公开(公告)号：US10145822B2

公开(公告)日：2018-12-04

申请号：US14745757

申请日：2015-06-22

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Christopher R. Muggli ,  Martin Rockwell ,  Ira G. Pollock

IPC: G01N29/30 ,  G01N29/24 ,  G01R1/067 ,  G01R31/317

Abstract: A probe, including a first input configured to receive a first input signal, a second input configured to receive a second input signal, a first cable connected to the first input, a second cable connected to the second input, an electronically adjustable delay connected to the first cable, the electronically adjustable delay configured to delay the first input signal to remove a skew between the first input signal and the second input signal, and an amplifier configured to receive the first input signal from the electronically adjustable delay and a second input signal.

公开(公告)号：US20160033455A1

公开(公告)日：2016-02-04

申请号：US14745757

申请日：2015-06-22

Applicant: Tektronix, Inc.

Inventor： Daniel G. Knierim ,  Christopher R. Muggli ,  Martin Rockwell ,  Ira G. Pollock

IPC: G01N29/30 ,  G01N29/24

CPC classification number: G01N29/30 ,  G01N29/24 ,  G01R1/06766 ,  G01R1/06772 ,  G01R31/31706

Abstract: A probe, including a first input configured to receive a first input signal, a second input configured to receive a second input signal, a first cable connected to the first input, a second cable connected to the second input, an electronically adjustable delay connected to the first cable, the electronically adjustable delay configured to delay the first input signal to remove a skew between the first input signal and the second input signal, and an amplifier configured to receive the first input signal from the electronically adjustable delay and a second input signal.

Abstract translation: 探头，包括被配置为接收第一输入信号的第一输入，被配置为接收第二输入信号的第二输入，连接到第一输入的第一电缆，连接到第二输入的第二电缆，连接到 所述第一电缆，所述电子可调节延迟被配置为延迟所述第一输入信号以去除所述第一输入信号和所述第二输入信号之间的偏斜;以及放大器，被配置为从所述电子可调延迟接收所述第一输入信号，以及第二输入信号 。

公开(公告)号：US09622336B2

公开(公告)日：2017-04-11

申请号：US14063242

申请日：2013-10-25

Applicant: Tektronix, Inc.

Inventor： Martin Rockwell

IPC: H05K1/02 ,  G01R1/04 ,  G01R31/28

CPC classification number: H05K1/02 ,  G01R1/0416 ,  G01R31/2886 ,  G01R31/2889

Abstract: A test and measurement probe connection system including an interposer, at least one probe tab connected to the interposer, and a connector that is releasably connectable to the at least one probe tab to measure signals from the interposer.

公开(公告)号：US20150114685A1

公开(公告)日：2015-04-30

申请号：US14063242

申请日：2013-10-25

Applicant: Tektronix, Inc.

Inventor： Martin Rockwell

IPC: H05K1/02

CPC classification number: H05K1/02 ,  G01R1/0416 ,  G01R31/2886 ,  G01R31/2889

Abstract: A test and measurement probe connection system including an interposer, at least one probe tab connected to the interposer, and a connector that is releasably connectable to the at least one probe tab to measure signals from the interposer.

Abstract translation: 一种测试和测量探头连接系统，包括插入器，连接到插入器的至少一个探针接头，以及可释放地连接到至少一个探针接头以测量来自插入器的信号的连接器。