公开(公告)号：US20240027513A1

公开(公告)日：2024-01-25

申请号：US18220222

申请日：2023-07-10

Applicant: Tektronix, Inc.

Inventor： Vivek Shivaram ,  Niranjan R. Hedge ,  Shubha B ,  Krishna N H Sri ,  Yogesh M. Pai ,  Venkatraj Melinamane

IPC: G01R31/26

CPC classification number: G01R31/2608

Abstract: A system for determining an amount of time skew between two measurement probes includes a first probe and a second probe and one or more processors configured to measure a current signal from a Device Under Test (DUT) through the first probe, measure a voltage signal from the DUT through the second probe, generate a modeled voltage signal from the measured current signal, compare the modeled voltage signal to the measured voltage signal, and determine the amount of time skew between the first and the second probe from the compared signals. Methods are also described.