FIG. 1.
    FIG. 6 is a first-side view of the tip cable component of FIG. 1.
    FIG. 7 is a bottom view of the tip cable component of FIG. 1; and,
    FIG. 8 is a second-side view of the tip cable component of FIG. 1.
    Environmental portions of the tip cable component of a measurement probe head assembly are shown in broken lines and form no part of the claimed design.

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